• 한국전기화학회:학술대회논문집
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• 2000.10a
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• pp.17-17
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• 2000

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.6 no.3
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• pp.309-317
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• 1996

Al2O3 thin films were deposited on Si-wafer (100) using organo-aluminum compounds at low pressure by chemical vapor deposition (CVD) method. The vapor of the organo-metallic precursor was carried by pure N2 gas. The deposition rate increased and then saturated as Tsub increased with increasing the AIP flow rate. The main contamination didn't found in deposited films except carbon. The H-O(H2O) IR absorption band decreased in intensity as the deposition temperature increased, and completely disappeared through annealing.

• Journal of Integrative Natural Science
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• v.1 no.1
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• pp.54-57
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• 2008

This report examines the variation on structural properties of $SnO_2$ thin films. TEM studies shows some of the interfaces to be atomically faceted. Secondary X-ray photoelectron Spectroscopy Analysis(XPS) depth profiles show that films have a uniform composition along the depth.

• Korean Journal of Crystallography
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• v.17 no.1
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• pp.14-18
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• 2006

MOCVD 공정방법에 의해 수직정렬된 ZnO 나노선을 합성하고 공정조건 제어에 의해 합성되는 나노선의 물리적, 광학적 특성이 어떻게 변화하는지를 고찰하고자 하였다. 온도 및 산소분압제어 등의 공전변수 제어를 통하여 ZnO 나노 구조체는 나노선, 나노로드 뿐만 아니라 나노바늘 (nano-needle) 등 다양한 구조로 변화되었으며 그 직경 및 길이도 제어가 가능하였다. 전체적으로 양호한 특성의 wurzite 구조를 나타내었으며 기판에 수직인 방향으로 [0001] 방향으로 성장하였다. 광학특성에서는 나노선 직경이 작아질수록 주방출 피크의 천이현상이 관찰되었다.

• Proceedings of the Materials Research Society of Korea Conference
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• 1992.05a
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• pp.12-12
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• 1992

• Proceedings of the Materials Research Society of Korea Conference
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• 1992.05a
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• pp.43-43
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• 1992

• Journal of the Korean Institute of Telematics and Electronics
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• v.27 no.5
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• pp.716-723
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• 1990

Transmission electron microscopy (TEM) and anger electron microscopy(AES) studies of GaAs/AlxGa1-xAs(x=0.58) quantum wells grown by low pressure metalorganic chemical vapor deposition(LP-MOCVD) are carried out. Isolated quantum well structure having the well width as small as 15 \ulcornerand multiquantum well structure, which consisted of 51 alternating layers with each thickness of 10\ulcorner were suscessfully grown. TEM analyses have shown that their interfaces were almost completely coherent without any structural disorder, alloy clustering and crystal defect. AES depth resolution have shown the compositional periodicity of superlattice structure.

• Proceedings of the Materials Research Society of Korea Conference
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• 1994.11a
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• pp.21-22
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• 1994

• Proceedings of the Materials Research Society of Korea Conference
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• 1996.05a
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• pp.17-17
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• 1996

• Journal of the Korean institute of surface engineering
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• v.31 no.2
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• pp.109-116
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• 1998

Highly transparent conductive pure and fluorine-doped tin oxide(FT0, $SnO_2$ : F) films have been prepared by low pressure metal organic chemical vapor deposition (LP-MOCVD) from various mixtures of tetramethyitin(TMT) with oxygen or oxygen containing ozone. The properties of TO films have been changed with the variation of gases, flow rate, and substrate temperature. The nsing of oxygen containing ozone instead of pure oxygen, reduced substrate temperature by 100-$150^{\circ}C$ while maintaining same thickness. The films prepared by using ozone showed the resistivity in the range from $10^~2$ to $10^{~3}\Omega$cm, and the mobiiity from 10 to $14\textrm{cm}^2$/Vs. Fluorine-doped tin oxide films had properties such as the resistivity about $10^{-4}\Omega$cm, and the mobility from 14 to $19\textrm{cm}^2$/Vs.