• Proceedings of the KIEE Conference
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• 2006.10c
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• pp.425-427
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• 2006

In this paper, an automatic side-view inspection algorithm for LCD modules is proposed. Until now, most parts of inspection is performed by human inspectors, which means very high product costs. So inspection automation is the very hot issue in the LCD industries. However, it is not easy problem to replace the human by computer vision system. In the many inspections which are based on the human eyes, side-view inspection is most hard problem to solve. In this paper, an image morphing algorithm is developed, which will help to enable the automation of the side-view inspection process.

• Proceedings of the KIEE Conference
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• 2005.10b
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• pp.64-66
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• 2005

In this paper, some automatic inspection algorithms for LCD module are suggested. Human eyes are very good for the inspection in many industrial areas. However, very bright LCD back lighting may cause permanent damage to the human eyes. Also, the growing size of the LCD make it more difficult for the human inspectors. Therefore, using camera set, automatic inspection process becomes very essential for the future LCD industry.

• Journal of the Korean Institute of Intelligent Systems
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• v.19 no.2
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• pp.259-264
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• 2009

High level quality control is required for mobile TFT-LCD modules which are frequently used for fine observation. However, quantitative quality control is difficult. Defect inspection using naked eyes makes irregular inspection results. This paper developed desk type defect inspection equipment for mobile TFT-LCD modules using the same inspection criterion with that of naked eyes. From experiments using this equipments, possibilities of standardization in defect inspection equipment for mobile TFT-LCD modules are presented.

• Journal of the Korean Society for Precision Engineering
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• v.24 no.9
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• pp.103-109
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• 2007

LCD (Liquid Crystal Display) is widely used electronic product. It needs too many processes such as PECVD (Plasma Enhanced Vapor Deposition), Sputtering, Photo-lithography, Dry etch. Each process is important but inspection process is more important because most companies emphasis on the six sigma. Recently, LCD inspection system is composed with inlet, inspector, outlet air pads. LCD is inspected on air pad which is shooting air from air hole. This paper studies on pad design of air bearing for LCD inspection to minimize LCD fluctuation. This design is able to reduce fluctuation and then satisfies CCD inspectional range. Also inspection pad needs to adequate stable area.

• Proceedings of the IEEK Conference
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• 1999.11a
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• pp.637-640
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• 1999

In this Paper we show the LCD simulator for defect inspection using image processing algorithm and neural network. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinhole, and spot from real LCD color filter image are used. The proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.6 respectively.

• Journal of the Korea Convergence Society
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• v.11 no.11
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• pp.183-187
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• 2020

The molybdenum cup and molybdenum pin, which are the main materials of the molybdenum electrode used for the LCD BLU CCFL electrode, have not been developed in Japan and all of them are imported and used from Japan, is giving a competitive burden. In this research, to develop the manufacturing technology of molybdenum pin used for CCFL electrode of LCD BLU, development of linear processing technology, development of molybdenum wire surface treatment technology, development of wire cutting technology, production of molybdenum pin, design and fabrication of JIG and Fixture for inspection, molybdenum pin prototyping and analysis, and development of 100% molybdenum pin inspection technology. In this paper, especially, In this paper, especially, research on the convergency design for total inspection machine is treated. is treated.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.06a
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• pp.946-949
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• 2005

This paper deals with the algorithm development that inspects defects such as Bright Defect Dots, Dark Defect Dots, and Line Defect caused by the process of LCD(Liquid Crystal Display). While most of LCD production process is automated, the inspection of LCD panel and its appearance depends on manual process. So, the quality of the inspection is affected by the condition of worker. Especially, the more LCD size increases, the more the worker feels fatigued, which causes the probability of miss judgement. So, the automated inspection is required to manage the consistent quality of the product and reduce the production costs. In this paper, to solve these problems, we developed the imaging processing algorithm to inspect the defects in captured image of LCD. Experimental results reveal that we can recognize various types of defect of LCD with good accuracy and high speed.

• Journal of the Korean Society for Precision Engineering
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• v.24 no.4 s.193
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• pp.7-14
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• 2007

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.46 no.2
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• pp.22-27
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• 2009

In this paper, an automatic functional inspection system EVT (Emulated Vision Tester) for LCD drive module PCB has been proposed and implemented. Typical automatic inspection system such as probing methods and vision-based systems are widely known and used, however, there exist undetectable defects due to critical timing factors which they may miss to catch from LCD equipments. Especially typical vision-based systems have inconsistency on acquisition of images so that distinction between gray scales can be difficult which results in low level of performance and reliability on the inspection results. The proposed EVT system is pure hardware solution. It directly compares pattern signals from a pattern generator to output signals from LCD drive module. It also inspects variety of analog signals such as voltage, resistance, wave forms and so forth. The EVT system not only shows high performance in terms of reliability and processing speed but reduces costs on inspection and maintenance. Also, full automation of entire production line can be realized when EVT is applied in in-line inspection processes.

• Journal of Institute of Control, Robotics and Systems
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• v.14 no.5
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• pp.444-452
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• 2008

This paper presents an overall image processing approach of defect inspection of patterned TFT-LCD panels for the real manufacturing process. A prototype of AOI(Automatic Optical Inspection) system which is composed of air floating stage and multi line scan cameras is developed. Adjacent pattern comparison algorithm is enhanced and used for pattern elimination to extract defects in the patterned image of TFT-LCD panels. New region merging algorithm which is based on border expansion is proposed to identify defects from the pattern eliminated defect image. Experimental results show that a developed AOI system has acceptable performance and the proposed algorithm reduces environmental effects and processing time effectively for applying to the real manufacturing process.