• Proceedings of the KIEE Conference
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• 2008.10b
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• pp.211-212
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• 2008

본 논문에서는 LCD 구동 모들 PCB의 기능 검사를 위한 자동 검사시스템인 EVT(Emulated Vision Tester)를 제안하고 구현하였다. 기존의 대표적인 자동검사 방법으로는 전기적 검사나 영상기반 검사방식이 있으나 전기적 검사만으로는 Timing이 주요한 변수가 되는 LED 장비에서는 검출할 수 없는 구동불량이 존재하며 영상기반 검사는 영상획득에 일관성이 결여되거나 Gray Scale의 구분이 불명확하며 검출결과의 재현성이 떨어진다. EVT 시스템은 Pattern Generator에서 인가된 입력 패턴 신호라 구동모듈을 통한 후 출력되는 디지털 신호를 직접 비교하여 패턴을 검사하고 아날로그 신호 (전압, 저항, 파형)의 이상 여부도 신속 정확하게 검사할 수 있는 H/W적인 방법이다. 높은 검출 신뢰도와 빠른 처리 속도 뿐만 아니라 간결한 시스템 구성으로 원가절감 실현 등 많은 장점을 가진다.

• Proceedings of the KSME Conference
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• 2003.11a
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• pp.1419-1424
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• 2003

Impact analysis of TFT-LCD module is very complicated because the structure is assisted with thin, small and non-uniform geometry. Especially, finite element modeling is more difficult and need time-consuming efforts. In this study, we developed LCD Impact Analysis System (LIAS) for the purpose of reducing the analysis time without accuracy reduction. This system contains pre-meshing data, material database, shock condition, auto-reporting etc. PATRAN and DYNA3D is used for meshing and solving. Previously, we performed impact test and reviewed the accuracy of analysis results. Simply we can control design parameters, the procedure such as meshing, running and reporting which are partially auto-prepared. By adopting proposed system, it is expected to achieve efficient impact analysis of LCD module.

• Journal of Institute of Control, Robotics and Systems
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• v.14 no.6
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• pp.523-529
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• 2008

In this paper, we proposed mobile LCD module test device on embedded based, when operating the existing LCD, divide flicker clearly in full frame, and configuration so as to support between other CPU interface, MDDI, SPI, 24Bit RGB interface, etc. that is based on a high-speed CPU. In addition, when demand to test about each pixel of LCD, it is possible to change IP design of H/W, FPGA, but proposed system is application possible without other design changing. Proposed system is made smaller and equipped with battery, so secure with mobility for effective test the LCD/OLED module and it is able to test the pattern by the client program, for example exiting picture, mpeg, simple pattern test and test per pixel, scale, rotation, Odd/Even pixel per video, etc. From now on, if integrating with independent test system and it is configured that is able to mutual communication and test, it is expected to reduce consumption of human resources and improve productivity for LCD module test.

• 전자공학회논문지 IE
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• v.45 no.1
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• pp.7-14
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• 2008

In this paper, a new high resolution XGA-SLM is implemented through modification of a commercial TFT-LCD beam projector and its optical modulation characteristics as a spatial light modulator(SLM) is also analyzed. That is, the optics module, projection lamp and fans are removed from a commercial beam projector and instead, some electric circuits to compensate their removal are manufactured and then, by inserting them into the beam projector, a new XGA-SLM is finally implemented. From some characteristic experimental results of the implemented high resolution TFT-LCD SLM, the proposed TFT-SLM is found to have an good optical linearity in amplitude and phase modulation characteristics as a function of the input gray levels. Especially, through implementation of the suggested TFT-LCD panel, the implemented SLM is proposed as a new relatively low-cost and high resolution SLM for optical information processing.

• Journal of Korean Institute of Industrial Engineers
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• v.38 no.4
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• pp.262-275
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• 2012

This paper develops a multistage scheduling algorithm for the module operation of the LCD(Liquid Crystal Display) production systems and tests the efficiency of the proposed algorithm. The module operation is a multistage form composed of multiple sub operations of processes, and each stage is consists of multiple lines with the same kinds of machines. This paper presents a mathematical modeling reflecting the constraints of the LCD module operation and develops a multistage scheduling algorithm based on tabu search metaheuristic approach. For this purpose, an production order is assigned to a line of the sub operations and a sequence of the assigned order is rearranged to draw an efficient schedule. Simulation experiments test performance measures and show the efficiency of the proposed algorithm.

• Proceedings of the KIEE Conference
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• 2005.05a
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• pp.212-214
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• 2005

The MDDI(Mobile Digital Display Interface) standard is an optimized high-speed serial interconnection technology developed by Qualcomm and supports the VESA(Video Electronics Standard Association). It increases reliability and reduces power consumption in clamshell phones by decreasing the number of wires to interconnect with the LCD display. In this paper, the MDDI host is designed using VHDL and implemented on FPGA. We demonstrates that the MDDI host is connected with S3CA460 LCD controller is designed by Samsung Electronics Co. and display a steal image to the LCD.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.13 no.8
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• pp.3618-3622
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• 2012

In this study, the yield of the modules in LCD production lines, improving current TFT-LCD production process is essential for high-pressure silicone injection equipment, and precision control system was developed. This full-scale production of the future through the development of next-generation display production line is being prepared, being transferred to China in LCD production facilities can make the most of efficient equipment. Therefore, minimize the cost of new investment and help create the maximum effect to control the detailed behavior of the sequence H/W and S/W system was installed on the production line. In addition, Fast-evacuating the structure proposed for the Vacuum pump, Pump control circuit design and experimental results has been completed.

• Journal of the Korean Society for Precision Engineering
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• v.21 no.9
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• pp.135-141
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• 2004

Anti-shock performance is one of the most important design specifications of TFT-LCD modules. Since they are adopted fur major display units of many mobile applications such as lap-top PCs, cellular phones, and palm pilots, they are able to accommodate and endure high level transient mechanical energy inputs. For the reasons, not only the LCD unit manufacturers but their customers like PC makers perform a series of strict impact/drop test on the units. Currently, designers are mostly relying on their own trial-error based experience for the anti-shock design. Thus those designs depending on only experience may result in disqualification from the drop/impact test during final product evaluation. Those shock failures of any new designs are prohibitive for both LCD and PC manufacturers. In order to avoid this problem, many designers are focusing on the development of computer-aided design tools that is directly connected to shock simulation capabilities and then shock-proof design cycle time could be significantly reduced. Development of an integrated CAE system for the shock-proof design is presented in this article. At every stages of the development of present work, practical industrial applicability and mass production feasibility are seriously considered and tested so that the system is to be used in the LCD design engineering field.

• Journal of the Institute of Electronics Engineers of Korea SP
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• v.45 no.2
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• pp.65-73
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• 2008

The characterization process for the accurate color reproduction in mobile phone with camera and LCD is popular. The camera and LCD characterization, gamut mapping process is necessary to map the camera's input color stimulus, CIEXYZ value, into the LCD's output color stimulus. Each characterization is the process estimating the relation between input and output signals. In case of LCD, because of output device, the output color stimulus for the arbitrary input signal can be measured by spectro-radiometer However, in the camera, as the input device, the characterization is an inaccurate and needs the manual works in the process obtaining the output signal because the input signal can not be generated. Moreover, after gamut mapping process, the noise is increased because the optimized gamma tone curve of camera for the noise is distorted by the characterization. Thus, this paper proposed the system of obtaining the output signal of camera and the method of gamma correction for the noise. The camera's output signal is obtained by RGB values of patches from captured the color chart image. However, besides the illumination, the error for the location of the chart in the viewfinder is generated when many camera modules are captured the chart. The method of correcting the position to correct the error from manual works. The position of camera is estimated by captured image. This process and moving of camera is accomplished repeatedly, and the optimized position can be obtained. Moreover, the lightness curve of camera output is corrected partly to reduce the noise from the characterization process.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.10 no.7
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• pp.1725-1728
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• 2009

This research developed process control device and FGV pattern generating device essential for full gate visual inspection to improve process so that defect detection capability may be maximized in specified environment. The devices developed in this research, which can be swiftly replaced in case loss or error occurs, are anticipated to improve module yield as well as maintain tact loss near '0'. In addition, as a result of mounting H/W and S/W system to control detailed operation sequence in production line and executing performance check and verification, detection rates were 98.1% and 99.1% respectively for pixel defect by tact and line defect, and yield of the entire module process including gate and visual level test increased up to 98.3%.