• Proceedings of the KIEE Conference
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• 1998.11b
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• pp.621-623
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• 1998

We implemented PanelLlnk digital flat panel display transmitter supporting SXGA($1280{\times}1024$) resolution. It can transmit data through 10m cable at XGA($1024{\times}768$) resolution and through 7m cable at SXGA($1280{\times}1024$). We also found resistor value to get stable display image by low voltage differential signal swing control.

• The Optical Journal
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• s.99
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• pp.36-38
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• 2005

2000년 4월 경기도 안양시 동안구 호계동 안양국제유통단지내에 둥지를 튼 존테크(대표·최상규)는 광 관련 전자, 기계 조립 및 검사장비 전문업체이다. 디스플레이 생산에 필요한 각종 기자재 및 장비 공급을 통한 기반구축을 시작으로 2003년부터는 디지털카메라 및 카메라폰과 관련한 제조 및 시험장비를 30년 전통을 가진 일본 카메라 및 LCD 장비 전문회사와 공급계약을 체결하고 본격적인 국내 판매를 시작했다. 현재는 광학장비 유통에 집중하고 있으나 향후에는 회사 설립 전부터 쌓아온 풍부한 경험과 지식을 바탕으로 광학검사장비 개발 및 제조에 모든 역량을 집중하여 관련 장비의 국산화를 이루겠다는 큰 포부를 가지고 있다.

• Journal of the Korean Society for Nondestructive Testing
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• v.33 no.4
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• pp.376-381
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• 2013

위상잠금 열화상에서는 일반적으로 변조된 주파수의 광램프를 쓰고 있다. 하지만 램프의 광도 분포는 입력신호가 평단(flat)특성임에 불구하고 심지어 불균일하여 검사 시편내에 측면 열유동을 만들어낸다. 이러한 열유동은 원치 않는 효과로서 측면의 분해능을 감소시키는 등과 같이 관심 결함구조의 영상에 부정적인 영향을 미친다. 본 고에서 검토되는 방식은 열원으로서 LCD 프로젝터와 같은 것을 이용하여 각 가진픽셀에 개별적으로 진동진폭, 광도 오프셋, 위상지연 등을 할당하는 방법에 대한 접근기술이다. 이러한 반복적인 자체학습 과정에 의한 조명 패턴을 통하여 측면 열유동이 제거되고 분해능이 향상되도록 제공하는 것이다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.11a
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• pp.68-68
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• 2009

최근 디스플레이 산업의 발달로 LCD 판넬의 수요가 급증함에 따라 검사장치 분야도 동반 성장하고 있다. LCD 검사를 위한 probe unit은 미세전기기계시스템 (MEMS) 공정을 이용하여 제작된다. 본 연구에서는 probe card의 미세 슬릿을 제작하기 위한 Si 깊은 식각 공정을 수행하였다. 공정에 사용된 장비는 STS 사의 D-RIE 시스템으로 식각가스로 $SF_6$, passivation용으로 $C_4F_8$ 가스를 각각 사용하였다. 식각용 마스크는 $30{\sim}50{\mu}m$의 선폭을 probe card의 패턴에 따라 제작되었으며, 분석은 SEM 측정을 이용하였다. 식각 공정 중 발생하는 scallop은 시료를 oxidation 시켜 $SiO_2$ 층을 형성한 후에 식각용액에 에칭하여 제거하였다. 제거전 scallop의 크기는 약 120 nm에서 제거후 약 $50{\mu}m$로 크게 개선됨을 SEM 사진으로 확인하였다.

• Journal of the Korean Magnetics Society
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• v.22 no.3
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• pp.91-96
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• 2012

In this paper, a three-dimensional finite element model based on the multi-pixel was constructed to accurately predict electric field distributions including an interference phenomenon between adjacent pixels in the liquid crystal of a complicated TFT-LCD panel. Utilizing the elaborate numerical model, the characteristics of spatial electric field distributions depending on various fault-electrode conditions are thoroughly examined on the basis of the field distribution of a normal electrode condition. The validity of the proposed model is proved by comparing the simulation results with those of the existing optical inspection equipments.

• Journal of Korea Multimedia Society
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• v.13 no.8
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• pp.1115-1127
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• 2010

In order to increase the productivity in manufacturing TFT-LCD(thin film transistor-liquid crystal display), it is essential to classify defects that occur during the production and make an appropriate decision on whether the product with defects is scrapped or not. The decision mainly depends on classifying the defects accurately. In this paper, we present an effective classification method for film defects acquired in the panel production line by analyzing the intensity distribution and shape feature of the defects. We first generate a binary image for each defect by separating defect regions from background (non-defect) regions. Then, we extract various features from the defect regions such as the linearity of the defect, the intensity distribution, and the shape characteristics considering intensity, and construct a referential image database that stores those feature values. Finally, we determine the type of a defect by matching a defect image with a referential image in the database through the matching cost function between the two images. To verify the effectiveness of our method, we conducted a classification experiment using defect images acquired from real TFT-LCD production lines. Experimental results show that our method has achieved highly effective classification enough to be used in the production line.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.6
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• pp.31-38
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• 2009

To improve the image quality and lower the power consumption of the mobile applications, it is the one of the best candidate to control the backlight unit of the LCD module with ambient light. Ambient light sensor and readout circuit were integrated in LCD panel for the mobile applications, and we designed them with LTPS TFT. We proposed noble start-up correction in order to correct the variation of the photo sensors in each panel. We used time-to-digital method for converting photo current to digital data. To effectively merge time-to-digital method with start-up correction, we proposed noble dual slope correction method. The entire readout circuit was designed and estimated with LTPS TFT process. The readout circuit has very simple and stable structure and timing, so it is suitable for LTPS TFT process. The readout circuit can correct the variation of the photo sensors without an additional equipment, and it outputs the 4-levels digital data per decade for input luminance that has a dynamic range of 60dB. The readout rate is 100 times/sec, and the linearity error for digital conversion is less than 18%.

• Korean Journal of Optics and Photonics
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• v.18 no.1
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• pp.37-43
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• 2007

We developed the equipment to measure the MTF(modulation transfer function) of an optical system for automatically inspecting the surface condition of an LCD substrate. We have made an object generator with USAF(United States Air Force) targets of three bar patterns and an integrating sphere, and an image analyzer with a 2 dimensional CCD(charge coupled device) and a relay lens. The MTF of the lens under test was obtained by correcting the measured CTF(contrast transfer function) which is the ratio of the contrast in the image of the USAF target to the contrast in the object. We have measured an optical system of F/13.65 (2.6x), the MTF are 30.6 % tangential plane and 26.1 % sagittal plane at 62.5 1p/mm.

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 2007.05a
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• pp.993-999
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• 2007

반도체나 TFT-LCD등을 생산하는 정밀산업 공장구조물에는 진동에 민감한 수많은 정밀장비(검사 및 생산용 장비)가 청정실(Clean Room)에 설치되어 운용된다. 정밀장비는 정상운용을 위하여 주변에 각종 유틸리티 설비가 설치된다. 이러한 수많은 유틸리티 설비들과 그 밖의 많은 장비들로 인하여 공장 내 청정실에는 각종 수 많은 소음/진동원들이 산재해 있다. 이러한 소음/진동원으로 인하여 청정실 내에는 소음/진동의 환경을 저하시킨다. 이에, 본 연구에서는 정밀장비 주변에 설치 된 유틸리티의 가동으로 인하여 발생하는 진동으로 인하여 간헐적으로 정밀장비에 영향을 미치는 과도진동의 현상을 확인하고, 과도진동 현상에 대하여 정밀장비에서 제시한 진동허용규제치와 비교/평가하고, 진동허용규제치의 유효성에 대하여 확인하였다.

• Journal of Korea Society of Industrial Information Systems
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• v.12 no.3
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• pp.116-123
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• 2007

Despite the number of backlight manufacturer is increased as the market of flat panel display equipments and related development devices is enlarged, the inspection based on the human eye is still used in many backlight production lines. The defects such as particle, spot and scratch on the light emitting surface of the backlight prevent the LCD device from displaying the colors correctly. From that manual inspection it is difficult to maintain the quality of backlight consistently because the accuracy and the speed of the inspection may change with the physical condition of the operater. In this paper we studied on the development of automatic backlight surface defect inspection system. For this, we made up of the computer vision system and we developed the main program with various user interfaces to operate the inspection system effectively. And we developed the image processing module to extract the defect information. Furthermore, we presented the labeling process to reconstruct defect regions using the labeling table and the defect index. From the experimental results, we found that our system can detect all defect regions identified from human eye and it is sufficient to substitute for the conventional surface inspection.