• Journal of the Korean Institute of Intelligent Systems
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• v.19 no.2
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• pp.259-264
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• 2009

High level quality control is required for mobile TFT-LCD modules which are frequently used for fine observation. However, quantitative quality control is difficult. Defect inspection using naked eyes makes irregular inspection results. This paper developed desk type defect inspection equipment for mobile TFT-LCD modules using the same inspection criterion with that of naked eyes. From experiments using this equipments, possibilities of standardization in defect inspection equipment for mobile TFT-LCD modules are presented.

• The Journal of the Korea Contents Association
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• v.10 no.5
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• pp.62-69
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• 2010

LCD panel need BLU(Back Light Unit) that is outside source of light because can not emit light voluntarily. BLU is used in LCD module and is used in tester that examine LCD panel's badness. Lately, BLU had changed from CCFL(Cold Cathode Fluorescent Lamp) to LED(Light-Emitting Diode) fast. CCFL need extra-high tension power and produce much heat and is difficult to keep fixed brightness. LED is few electric power wastage and keeps fixed brightness. But, BLU that is used to detector that examine the LCD module is using CCFL until recently. This paper develops LED BLU that can examine LCD panel's badness. Also, this manufactures LED BLU to 24 inch size to examine all LCD panels(12~24 inch), and develops so that LED BLU may operate according to LCD panel's size.

• Journal of the Institute of Convergence Signal Processing
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• v.7 no.4
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• pp.161-168
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• 2006

In this paper, we propose a method for the pattern inspection of LCD module using the color compensation and pattern matching. The pattern matching is generally used for the inspection method of LCD module at the industry. LCD module has many defections such as the brightness difference of the back light, the optic feature of liquid crystal, the difference of the light penetrated by driving LCD and the color difference by the lighting. The conventional method without the color compensation can not solve these defections and decreases the efficiency of inspecting LCD module. The method proposed to inspect defective badness through the pattern matching after it compensated color difference of the LCD occurred by the various causes. At first, it revises with setting by standard tone of color with the LCD pattern of the reference image. And It perform the preprocessing and pattern matching algorithm on the compensated image. In experiment, we confirmed that this algorithm is useful to detect some defections of LCD module. The proposed methods was easy to detect the faulty product.

• Proceedings of the Korean Society of Computer Information Conference
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• 2013.01a
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• pp.103-106
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• 2013

3D LCD Module은 기존 TFT-LCD에 Parallax Barrier 방식과 Passive Glasses 방식 및 Active Glass 방식의 기술을 적합하여 만들어 진다. 현재는 3D Module 제작 후 기타 ASSY 장치를 부착 하여 시제품 출시 전에 3D 패턴을 기반으로 출하 검사를 통해 제품 이상 유무를 검사하다 보니 제품 출하 검사 시 불량 요인으로 불량 제품에 대한 모든 Repair공정을 위해 많은 시간 및 인력, 자재 등의 많은 로스 부분이 발생 하여 생산성 절감 및 제품 원가 상승의 요인이 발생 한다. 따라서 본 논문에서 제안하고자 하는 내용은 기존의 2D TFT-LCD Module 검사장비에 3D Pattern 및 동영상을 구현하여 보다 신속 하고 정확한 임베디드 환경을 이용한 2D 및 3D LCD Module용 검사 시스템을 개발 하는데 있다.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.46 no.2
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• pp.22-27
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• 2009

In this paper, an automatic functional inspection system EVT (Emulated Vision Tester) for LCD drive module PCB has been proposed and implemented. Typical automatic inspection system such as probing methods and vision-based systems are widely known and used, however, there exist undetectable defects due to critical timing factors which they may miss to catch from LCD equipments. Especially typical vision-based systems have inconsistency on acquisition of images so that distinction between gray scales can be difficult which results in low level of performance and reliability on the inspection results. The proposed EVT system is pure hardware solution. It directly compares pattern signals from a pattern generator to output signals from LCD drive module. It also inspects variety of analog signals such as voltage, resistance, wave forms and so forth. The EVT system not only shows high performance in terms of reliability and processing speed but reduces costs on inspection and maintenance. Also, full automation of entire production line can be realized when EVT is applied in in-line inspection processes.

• Proceedings of the Korean Information Science Society Conference
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• 2004.04b
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• pp.697-699
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• 2004

LCD의 생산이 많아짐에 따라 LCD의 불량 검출이 중요해 지고 있다. 불랑 검사는 눈으로 확인할 수 있는 범위에서 검사가 이루어지고 있으며, 만약 눈으로 식별이 불가능한 경우 적외선 카메라나 초음파 센서를 사용하여 검사가 이루어진다. 본 논문에서는 카메라를 이용하여 LCD 패널의 표면에 있는 불량 검출을 위하여 각 Dot에 대한 R, G, B 값을 추출한 후, 추출된 픽셀을 제안된 알고리즘에 적용하여 불량을 검출하는 것을 목적으로 하고 있다.

• Proceedings of the Korean Society of Computer Information Conference
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• 2011.06a
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• pp.363-366
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• 2011

3D 디스플레이 시장이 커지면서 TFT-LCD TV 자동화 라인 생산 공정을 3D LCD TV 생산 공정으로 변환하여 대량 생산할 경우, 기 설치된 자동화 생산라인의 H/W 부분에는 특별한 투자가 이루어질 거라 판단되지 않고 있다. 하지만 3D LCD Module 검사 등의 S/W 적인 부분은 현재의 기 설치된 TFT-LCD Module 검사장비로는 검사가 불가능하여, 추가적인 투자가 이루어질 것이라 판단되고 있다. 이와 관련하여 본 연구에서는 TFT-LCD 제조공정의 효율적인 기술을 제안하고자 한다. 첫째는 TFT-LCD를 Cell상태에서 직접 구동하는 구동회로 기술과 사용 장소가 Clean Room이므로 개별적 구동 Pallet에 비접촉식으로 전원을 공급할 수 있는 비접촉식 급전장치에 대한 기술이다.

• Proceedings of the KIEE Conference
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• 2005.10b
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• pp.64-66
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• 2005

In this paper, some automatic inspection algorithms for LCD module are suggested. Human eyes are very good for the inspection in many industrial areas. However, very bright LCD back lighting may cause permanent damage to the human eyes. Also, the growing size of the LCD make it more difficult for the human inspectors. Therefore, using camera set, automatic inspection process becomes very essential for the future LCD industry.

• Proceedings of the KIEE Conference
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• 2006.10c
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• pp.422-424
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• 2006

This paper suggests an automatic spot-inspection algorithm for LCD modules. Usually, LCD module testing is classified by two categories. One is for uniform pattern testing and the other is Non-uniform testing. The uniform pattern testing is well defined and also fully automated in the factory. However non-uniform pattern testing is not defined well yet, so non-uniform testing is conducted by human operators. In this paper a spot-pattern, which is one of non-uniform pattern, inspection algorithms are proposed. The performance of the proposed algorithm is tested by extensive simulations using artificial slot-patterns and real ones in the LCD modules.

• Journal of the Korea Convergence Society
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• v.11 no.11
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• pp.183-187
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• 2020

The molybdenum cup and molybdenum pin, which are the main materials of the molybdenum electrode used for the LCD BLU CCFL electrode, have not been developed in Japan and all of them are imported and used from Japan, is giving a competitive burden. In this research, to develop the manufacturing technology of molybdenum pin used for CCFL electrode of LCD BLU, development of linear processing technology, development of molybdenum wire surface treatment technology, development of wire cutting technology, production of molybdenum pin, design and fabrication of JIG and Fixture for inspection, molybdenum pin prototyping and analysis, and development of 100% molybdenum pin inspection technology. In this paper, especially, In this paper, especially, research on the convergency design for total inspection machine is treated. is treated.