• Journal of Environmental Health Sciences
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• v.32 no.6
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• pp.543-555
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• 2006

During a twenty-day period in 2005, a nine-stage Andersen cascade impactor was used to determine the seasonal size distribution of atmospheric particles and its inorganic ion species sampled for 24hr in Iksan city, located southwest of the Korean peninsula. Samples were analyzed for major water-soluble ion species using Dionex-100 ion chromatograph. Average fine and coarse mass concentrations of atmospheric particles were, respectively, 31.4 and $82.6{\mu}g\;m^{-3}$ in spring and 35.8 and $73.4{\mu}g\;m^{-3}$ in fall-winter during the sampling period of 2005, while measurements of 69.8 and 9.9 were obtained in the sampling period of summer, The size distribution of particulate mass concentration during the non-Asian dust period was generally bimodal, whereas the size distribution of particulate mass concentration during the Asian dust period was unimodal due to the significant increase of coarse particles, which originated from long-range transport of soil dust particles from loess regions of the Asian continent. Among ionic species, $SO{_4}^{2-},\;NH{_4}^+,\;K^+$ were mainly distributed in fine particles due to their characteristics of emission sources and gas-to-particle conversion, while $Na^+,\;Mg^{2+}\;and\;Ca^{2+}$ were dominantly in coarse particles. However, $NO_3{^-}\;and\;Cl^-$ were distributed in both coarse particles and fine particles. Although $SO{_4}^{2-}$ was mainly distributed in fine particles, the size distributions of $SO{_4}^{2-}$ in coarse mode were significantly increased during the Asian dust events compared to those during the non-Asian dust period. $Ca^{2+}$ showed the most abundant species in the atmospheric particles during the Asian dust period. $NH{_4}^+$ was found to mainly exist as $(NH_4)_2SO_4$ in fine particles.

• Journal of Radiation Protection and Research
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• v.41 no.3
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• pp.222-228
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• 2016

Background: We are developing a small size dosimeter for dose estimation in particle therapies. The developed dosimeter is an optical fiber based dosimeter mounting an radiation induced luminescence material, such as an OSL or a scintillator, at a tip. These materials generally suffer from the quenching effect under high LET particle irradiation. Materials and Methods: We fabricated two types of the small size dosimeters. They used an OSL material Eu:BaFBr and a BGO scintillator. Carbon ions were irradiated into the fabricated dosimeters at Heavy Ion Medical Accelerator in Chiba (HIMAC). The small size dosimeters were set behind the water equivalent acrylic phantom. Bragg peak was observed by changing the phantom thickness. An ion chamber was also placed near the small size dosimeters as a reference. Results and Discussion: Eu:BaFBr and BGO dosimeters showed a Bragg peak at the same thickness as the ion chamber. Under high LET particle irradiation, the response of the luminescence-based small size dosimeters deteriorated compared with that of the ion chamber due to the quenching effect. We confirmed the luminescence efficiency of Eu:BaFBr and BGO decrease with the LET. The reduction coefficient of luminescence efficiency was different between the BGO and the Eu:BaFBr. The LET can be determined from the luminescence ratio between Eu:BaFBr and BGO, and the dosimeter response can be corrected. Conclusion: We evaluated the LET dependence of the luminescence efficiency of the BGO and Eu:BaFBr as the quenching effect. We propose and discuss the correction of the quenching effect using the signal intensity ratio of the both materials. Although the correction precision is not sufficient, feasibility of the proposed correction method is proved through basic experiments.

• Journal of the Korean Ceramic Society
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• v.37 no.5
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• pp.418-424
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• 2000

Effects of Ar ion damage prior to the phase transformation from pyrochlore to perovskite structure of PZT thin films have been investigated. As the degree of damage increased by increasing the acceleration voltage in the ion mass doping system, the phase transformation temperature decreased such that the temperature could be lowered down to 550$^{\circ}C$ when the film was damaged at 15 kV for 5 minutes. When the film was damaged prior to the heat treatment grain size of the perovskite thin films became less than 300${\AA}$. It turned out that relatively high value of the remanent polarization (about 30${\mu}$C/$\textrm{cm}^2$) as well as improvement of the fatigue characteristics to a large extent is closely related to the fine grain size of thus obtained PZT films.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.15 no.6
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• pp.518-523
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• 2002

The influences of ion beam energy and reactive oxygen partial pressure on the physical and crystallographic characteristics of transition metal oxide compound(CrOx) film were studied in this paper. Chromium oxide films were deposited onto a cover-glass using ion Beam Sputter Deposition(IBSD) technique according to the various processing parameters. Crystallinity and grain size of as-deposited films were analyzed using XRD analysis. Thickness and Resistivity of the films were measured by $\alpha$-step and 4-point probe measurement. According to the XRD, XPS and resistivity results, the deposited films were the cermet type films which had crystal structure including amorphous oxide(a-oxide) phase and metal Cr phase simultaneously. The increment of the ion beam energy during the deposition process led to decreasing of metal Cr grain size and the rapid change of resistivity above the critical $O_2$ partial pressure.

• Transactions of the Korean Society of Machine Tool Engineers
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• v.16 no.2
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• pp.70-77
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• 2007

The application of focused ion beam(FIB) technology has been broadened in the fabrication of nanoscale regime. The extended application of FIB is dependent on complicated reciprocal relation of operating parameters. It is necessary for successful and efficient modifications on the surface of silicon substrate. The primary effect by Gaussian beam intensity is significantly shown from various aperture size, accelerating voltage, and beam current. Also, the secondary effect of other process factors - dwell time, pixel interval, scan mode, and pattern size has affected to etching results. For the process analysis, influence of the secondary factors on FIB micromilling process is examined with respect to sputtering depth during the milling process in silicon material. The results are analyzed by the ratio of signal to noise obtained using design of experiment in each parameter.

• Journal of the Korean Ceramic Society
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• v.23 no.1
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• pp.7-12
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• 1986

Dielectric properties of $Ba_{0.9}Ca_{0.1}(Ti_{1-x}Sn_x)O_3$ were investigated from x=0 to 0.20, and temperature range -4$0^{\circ}C$~13$0^{\circ}C$ Density and grain size decreased with increasing Sn content due to grain growth inhibitor. Dielectric constant below the Curie temperature increased with increasing Sn content and dissipation factor dec reased. These results are due to grain size effect and internal stress. Curie temperature was shifted to lower temperature with increasing ratio of total polarizability to volume resulting from substitution of $Ba^{2+}$ ion with $Ca^{2+}$ ion $Ti^{4+}$ ion with $Sn^{4+}$ ion.

• Proceedings of the Korean Society of Medical Physics Conference
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• 2002.09a
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• pp.94-96
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• 2002

In order to achieve the radiotherapy more precisely using highly energetic heavy charged particles, it is important to know the distribution of the electron density in a human body, which is highly related to the range of charged particles. We can directly obtain the 2-D distribution of the electron density in a sample from a heavy ion CT image. For this purpose, we have developed a heavy ion CT system using a broad beam. The performance, especially the position resolution, of this system is estimated in this work. All experiments were carried out using the heavy ion beam from the HIMAC. We have obtained the projection data of polyethylene samples with various sizes using He 150 MeV/u, C 290 MeV/u and Ne 400 MeV/u beams. The used targets are the cylinders of 40, 60 and 80 mm in diameter, each of them has a hole of 10 mm in diameter at the center of it. The dependence of the spatial resolution on the target size and the kinds of beams will be discussed.

• 한국전기화학회:학술대회논문집
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• 2003.04a
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• pp.66-66
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• 2003

• Journal of the Korean institute of surface engineering
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• v.35 no.3
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• pp.165-171
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• 2002

TiN coating were deposited onto different WC-Co substrates using arc ion plating (AIP) technique. The structure and morphology for the deposited coating were characterized by x-ray diffraction (XRD) and scanning electron microscopy (SEM). The adhesion behavior of the deposited TiN coating was investigated with a conventional scratch test. Effects of WC particle size and Co content on the adhesion strength between the deposited TiN coating and substrate were studied. During the scratch test, the value of critical load was dependent of WC particle size and Co content on substrate. As the WC particle size and Co content on substrate decreased, the critical load increased. The highest critical load, approximately 110N, was obtained at WC particle size of 1$\mu\textrm{m}$ and Co content of 10wt.%.

• Bulletin of the Korean Chemical Society
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• v.31 no.9
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• pp.2553-2556
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• 2010

On the basis of a simple modified Poisson-Boltzmann (SMPB) theory, taking into account the finite ionic size, the analytic expression for the effect of ionic size on the diffuse layer potential drop at negative charge densities has been given for the simple 1:1 electrolyte. It is shown that the potential drop across the diffuse layer depends on the size of the ions in the electrolyte. For a given electrolyte concentration and electrode charge density, the diffuse layer potential drop in a small ion system is smaller than that in a large ion system. It is also displayed that the diffuse layer potential drop is always less than the value of the Gouy-Chapman (GC) theory, and the deviation increases as the electrode charge density increases for a given electrolyte concentration. These theoretical results are consistent with the results of the Monte-Carlo simulation [Fawcett and Smagala, Electrochimica Acta 53, 5136 (2008)], which indicates the importance of including steric effects in modeling diffuse layer properties.