• Title/Summary/Keyword: Ion beam methods

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Nanohole Fabrication using FIB, EB and AFM for Biomedical Applications

  • Zhou, Jack;Yang, Guoliang
    • International Journal of Precision Engineering and Manufacturing
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    • v.7 no.4
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    • pp.18-22
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    • 2006
  • Although many efforts have been made in making nanometer-sized holes, there is still a major challenge in fabricating individual single-digit nanometer holes in a more controllable way for different materials, size distribution and hole shapes. In this paper we describe our efforts to use a top down approach in nanofabrication method to make single-digit nanoholes. There are three major steps towards the fabrication of a single-digit nanohole. 1) Preparing the freestanding thin film by epitaxial deposition and electrochemical etching. 2) Making sub-micro holes ($0.2{\mu}\;to\;0.02{\mu}$) by focused ion beam (FIB), electron beam (EB), atomic force microscope (AFM), and others methods. 3) Reducing the hole size to less than 10 nm by epitaxial deposition, FIB or EB induced deposition and micro coating. Preliminary work has been done on thin films (30 nm in thickness) preparation, sub-micron hole fabrication, and E-beam induced deposition. The results are very promising.

Research for Patent Application Tendency in the In-Line System Manufacturing for Component of Nano Scale (Nano 스케일 부품 제조용 In-Line 시스템의 특허동향 분석에 관한 연구)

  • Kim, Seung-Min;Ko, Jun-Bin;Park, Hee-Sang
    • Journal of the Korean Society for Precision Engineering
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    • v.25 no.6
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    • pp.150-158
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    • 2008
  • This research considered that the significance of the NT(Nano Technology) which gradually increased the importance of it and investigated the technology development current situation of the Korea, U.S.A, Japanese, Europe. Therefore, in domestic and foreign, this research was widely used. It includes the tendency of the technology about processing methods using the ion beam and electron beam among the In-line system related technique field for the high efficiency energy beam application nano scale manufacturing components. The technique level of Korea, the international trend of technology and cooperation research present condition are dealt in. The information about the checked out of business of research and development of the country consistency and policy establishment try to be provided.

Liquid Crystal Orientation Properties on Homogeneous Polymer Surface by Various Alignment Methods

  • Kim, Young-Hwan;Lee, Kang-Min;Kim, Byoung-Yong;Oh, Byeong-Yun;Han, Jeong-Min;Seo, Dae-Shik
    • Transactions on Electrical and Electronic Materials
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    • v.10 no.1
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    • pp.16-19
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    • 2009
  • We have studied the liquid crystal alignment properties for various alignment methods on the homogeneous polyimide surface. Suitable liquid crystal alignment for one-side alignment cell on the polyimide surface by all alignment method was observed. Highly pre-tilt angle of the NLC for both-side rubbing cell was measured. But, low pre-tilt angle of the NLC for one-side ion beam and UV irradiation cell was observed. We consider that the pre-tilt angle of NLC for one-side ion beam and UV irradiation on the PI surface is lower than that of the PI surface with rubbing. Also, the suitable transmittance-voltage curves for the one-side rubbing TN-LCD on the PI surface with one-side UV irradiation were measured. Also, good response time characteristics of the one-side rubbing TN-LCD on the polyimide surface with one-side UV irradiation can be measured.

High-Dose-Rate Electron-Beam Dosimetry Using an Advanced Markus Chamber with Improved Ion-Recombination Corrections

  • Jeong, Dong Hyeok;Lee, Manwoo;Lim, Heuijin;Kang, Sang Koo;Jang, Kyoung Won
    • Progress in Medical Physics
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    • v.31 no.4
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    • pp.145-152
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    • 2020
  • Purpose: In ionization-chamber dosimetry for high-dose-rate electron beams-above 20 mGy/pulse-the ion-recombination correction methods recommended by the International Atomic Energy Agency (IAEA) and the American Association of Physicists in Medicine (AAPM) are not appropriate, because they overestimate the correction factor. In this study, we suggest a practical ion-recombination correction method, based on Boag's improved model, and apply it to reference dosimetry for electron beams of about 100 mGy/pulse generated from an electron linear accelerator (LINAC). Methods: This study employed a theoretical model of the ion-collection efficiency developed by Boag and physical parameters used by Laitano et al. We recalculated the ion-recombination correction factors using two-voltage analysis and obtained an empirical fitting formula to represent the results. Next, we compared the calculated correction factors with published results for the same calculation conditions. Additionally, we performed dosimetry for electron beams from a 6 MeV electron LINAC using an Advanced Markus® ionization chamber to determine the reference dose in water at the source-to-surface distance (SSD)=100 cm, using the correction factors obtained in this study. Results: The values of the correction factors obtained in this work are in good agreement with the published data. The measured dose-per-pulse for electron beams at the depth of maximum dose for SSD=100 cm was 115 mGy/pulse, with a standard uncertainty of 2.4%. In contrast, the ks values determined using the IAEA and AAPM methods are, respectively, 8.9% and 8.2% higher than our results. Conclusions: The new method based on Boag's improved model provides a practical method of determining the ion-recombination correction factors for high dose-per-pulse radiation beams up to about 120 mGy/pulse. This method can be applied to electron beams with even higher dose-per-pulse, subject to independent verification.

Nano Patterning on Graphite by Ion-Beam Sputtering

  • Yoon, Sun Mi;Kim, J.S.
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.214-214
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    • 2013
  • Ion beam sputtering (IBS) by collision of energetic ions at surfaces is one of the representative methods for physical self-assembly. It is in spotlight as an easy tool to make nano structures in various sizes and shapes by controlling physical variablesWe investigate nano patterning on graphite. We found well-ordered nano ripple patterns after sputtering under the oblique angle and mean wavelengths of these ripples could be controlled as ion fluence increases from sub-10 nm to 80 nm. Each nano ripple is terminated by nano buds, which look like a cotton bud. We also examined the formation of various patterns on graphite by sputtering during swinging the sample at a constant angular velocity that have been never reported.

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Characterization of X-ray Emitted in the Ion Implantation Process of Semiconductor Operations (반도체 제조 이온주입 공정의 이온 임플란타 장치에서 엑스레이 발생 특성)

  • Dong-Uk Park;Kyung Ehi Zoh;Soyeon Kim;Seunghee Lee;Eun Kyo Jeong
    • Journal of Korean Society of Occupational and Environmental Hygiene
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    • v.33 no.4
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    • pp.439-446
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    • 2023
  • Objectives: The aims of this study are to investigate how X-rays are emitted to surrounding parts during the ion implantation process, to analyze these emissions in relation to the properties of the ion implanter equipment, and to estimate the resulting exposure dose. Eight ion implanters equipped with high-voltage electrical systems were selected for this study. Methods: We monitored X-ray emissions at three locations outside of the ion implanters: the accelerator equipped with a high-voltage energy generator, the impurity ion source, and the beam line. We used a Personal Portable Dose Rate and Survey Meter to monitor real-time X-ray levels. The SX-2R probe, an X-ray Features probe designed for use with the RadiagemTM meter, was also utilized to monitor lower ranges of X-ray emissions. The counts per second (CPS) measured by the meter were estimated and then converted to a radiation dose (𝜇Sv/hr) based on a validated calibration graph between CPS and μGy/hr. Results: X-rays from seven ion implanters were consistently detected in high-voltage accelerator gaps, regardless of their proximity. X-rays specifically emanated from three ion implanters situated in the ion box gap and were also found in the beam lines of two ion implanters. The intensity of these X-rays did not show a clear pattern relative to the devices' age and electric properties, and notably, it decreased as the distance from the device increased. Conclusions: In conclusion, every gap, in which three components of the ion implanter devices were divided, was found to be insufficiently shielded against X-ray emissions, even though the exposure levels were not estimated to be higher than the threshold.

Testing of the permeability of concrete box beam with ion transport method in service

  • Wang, Jia Chun
    • Computers and Concrete
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    • v.15 no.3
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    • pp.461-471
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    • 2015
  • The permeability is the most direct indicator to reflect the durability of concrete, and the testing methods based on external electric field can be used to evaluate concrete permeability rapidly. This study aims to use an experiment method to accurately predict the permeability of concrete box beam during service. The ion migration experiments and concrete surface resistivity are measured to evaluate permeability of five concrete box beams, and the relations between these results in service concrete and electric flux after 6 hours by ASTM C1202 in the laboratory are analyzed. The chloride diffusion coefficient of concrete, concrete surface resistivity and concrete 6 hours charge have good correlation relationship, which denote that the chloride diffusion coefficient and the surface resistivity of concrete are effective for evaluating the durability of concrete structures. The chloride diffusion coefficient of concrete is directly evaluated permeability of concrete box beam in service and may be used to predict the service life, which is fit to engineering applications and the concrete box beam is non-destructive. The concrete surface resistivity is easier available than the chloride diffusion coefficient, but it is directly not used to calculate the service life. Therefore the mathematical relation of the concrete surface resistivity and the concrete chloride diffusion coefficient need to be found, which the service life of reinforced concrete is obtained by the concrete surface resistivity.

Influence of Deposition Method on Refractive Index of SiO2 and TiO2 Thin Films for Anti-reflective Multilayers

  • Song, Myung-Keun;Yang, Woo-Seok;Kwon, Soon-Woo;Song, Yo-Seung;Cho, Nam-Ihn;Lee, Deuk-Yong
    • Journal of the Korean Ceramic Society
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    • v.45 no.9
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    • pp.524-530
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    • 2008
  • Anti-Reflective (AR) thin film coatings of $SiO_2$ (n= 1.48) and $TiO_2$ (n=2.17) were deposited by ion-beam assisted deposition (IBAD) with End-Hall ion source and conventional electron beam (e-beam) evaporation to investigate the effect of deposition method on the refractive indicies (n) of the fIlms. Green-light generation using a GaAs laser diode was achieved via excitation of the second harmonic. The latter resulted from the transmission of the fundamental guided-mode wave of 1064 nm through periodically poled $LiNbO_3$. Large differences in the refractive indicies of each of the layers in the multilayer coating may improve AR performance. IBAD of $SiO_2$ reduced its refractive index from 1.45 to 1.34 at 1064 nm. Conversely, e-beam evaporation of $TiO_2$ increased its refractive index from 1.80 to 2.11. In addition, no fluctuations in absorption at the wavelength of 1064 nm were found. The results suggest that films prepared by different deposition methods can increase the effectiveness of multilayer AR coatings.

Particle Simulation Modelling of a Beam Forming Structure in Negative-Ion-Based Neutral Beam Injector (중성빔 입사장치에서 빔형성 구조의 입자모사 모형)

  • Park, Byoung-Lyong;Hong, Sang-Hee
    • Nuclear Engineering and Technology
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    • v.21 no.1
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    • pp.40-47
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    • 1989
  • For the effective design of a beam forming structure of the negative-ion-based neutral beam injector, a computer program based on a particle simulation model is developed for the calculation of charged particle motions in the electrostatic fields. The motions of negative ions inside the acceleration tube of a multiple-aperture triode are computed at finite time steps. The electrostatic potentials are obtained from the Poisson's equation by the finite difference method. The successive overrelaxation method is used to solve the matrix equation. The particle and force weighting methods are used on a cloud-in-cell model. The optimum design of the beam forming structure has been studied by using this computer code for the various conditions of elctrodes. The effects of the acceleration-deceleration gap distance, the thickness of the deceleration electrode and the shape of the acceleration electrode on beam trajectories are exmined to find the minimum beam divergence. Some numerical illustrations are presented for the particle movements at finite time steps in the beam forming tubes. It is found in this particle simulation modelling that the shape of the acceleration electrode is the most significant factor of beam divergence.

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