• Applied Microscopy
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• 제42권4호
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• pp.207-211
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• 2012

We examined the electrical properties and microstructure of NiO produced using a sol-gel method and Ni nitrate hexahydrate ($Ni[NO_3]_2{\cdot}6H_2O$) to investigate if this NiO thin film can be used as an insulator layer for resistance random access memory (ReRAM) devices. It was found that as-prepared NiO film was polycrystalline and presented as the nonstoichiometric compound $Ni_{1+x}O$ with Ni interstitials (oxygen vacancies). Resistances-witching behavior was observed in the range of 0~2 V, and the low-resistance state and high-resistance state were clearly distinguishable (${\sim}10^3$ orders). It was also demonstrated that NiO could be patterned directly by KrF eximer laser irradiation using a shadow mask. NiO thin film fabricated by the sol-gel method does not require any photoresist or vacuum processes, and therefore has potential for application as an insulating layer in low-cost ReRAM devices.

• Nuclear Engineering and Technology
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• 제55권6호
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• pp.2298-2304
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• 2023

Titanium alloys are expected to become one of the candidate materials for nuclear-powered spacecraft due to their excellent overall performance. Nevertheless, atomistic mechanisms of the defect accumulation and evolution of the materials due to long-term exposure to irradiation remain scarcely understood by far. Here we investigate the heavy irradiation damage in a-titanium with a dose as high as 4.0 canonical displacements per atom (cDPA) using atomistic simulations of Frenkel pair accumulation. Results show that the content of surviving defects increases sharply before 0.04 cDPA and then decreases slowly to stabilize, exhibiting a strong correlation with the system energy. Under the current simulation conditions, the defect clustering fraction may be not directly dependent on the irradiation dose. Compared to vacancies, interstitials are more likely to form clusters, which may further cause the formation of 1/3<1210> interstitial-type dislocation loops extended along the (1010) plane. This study provides an important insight into the understanding of the irradiation damage behaviors for titanium.

• 한국세라믹학회지
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• 제31권12호
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• pp.1491-1500
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• 1994

Nonstoichiometry($\delta$) and the phase stability region of a ferrite spinel (Mg0.29Fe0.71)3-$\delta$O4 have been investigated by a coulometric titration method as a function of temperature(T) and oxygen partial pressure(Po2). It has been found that the spinel is thermodynamically stable in the ranges -8.0$\leq$log(PO2/atm)$\leq$-2.4, -7.0$\leq$log(PO2/atm)$\leq$-1.7 respectvely at 100$0^{\circ}C$. The nonstoichiometry extends over the ranges of -0.004$\leq$$\delta$$\leq$0.007, -0.008$\leq$$\delta$$\leq$0.006, -0.033$\leq$$\delta$$\leq$0.004 at 100$0^{\circ}C$, 120$0^{\circ}C$, respectvely. The observed PO2-dependence of $\delta$ suggests that the majority ionic defects are cation interstitials in the low PO2 region and cation vacancies in the high PO2 region.

• Journal of Electrical Engineering and Technology
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• 제7권6호
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• pp.965-970
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• 2012

Structure and optical properties of cadmium sulphide-zinc oxide composite nanorods have been evaluated by suitable characterization techniques. The X-ray diffraction spectrum contains a series of peaks corresponding to reflections from various sets of lattice planes of hexagonal ZnO as well as CdS. The above observation is supported by the Micro-Raman spectroscopy result. The optical reflectance spectra of CdS-ZnO is compared with that of ZnO where we observe an enhanced absorption and hence diminished reflection from CdS-ZnO compared to that from only ZnO. A very small intensity of the visible photoluminescence peak observed at 550 nm proves that the ZnO nanorods have very low concentrations of point defects such as oxygen vacancies and zinc interstitials. The photocurrent in the visible region has been significantly enhanced due to deposition of CdS on the surface of the ZnO nanorods. CdS acts as a visible sensitizer because of its lower band gap compared to ZnO.

• JSTS:Journal of Semiconductor Technology and Science
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• 제14권1호
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• pp.40-47
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• 2014

In this paper, $Al_2O_3$ film deposited by thermal atomic layer deposition (ALD) with diluted $NH_4OH$ instead of $H_2O$ was suggested for passivation layer and anti-reflection (AR) coating of the p-type crystalline Si (c-Si) solar cell application. It was confirmed that the deposition rate and refractive index of $Al_2O_3$ film was proportional to the $NH_4OH$ concentration. $Al_2O_3$ film deposited with 5 % $NH_4OH$ has the greatest negative fixed oxide charge density ($Q_f$), which can be explained by aluminum vacancies ($V_{Al}$) or oxygen interstitials ($O_i$) under O-rich condition. $Al_2O_3$ film deposited with $NH_4OH$ 5 % condition also shows lower interface trap density ($D_{it}$) distribution than those of other conditions. At $NH_4OH$ 5 % condition, moreover, $Al_2O_3$ film shows the highest excess carrier lifetime (${\tau}_{PCD}$) and the lowest surface recombination velocity ($S_{eff}$), which are linked with its passivation properties. The proposed $Al_2O_3$ film deposited with diluted $NH_4OH$ is very promising for passivation layer and AR coating of the p-type c-Si solar cell.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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• pp.11-11
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• 2008

ZnO has a very large exciton binding energy (60 meV) as well as thermal and chemical stability, which are expected to allow efficient excitonic emission, even at room temperature. ZnO based electronic devices have attracted increasing interest as the backplanes for applications in the next-generation displays, such as active-matrix liquid crystal displays (AMLCDs) and active-matrix organic light emitting diodes (AMOLEDs), and in solid state lighting systems as a substitution for GaN based light emitting diodes (LEDs). Most of these electronic devices employ the electrical behavior of n-type semiconducting active oxides due to the difficulty in obtaining a p-type film with long-term stability and high performance. p-type ZnO films can be produced by substituting group V elements (N, P, and As) for the O sites or group I elements (Li, Na, and K) for Zn sites. However, the achievement of p-type ZnO is a difficult task due to self-compensation induced from intrinsic donor defects, such as O vacancies (Vo) and Zn interstitials ($Zn_i$), or an unintentional extrinsic donor such as H. Phosphorus (P) doped ZnO thin films were grown on c-sapphire substrates by radio frequency magnetron sputtering with various Ar/ $O_2$ gas ratios. Control of the electrical types in the P-doped ZnO films was achieved by varying the gas ratio with out post-annealing. The P-doped ZnO films grown at a Ar/ $O_2$ ratio of 3/1 showed p-type conductivity with a hole concentration and hole mobility of $10^{-17}cm^{-3}$ and $2.5cm^2/V{\cdot}s$, respectively. X-ray diffraction showed that the ZnO (0002) peak shifted to lower angle due to the positioning of $p^{3-}$ ions with a smaller ionic radius in the $O^{2-}$ sites. This indicates that a p-type mechanism was due to the substitutional Po. The low-temperature photoluminescence of the p-type ZnO films showed p-type related neutral acceptor-bound exciton emission. The p-ZnO/n-Si heterojunction LEO showed typical rectification behavior, which confirmed the p-type characteristics of the ZnO films in the as-deposited status, despite the deep-level related electroluminescence emission.

• 한국재료학회지
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• 제9권3호
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• pp.327-332
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• 1999

중성자에 조사 $(fluence: 2.3\times10^{19}ncm^{-2}, 553 K, E\geq1.0 MeV)$된 Mn-Mo-Ni 저 합금강 모재의 열처리 회복 거동을 조사하기 위하여 등시소둔과 등온소둔을 수행하여 회복 활성화에너지, 회복 반응차수 그리고 회복 반응률상수를 결정하였다. 열처리 후 회복은 비커스 미세 고온경도기로 측정하였고 실험결과를 이용, 열처리 회복단계, 회복결함들의 거동 및 회복 kinetics을 분석하였다. 실험결과 2단계의 회복구간(stage I : 703-753K, stage II : 813K-873K)이 나타났으며 각 단계의 회복활성화 에너지는 2.50 eV(1단계) 및 2.93 eV(2단계)이었다. 조사재와 비조사재의 등시소둔 곡선의 비교를 통하여 813K에서 RAH(radiation anneal hardening) 피크를 확인할 수 있었다. 743K 및 833K에서 수행한 등온소둔 결과, 회복의 60%가 모두 120분 이내에 일어나는 것으로 관찰되었다. 회복 반응차수는 두 회복구간에서 모두 2로 나타났으며 회복 반응율상수는 $3.4\times10^{-4}min^{-1}$(1단계)과 $7.1\times10^{-4}min^{-1}$(2단계) 이었다. 이상의 결과와 기 발표된 자료들을 함께 분석한 결과, 본 재료의 회복은 오랜 중성자조사로 형성된 점결함 집합체들이 열처리에 의한 분해와 Fe 기지에 격자간 원자로 존재하던 self-interstitial들과 vacancy들의 재결합에 의해 일어나는 것으로 해석된다.