• Restorative Dentistry and Endodontics
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• v.25 no.3
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• pp.313-320
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• 2000

The purpose of this study was to evaluate on the interfacial morphology between dentin and restorative materials. In this in vitro study, the cavity wall restorated with 3 different kinds of tooth colored restorative materials [resin-modified Glass Ionomer cement (Fuji II LC), composite resin (Z-100), compomer (Dyract)]. The thirty extracted human molar teeth without caries and/or restorations are used. The experimental teeth were randomly divided into three groups of ten teeth each. In each group, Wedge shaped cavities (width: 3mm, length: 2mm, depth: 1.5mm) were prepared at the cementoenamel junction on buccal and lingual surfaces. The adhesive of composite resin were mixed with rhodamine B. Primer of composite resin, Prime & Bond 2.1 of Dyract and liquid of Fuji II LC were mixed with fluorescein. In group 1, the cavity wall was treatment with dentin conditioner, and then restorated with Fuji II LC. In group 2, the cavity wall was treatment with Prime & Bond 2.1 and then restorated with Dyract. In group 3, the cavity wall was etching with 10% maleic acid, applied with primer and bonding agent and then restorated with Z-100. The interface between dentin and restorative materials was observed by fluoresence imaging with a confocal laser scanning microscope. The results were as follows : 1. In Glass ionomer group, adaptation of resin modified Glass-ionomer restoration against cavity wall is tight, but the crack formed inside of restoration were observed. 2. In Dyract group, the penetration of resin tag is shorter and the width of hybrid layer is narrower than composite resin group. 3. In Z-100 group, primer penetrated deeply through dentinal tubule. Also bonding agent was penetrated along the primer, but the penetration length is shorter than primer part, and in 3-D image, the resin tag is conical shape and lateral branch is observed.

• Proceedings of the SCSK Conference
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• 2003.09b
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• pp.330-342
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• 2003

The formation of emulsions and micelles in water/ceramide PC104/CholE $O_{20}$/C$_{16}$E $O_{20}$ and water/ceramide PC104/CholE $O_{20}$ mixtures was investigated through the phase behavior studies. The phase diagrams showed the existence of micelle and emulsion regions in both systems. The mixed surfactant system (CholE $O_{20}$/C$_{16}$E $O_{20}$) showed the wider micellar and emulsion regions than the single surfactant system (CholE $O_{20}$). From FT-IR measurements, it was found that the polyoxyethylene (POE) groups of surfactants formed the hydrogen bonds with amido carbonyl group in ceramide PC104. This result indicated that the hydrophilic part (EO) of surfactants could stabilize the lamellar structure and emulsion of ceramide PC104. The mixed surfactant system (CholE $O_{20}$/C$_{16}$E $O_{20}$) resulted in the smaller emulsion droplet size due to the effect of curvature at the interface, thus further increasing emulsion stability. With the penetration of $C_{16}$E $O_{20}$into the interfacial layer of surfactants in emulsion, the curvature of the interface might be altered for the formation of smaller emulsion droplets. The mixed surfactant system could incorporate up to 4 wt. % of ceramide PC104 into emulsion more than single surfactant system.ystem.m.

• Bulletin of the Korean Chemical Society
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• v.33 no.7
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• pp.2207-2212
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• 2012

Dimethylaluminum isopropoxide (DMAI, $(CH_3)_2AlO^iPr$) as a single precursor, which contains one aluminum and one oxygen atom, has been adopted to deposit non-stoichiometric aluminum oxide ($AlO_x$) films by low pressure metal organic chemical vapor deposition without an additional oxygen source. The atomic concentration of Al and O in the deposited $AlO_x$ film was measured to be Al:O = ~1:1.1 and any serious interfacial oxide layer between the film and Si substrate was not observed. Gaseous by-products monitored by quadruple mass spectrometry show that ${\beta}$-hydrogen elimination mechanism is mainly contributed to the $AlO_x$ CVD process of DMAI precursor. The current-voltage characteristics of the $AlO_x$ film in Au/$AlO_x$/Ir metalinsulator-metal (MIM) capacitor structure show high ON/OFF ratio larger than ${\sim}10^6$ with SET and RESET voltages of 2.7 and 0.8 V, respectively. Impedance spectra indicate that the switching and memory phenomena are based on the bulk-based origins, presumably the formation and rupture of filaments.

• Proceedings of the Materials Research Society of Korea Conference
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• 2009.05a
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• pp.29.2-29.2
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• 2009

21세기 제 3의 산업혁명을 가져올 것으로 기대되는 나노기술(NT), 정보기술(IT), 바이오기술(BT)은 전 세계 과학자들의 마음을 사로잡고 있다. 이 가운데 나노기술은 전자산업에 응용 시 그 기대효과는 우리가 상상하는 이상의 것이라 예상하고 있다. 나노기술에 특히 관심을 가지는 이유는 물질이 마이크로미터 크기로 작아져도 벌크물질의 물리적 특성이 그대로 유지되지만, 나노미터 크기가 되면서 우리가 경험하지 못했던 새로운 물리적 특성들이 발현되기 때문이다. 그 특성에는 양자구속효과, Hall-Petch 효과, 자기효과 등이 있다. 나노기술의 구현은 양자점과 같은 영차원 나노입자, 나노와이어, 나노막대, 나노리본 등과 같은 직경이 100nm 이하의 일차원 구조의 나노물질 및 나노박막과 기타 100nm 이하의 나노구조물들이 사용된다. 현재 일차원 구조를 이용한 전자디바이스화 연구는 결정성장을 정확하게 조절하는 합성기술, 합성된 일차원 나노물질의 물리적 특성을 지배하는 각종 파라미터들과 물리적 특성들과의 상관관계 정립, 나노와이어를 이용한 Bottom-up 방식에 의한 조립기술 확보를 위해 활발히 진행 중이다. 하지만 나노구조의 특성을 확인하는 형태의 연구일 뿐, 실제 디바이스 구현에는 여전히 많은 과제를 안고 있다. 본 연구에서는 선택적 삼원계 단결정 씨앗층을 이용한 길이/직경 비가 매우 향상된 MgZnO 나노와이어를 interfacial layer 없이 수직으로 성장하여 산화물 전계방출 에미터로서의 가능성을 확인하였다.

• Journal of the Korean Ceramic Society
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• v.37 no.11
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• pp.1051-1057
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• 2000

TiO$_2$와 CeO$_2$박막을 Si 위에 증착한 후 MOCVD법에 의해 PbTiO$_3$박막을 증착하여 MFIS 구조를 형성하였다. 절연층의 후열처리가 절연층 및 MFIS 구조의 전기적 특성에 미치는 영향을 관찰하기 위해 산소분위기와 $600^{\circ}C$~90$0^{\circ}C$의 온도범위에서 후 열처리를 행하였고, C-V 특성 및 누설전류 특성을 분석하였다. CeO$_2$와 TiO$_2$박막의 유전상수는 증착 직후 6.9와 15였으며, 90$0^{\circ}C$ 열처리를 행한 후 약 4.9와 8.8로 감소하였다. 누설전류밀도 역시 증착 직후 각각 7$\times$$10^{-5}$ A/$ extrm{cm}^2$와 2.5$\times$$10^{-5}$ A/$\textrm{cm}^2$에서 90$0^{\circ}C$ 열처리를 거친 후에 약 4$\times$$10^{-8}$ A/$\textrm{cm}^2$와 4$\times$$10^{-9}$ A/$\textrm{cm}^2$로 감소하였다. Ellipsometry 시뮬레이션을 통해 계산된 계면층의 두께는 90$0^{\circ}C$에서 약 115$\AA$(CeO$_2$) 및 140$\AA$(TiO$_2$)까지 증가하였다. 계면층은 MFIS 구조에서 강유전층에 인가되는 전계를 감소시켜 항전계를 증가시켰고, charge injection을 방지하여 Al/PbTiO$_3$/CeO$_2$(90$0^{\circ}C$, $O_2$)/Si 구조의 경우 $\pm$2 V~$\pm$10 V의 측정범위에서 memory window가 계속 증가하는 것을 보여주었다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.06a
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• pp.191-191
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• 2007

유효 산화막 두께가 약 2.0nm 정도의 $ZrO_2$ 절연막 위에 Ta-Mo 금속 합금과 Ru-Zr 금속 합금을 Co-sputtering 방법을 이용하여 여러 가지 일함수를 갖는 MOS capacitor를 제작하여 전기적 재료적 특성에 관하여 연구를 하였다. 그 결과 각각의 금속 합금 게이트는 4.1eV 에서 5.1eV 사이의 다양한 일함수를 나타냈으며, $400^{\circ}C$, $500^{\circ}C$, $600^{\circ}C$, $700^{\circ}C$, $800^{\circ}C$ RTA 후의 C-V특성 곡선 및 I-V 측정을 통하여 누설전류를 확인하였다. 그 결과 Ta-Mo 금속 합금의 경우 스퍼터링 파워가 100W/70W에서 NMOS에 적합한 일함수를 가졌으며, Ru-Zr 금속 합금의 경우 스퍼터링 파워가 50W/100W에서 NMOS에 적합한 일함수를 가졌다. 열처리 후의 C-V특성 곡선에서도 정전용랑 값이 거의 변하지 않았으며 평탄 전압의 변화도 거의 없었다. 누설전류 특성에서는 물리적 두께가 비슷한 기존의 $SiO_2$ 절연막에서 실험결과와 비교하여 약 100배 정도 감소되었음을 알 수 있었다. 또한 기존의 실험들에서 나타난 열처리 후의 $ZrO_2$ 절연막과 Si 기판 사이의 Interfacial layer 의 동반 두께 증가로 인한 전기적 특성 저하가 나타나지 않는 줄은 특성을 보여준다.

• Solar Energy
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• v.15 no.2
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• pp.25-37
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• 1995

This paper presents an approximate analytical solution to one-dimensional model of the charging process for stratified thermal storage tanks, in which variation of the inlet temperature as well as the momemtum-induced mixing is taken into accout. The mixing is incorporated into the model as a constant-depth perfectly mixed layer above the plug flow region. Based on the superposition principle, the variable inlet temperature is approximated by a number of step functions. Temperature distributions for the thermocline corresponding to three types of interfacial condition arr successfully derived in terms of well-defined functions, so that a linear combination of them constitutes the final solution. Validity and utility of this work is examined through the comparison of the approximate solution with an exact solution available for the case of linearly increasing inlet temperature. With increasing the number of steps, the present solution asymptotically approaches to the exact one. Even with a limited number of steps, the present results favorably agree with those by the exact solution for a wide range of the mixing depth. Also, it is revealed that fewer steps are needed for meaningful predictions as the mixing. depth becomes larger.

• Journal of the Korean Magnetics Society
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• v.21 no.6
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• pp.214-218
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• 2011

In this study, we have systematically investigated the effect of sputtering conditions on the microstructural properties of Ag/CoFeB thin film on MgO substrate. It was found that the crystallinity and surface roughness of the Ag film strongly depends on the Ar sputtering pressure and sputtering power. Epitaxial growth of Ag(100) film on MgO(100) substrate was achieved under the sputtering conditions of high sputtering power and elevated temperature. XRR (X-ray reflectivity) and high-resolution TEM (transmission electron microscopy) measurements also revealed the interfacial roughening in the Ag/CoFeB interface due to the island structure formation and intermixing between Ag and CoFeB.

• Journal of the Microelectronics and Packaging Society
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• v.28 no.4
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• pp.109-114
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• 2021

We investigated the effects of atmospheric hydrogen plasma treatment on Cu-Cu direct bonding. Hydrogen plasma was effective in reducing the surface oxide layer of Cu thin film, which was confirmed by GIXRD analysis. It was observed that larger plasma input power and longer treatment time were effective in terms of reduction and surface roughness. The interfacial adhesion energy was measured by DCB test and it was observed to decrease as the bonding temperature decreased, resulting in bonding failure at bonding temperature of 200℃. In case of wet treatment, strong Cu-Cu bonding was observed above bonding temperature of 250℃.

• Proceedings of the Korean Vacuum Society Conference
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• 2000.02a
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• pp.173-173
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• 2000

Multilayered films (MLF) consisting of transition metals and semiconductors have drawn a great deal of interest because of their unique properties and potential technological applications. Fe/Si MLF are a particular topic of research due to their interesting antiferromagnetic coupling behavior. although a number of experimental works have been done to understand the mechanism of the interlayer coupling in this system, the results are controversial and it is not yet well understood how the formation of an iron silicide in the spacer layers affects the coupling. The interpretation of the coupling data had been hampered by the lack of knowledge about the intermixed iron silicide layer which has been variously hypothesized to be a metallic compound in the B2 structure or a semiconductor in the more complex B20 structure. It is well known that both magneto-optical (MO0 and optical properties of a metal depend strongly on their electronic structure that is also correlated with the atomic and chemical ordering. In order to understand the structure and physical properties of the interfacial regions, Fe/Si multilayers with very thin sublayers were investigated by the MO and optical spectroscopies. The Fe/si MLF were prepared by rf-sputtering onto glass substrates at room temperature with a totall thickness of about 100nm. The thicknesses of Fe and Si sublayers were varied from 0.3 to 0.8 nm. In order to understand the fully intermixed state, the MLF were also annealed at various temperatures. The structure and magnetic properties of Fe/Si MLF were investigated by x-ray diffraction and vibrating sample magnertometer, respectively. The MO and optical properties were measured at toom temperature in the 1.0-4.7 eV energy range. The results were analyzed in connection with the MO and optical properties of bulk and thin-film silicides with various structures and stoichiometries.