• Title/Summary/Keyword: In situ microscopy

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Effect of Na3PO4 Concentration on The Formation Behavior of PEO films on AZ31 Mg Alloy (AZ31 Mg합금의 PEO피막 형성거동에 미치는 인산나트륨 농도의 영향)

  • Moon, Sungmo;Kim, Juseok
    • Journal of the Korean institute of surface engineering
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    • v.52 no.5
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    • pp.265-274
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    • 2019
  • Formation behavior of PEO (Plasma Electrolytic Oxidation) films on AZ31 Mg alloy was investigated under application of 310 Hz AC as a function of $Na_3PO_4$ concentration from 0.02 M to 0.2 M. Film formation voltage and in-situ observation of arcs generated on the specimen surface were recorded with time, and surface morphologies of the PEO films were investigated using optical microscopy, confocal scanning laser microscopy and scanning electron microscopy. PEO film formation voltage decreased linearly with increasing $Na_3PO_4$ concentration which is attributed to the increase of solution pH. PEO films were grown uniformly over the entire surface in $Na_3PO_4$ solutions between 0.05 M and 0.1 M. However, non-uniform PEO films with white spots were formed in $Na_3PO_4$ solutions containing more than 0.1 M. Thickness and roughness of PEO films on AZ31 Mg alloy increased linearly with increasing $Na_3PO_4$ concentration and their increasing rates appeared to be much higher under 1 M than above 1 M. The experimental results suggest that phosphate ions can contribute to the formation of PEO films but higher $Na_3PO_4$ concentration more than 1 M results in local damages of PEO films due to repeated generation of white arcs at the same surface site of AZ31 Mg alloy.

Structural Analysis of Low Temperature Processed Schottky Contacts to n-InGaAs (저온공정 n-InGaAs Schottky 접합의 구조적 특성)

  • 이홍주
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.14 no.7
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    • pp.533-538
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    • 2001
  • The barrier height is found to increase from 0.25 to 0.690 eV for Schottky contacts on n-InGaAs using deposition of Ag on a substrate cooled to 77K(LT). Surface analysis leads to an interface model for the LT diode in which there are oxide compounds of In:O and As:O between the metal and semiconductor, leading to behavior as a metal-insulator-semiconductor diode. The metal film deposited t LT has a finer and more uniform structure, as revealed by scanning electron microscopy and in situ metal layer resistance measurement. This increased uniformity is an additional reason for the barrier height improvement. In contrast, the diodes formed at room temperature exhibit poorer performance due to an unpassivated surface and non-uniform metal coverage on a microscopic level.

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Deformation Behavior in Compatible Polymer Blends (고분자블렌드에서의 변형거동)

  • 전병철
    • Proceedings of the Materials Research Society of Korea Conference
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    • 1992.05a
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    • pp.121-121
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    • 1992
  • Deformation behavior of compatible polymer blends was studied using scanning electron, optical, and transmission electron microscopies. Four different compatible systems were employed and charaterized in this investigation : polystyrene(PS) and polyphenylene oxide(PPO), polystyrene(PS) and polyvinlmethylether(PVME), polystyrene(PS) and poly $\alpha$-methylstyrene(P$\alpha$MS). Individual craze and shear deformation zone microstructures were examined by transmission microscopy (TEM). For TEM observations, specimens deformed in-situ on a TEM grid were utilized. Quantiative analysis of these crazes and shear deformation zones was obtained from the nicrodensitometry of the TEM negatives in the manner developed by Lauterwasser and Kramer. Microdensitometry resulys showed that the fibril extension ratio decreased as the PPO content increased in the PS/PPO blends, and finally, for 100% PPO, only shear deformation zones were observed. For the PS/PVME blends, the ribril extension ratio also decreased as the VME content increased. For the PS/P$\alpha$MS blends, the fibril extension ratio increased as the P$\alpha$MS content increased, For the PPO/P$\alpha$MS blends, the fibril extension ratio increased as the P$\alpha$MS content increased.

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Ellipso-Microscopic Observation of Titanium Surface under UV-Light Irradiation

  • Fushimi, K.;Kurauchi, K.;Nakanishi, T.;Hasegawa, Y.;Ueda, M.;Ohtsuka, T.
    • Corrosion Science and Technology
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    • v.15 no.6
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    • pp.265-270
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    • 2016
  • The ellipso-microscopic observation of a titanium surface undergoing anodization in $0.05mol\;dm^{-3}$ of $H_2SO_4$ was conducted. During irradiation by ultra-violet (UV) light with a wavelength of 325 nm, the titanium surface allowed for the flow of a photo-induced current and showed up as a bright, patch-like image on an ellipso-microscopic view. The brightness and patch-pattern in the image changed with flowing photo-induced current. The changes in the brightness and the image corresponded to the formation and/or degradation of titanium oxide due to the photo-electrochemical reaction of the oxide. An in situ monitoring using the ellipso-microscope revealed that the film change was dependent on the irradiation light power, by UV-light increases the anodic current and results in the initiation of pitting at lower potentials as compared with the non-irradiated condition.

Studies on Properties of Polyaniline-Dodecylbenzene Sulfonic Acid Composite Films Synthesized Using Different Oxidants

  • Basavaraja, C.;Pierson, R.;Huh, Do-Sung;Venkataraman, A.;Basavaraja, S.
    • Macromolecular Research
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    • v.17 no.8
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    • pp.609-615
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    • 2009
  • Two types of nano composite were obtained by in situ chemical method in polyaniline (PANI)/dodecyl-benzenesulfonic acid (DBSA) system depending on the use of either ammonium persulfate (APS) or ferric chloride ($FeCl_3$) as the oxidant. In order to study the difference of the two composites in the surface characteristics, thermal stability, and electric properties, the composite films were studied by transmission electron microscopy (TEM), X-ray diffraction (XRD), thermogravimetric analysis (TGA), and temperature dependent DC electrical conductivity. The results revealed a large difference in the surface morphology, thermal stability, and the microstructure properties between the two composites, and these differences were considered responsible for the molecular order and conductivity.

Electromagnetic Interference Reflectivity of Nanostructured Manganese Ferrite Reinforced Polypyrrole Composites

  • Chakraborty, Himel;Chabri, Sumit;Bhowmik, Nandagopal
    • Transactions on Electrical and Electronic Materials
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    • v.14 no.6
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    • pp.295-298
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    • 2013
  • Nano-size manganese ferrite reinforced conductive polypyrrole composites reveal a core-shell structure by in situ polymerization, in the presence of dodecyl benzene sulfonic acid as the surfactant and dopant, and iron chloride as the oxidant. The structure and magnetic properties of manganese ferrite nano-fillers were measured, by using X-ray diffraction and vibrating sample magnetometer. The morphology, microstructure, and conductivity of the composite were characterized by transmission electron microscopy, Fourier transform infrared spectroscopy, and four-wire technique. The microwave-absorbing properties of composites reinforcement dispersed in resin coating with the coating thickness of 1.2 nm were investigated, by using vector network analyzers, in the frequency range of 8~12 GHz. A reflection loss of -8 dB was observed at 10.5 GHz.

Synthesis and Characterization of Tungsten Trioxide Films Prepared by a Sol-Gel Method for Electrochromic Applications

  • Kim, Tae-Ho;Nah, Yoon-Chae
    • Journal of Powder Materials
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    • v.22 no.5
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    • pp.309-314
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    • 2015
  • Tungsten trioxide thin films are successfully synthesized by a sol-gel method using tungsten hexachloride as precursors. The structural, chemical, and optical properties of the prepared films are characterized by scanning electron microscopy, X-ray diffraction, X-ray photoelectron spectroscopy, and UV-Vis spectrophotometry. The electrochemical and electrochromic properties of the films before and after heat treatment are also investigated by cyclic voltammetry, chronoamperometry, and in situ transmittance measurement system. Compared to as-prepared films, heat-treated tungsten trioxide thin films exhibit a higher electrochemical reversibility of 0.81 and superior coloration efficiency of $65.7cm^2/C$, which implies that heat treatment at an appropriate temperature is a crucial process in a sol-gel method for having a better electrochromic performance.

Order-to-disorder Behavior of Block Copolymer Films

  • Ryu, Du-Yeol;Kim, Eun-Hye;Choe, Seung-Hun
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2011.05a
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    • pp.6.2-6.2
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    • 2011
  • Block copolymer (BCP) self-assembly in a film geometry has recently been the focus of increased research interest due to their potential use as templates and scaffolds for the fabrication of nanostructured materials. The phase behavior in a thin film geometry that confines polymer chains to the interfaces will be influenced by the interfacial interactions at substrate/polymer and polymer/air and the commensurability between the equilibrium period (L0) of the BCP and the total film thickness. We investigated the phase transitions for the films of block copolymers (BCPs) on the modified surface, like the order-to-disorder transition (ODT) by in-situ grazing incidence small angle x-ray scattering (GISAXS) and transmission electron microscopy (TEM). The selective interactions on the surface by a PS-grafted substrate provide the preferential interactions with the PS component of the block, while a random copolymer (PS-r-PMMA) grafted substrate do the balanced interfacial interactions on the surface. The thickness dependence of order-to-disorder behavior for BCP films will be discussed in terms of the surface interactions.

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In-situ rf treatment of multiwall carbon nanotube with various post techniques for enhanced field emission

  • Ahn, Kyoung-Soo;Kim, Jun-Sik;Kim, Ji-Hoon;Kim, Chae-Ok;Hong, Jin-Pyo
    • 한국정보디스플레이학회:학술대회논문집
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    • 2003.07a
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    • pp.859-862
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    • 2003
  • Well-aligned multiwall carbon nanotubes (MWCNTs) were prepared at low temperature of 400 $^{\circ}C$ by utilizing a radio frequency plasma-enhanced chemical vapor deposition (rf-PECVD) system. The MWCNTs were treated by an external rf plasma source and an ultra-violet laser in order to modify structural defect of carbon nanotube and to ablate possible contamination on carbon nanotube surface. Structural properties of carbon nanotubes were investigated by using a scanning electron microscopy (SEM), Raman spectroscopy, Fourier transformer Infrared spectroscopy (FTIR) and transmission electron microscope (TEM). In addition, the emission properties of the MWNTs were measured for the application of field emission display (FED) in near future. Various post treatments were found to improve the field emission property of carbon nanotubes.

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PBMS의 교정 및 이를 이용한 진공 내 나노입자의 실시간 분석 연구

  • Kim, Dong-Bin;Mun, Ji-Hun;Kim, Hyeong-U;Kim, Deuk-Hyeon;Lee, Jun-Hui;Gang, Sang-U;Kim, Tae-Seong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2015.08a
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    • pp.91-91
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    • 2015
  • 반도체 공정의 발전에 의해 최근 생산되는 메모리 등은 십 수 나노미터까지 좁아진 선 폭을 갖게 되었다. 이러한 이유로, 기존에는 큰 문제를 발생시키지 않던 나노미터 영역의 입자들이 박막 증착 공정과 같은 반도체 제조공정 수율을 저감시키게 되었다. 따라서 오염입자의 유입을 막거나 제어하기 위해 transmission electron microscopy (TEM)나 scanning electron microscopy (SEM)과 같은 전자현미경을 활용한 비 실시간 입자 측정 방법 및 광원을 이용하는 in-situ particle monitor (ISPM) 및 전기적 이동도를 이용한 scanning mobility particle sizer (SMPS) 등 다양한 원리를 이용한 실시간 입자 측정방법이 현재 사용중에 있다. 이 중 진공 내 입자의 수농도를 측정하기 위해 개발된 particle beam mass spectrometer (PBMS) 기술은 박막 증착 공정 등 chemical vapor deposition (CVD) 방법을 이용하는 진공공정에서 활용 가능하여 개발이 진행되어 왔다. 본 연구에서는 PBMS의 한계점인 입자 밀도, 형상 등의 특성분석이 용이하도록 PBMS와 scanning electron microscopy (SEM), 그리고 energy dispersive spectroscopy (EDS) 기술을 결합하여 입자의 직경별 개수농도, 각 입자의 형상 및 성분을 함께 측정 가능하도록 하였다. 협소한 반도체 제조공정 내부 공간에 적용 가능하도록 기존 PBMS 대비 크기 또한 소형화 하였다. 각 구성요소인 공기역학 집속렌즈, electron gun, 편향판, 그리고 패러데이 컵의 설치 및 물리적인 교정을 진행한 후 입자발생장치를 통해 발생시킨 sodium chloride 입자를 상압 입자 측정 및 분류장치인 SMPS 장치를 이용하여 크기별로 분류시켜 압력차를 통해 PBMS로 유입시켜 측정을 진행하였다. 나노입자의 입경분포, 형상 및 성분을 측정결과를 토대로 장치의 측정정확도를 교정하였다. 교정된 장치를 이용하여 실제 박막 증착공정 챔버의 배기라인에서 발생하는 입자의 수농도, 형상 및 성분의 복합특성 측정이 가능하였으며, 최종적으로 실제 공정에 적용가능하도록 장치 교정을 완료하였다.

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