DOI QR코드

DOI QR Code

Ellipso-Microscopic Observation of Titanium Surface under UV-Light Irradiation

  • Fushimi, K. (Faculty of Engineering, Hokkaido University) ;
  • Kurauchi, K. (Faculty of Engineering, Hokkaido University) ;
  • Nakanishi, T. (Faculty of Engineering, Hokkaido University) ;
  • Hasegawa, Y. (Faculty of Engineering, Hokkaido University) ;
  • Ueda, M. (Faculty of Engineering, Hokkaido University) ;
  • Ohtsuka, T. (Faculty of Engineering, Hokkaido University)
  • Received : 2016.09.22
  • Accepted : 2016.12.02
  • Published : 2016.12.31

Abstract

The ellipso-microscopic observation of a titanium surface undergoing anodization in $0.05mol\;dm^{-3}$ of $H_2SO_4$ was conducted. During irradiation by ultra-violet (UV) light with a wavelength of 325 nm, the titanium surface allowed for the flow of a photo-induced current and showed up as a bright, patch-like image on an ellipso-microscopic view. The brightness and patch-pattern in the image changed with flowing photo-induced current. The changes in the brightness and the image corresponded to the formation and/or degradation of titanium oxide due to the photo-electrochemical reaction of the oxide. An in situ monitoring using the ellipso-microscope revealed that the film change was dependent on the irradiation light power, by UV-light increases the anodic current and results in the initiation of pitting at lower potentials as compared with the non-irradiated condition.

Keywords

References

  1. J. W. Schultze, U. Stimming and J. Weise, Ber. Bunsen. Phys. Chem., 86, 276 (1982). https://doi.org/10.1002/bbpc.19820860404
  2. T. Ohtsuka and T. Otsuki, J. Electroanal. Chem., 473, 272 (1999). https://doi.org/10.1016/S0022-0728(99)00238-7
  3. K. Fushimi, K. Kurauchi, Y. Yamamoto, T. Nakanishi, Y. Hasegawa, and T. OhtsukaT, Electrochim. Acta, 144, 56 (2014). https://doi.org/10.1016/j.electacta.2014.08.082
  4. T. Ohtsuka, M. Masuda, and N. Sato, J. Electrochem. Soc., 132, 787 (1985). https://doi.org/10.1149/1.2113958
  5. T. Ohtsuka, J. Guo, and N. Sato, J. Electrochem. Soc., 133, 2473 (1986). https://doi.org/10.1149/1.2108452
  6. S. Kudelka, A. Michaelis, and J. W. Schultze, Electrochim. Acta, 41, 863 (1996). https://doi.org/10.1016/0013-4686(95)00375-4
  7. S. Kudelka and J. W. Schultze, Electrochim. Acta, 42, 2817 (1997). https://doi.org/10.1016/S0013-4686(97)00085-6
  8. K. Fushimi, T. Okawa, K. Azumi, and M. Seo, J. Electrochem. Soc., 147, 524 (2000). https://doi.org/10.1149/1.1393227