• KSII Transactions on Internet and Information Systems (TIIS)
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• v.13 no.5
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• pp.2529-2543
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• 2019

Scanning electron microscopy (SEM) image can link with the microscopic world through reflecting interaction between electrons and materials. The SEM images are easily subject to blurring distortions during the imaging process. Inspired by the fact that dark channel prior captures the changes to blurred SEM images caused by the blur process, we propose a method to evaluate the SEM images sharpness based on the dark channel prior. A SEM image database is first established with mean opinion score collected as ground truth. For the quality assessment of the SEM image, the dark channel map is generated. Since blurring is typically characterized by the spread of edge, edge of dark channel map is extracted. Then noise is removed by an edge-preserving filter. Finally, the maximum gradient and the average gradient of image are combined to generate the final sharpness score. The experimental results on the SEM blurred image database show that the proposed algorithm outperforms both the existing state-of-the-art image sharpness metrics and the general-purpose no-reference quality metrics.

• Journal of the Semiconductor & Display Technology
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• v.7 no.1
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• pp.11-16
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• 2008

Confocal scanning microscopy is a widely used technique for three dimensional measurements because it is characterized by high resolution, high SNR and depth discrimination. Generally an image is generated by moving one optical probe that satisfies the confocal condition on the specimen. Measurement speed is limited by movement speed of the optical probe; scanning speed. To improve measurement speed we increase the number of optical probes. Specimen region to scan is divided by optical probes. Multi-point information each optical probe points to can be obtained simultaneously. Therefore image acquisition speed is increased in proportion to the number of optical probes. And multiple optical probes from red, green and blue laser sources can be used for color imaging and image quality, i.e., contrast, is improved by adding color information by this way. To conclude, this technique contributes to the improvement of measurement speed and image quality.

• Proceedings of the Optical Society of Korea Conference
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• 2006.07a
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• pp.39-40
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• 2006

Digital image-projection and several modifications are the classical applications of Digital Micromirror Devices (DMD), however further applications in the field of optical metrology are also available. Operated with certain patterns, a DMD can function, for instance, as an array of pinholes that may substitute the Galvanic mirror or the stage scanning system presently used for 2 dimensional scanning in confocal microscopes. The various process parameters that influence the result of measurement (e.g. pinhole size, lateral scanning pitch and the number of pinholes used simultaneously, etc.) should be configured precisely for individual measurements by appropriately operating the DMD. This paper presents suitable conditions for the diffraction limited analysis between DMD-optics-CCD to achieve the best performance. Also sampling theorem that is necessary for the image acquisition by scanning system is simulated with OPTISCAN which is the simulator based on the diffraction theory.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2022.10a
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• pp.553-555
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• 2022

This paper is about a real-time automatic face recognition system based on one-shot panoramic scanning. It detects multiple faces in real time through a single panoramic scanning process and recognizes pre-registered faces. Instead of recognizing multiple faces within a single panoramic image, multiple faces are recognized using multiple images obtained in the scanning process. This reduces the panorama image creation time and stitching error, and at the same time can improve the face recognition performance by using the accumulated information of multiple images. It is expected that it can be used in various applications such as a multi-person smart attendance system with only a simple image acquisition device.

• Journal of the Korean Society for Precision Engineering
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• v.25 no.4
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• pp.53-60
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• 2008

Electron detectors used in scanning electron microscope accept electrons emitted from the specimen and convert them to an electrical signal that, after amplification, is used to modulate the gray-level intensities on a cathode ray tube, producing an image of the specimen. Electron detector is one of the key components dominating the performance of scanning electron microscope so that the development of electron detectors having high performance is indispensable to acquire high quality images using scanning electron microscope. In this paper, we designed and manufactured an electron detector and conducted a couple of image capture experiments using it. In particular, scintillator which generates light photons when it is struck by high-energy electrons was manufactured and experimental studies on the optimization of manufacturing condition was carried out. From experiments to evaluate the performance of our detector, it was verified that the performance of our detector is equivalent to or better than that of the conventional one.

• Journal of radiological science and technology
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• v.20 no.1
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• pp.15-20
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• 1997

Unlike conventional CT scan, the helical CT scan uses continuous rotating CT equipment with a slip ring to move the patient's coach at a constant speed while continuously scanning. Slice sensitivity profiles in the Z-position(SSPz) using the conventional X-ray CT have a shape similiar to a rectangular wave, which slightly spreads out into plains below the mountain. However, in the helical CT, with an expansion of the base, the rectangular shape collapses and a mouatain-like shape can be seen. We need to investigate the fellowing factors in helical CT scanning;the ability to scan along the axis of the body, effective slice width, slice shape and the precision of coach velocity, Helical scanning with sprial X-ray track is different from the conventional scanning in terms of the principle of image reconstruction performed. We believe that the problems in helical scanning can be solved by understanding new the special parameters such as the bed moving speed and the interval of image reconstruction.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.31B no.7
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• pp.9-15
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• 1994

This paper proposes a image compression algorithm which stores and transmites image data efficiently. The proposed compression algorithm modify enhances compression rate by modified ZIG-ZAG Scanning in JPEG standard algorithm which is based on 2D-DCT. And the up-compatible method of proposed algorithm can solve compatible problem with JPEG that is cased by modified ZIG-ZAG Scanning. And this paper presentes a block diagram of hardware for real-time processing.

• Applied Microscopy
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• v.2 no.1
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• pp.39-46
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• 1972

There are many kinds of microscopes suitable for general studies; optical microscopes(OM), conventional transmission electron microscopes (TEM), and scanning electron microscopes(SEM). The optical microscopes and the conventional transmission electron microscopes are very familiar. The images of these microscopes are directly formed on an image plane with one or more image forming lenses. On the other hand, the image of the scanning electron microscope is formed on a fluorescent screen of a cathode ray tube using a scanning system similar to television technique. In this paper, the features and some applications of the scanning electron microscope will be discussed briefly. The recently available scanning electron microscope, combining a resolution of about $200{\AA}$ with great depth of field, is favorable when compared to the replica technique. It avoids the problem of specimen damage and the introduction of artifacts. In addition, it permits the examination of many samples that can not be replicated, and provides a broader range of information. The scanning electron microscope has found application in diverse fields of study including biology, chemistry, materials science, semiconductor technology, and many others. In scanning electron microscopy, the secondary electron method. the backscattererd electron method, and the electromotive force method are most widely used, and the transmitted electron method will become more useful. Change-over of magnification can be easily done by controlling the scanning width of the electron probe. It is possible. to continuously vary the magnification over the range from 100 times to 1.00,000 times without readjustment of focusing. Conclusion: With the development of a scanning. electron microscope, it is now possible to observe almost all-information produced through interactions between substances and electrons in the form of image. When the probe is properly focused on the specimen, changing magnification of specimen orientation does not require any change in focus. This is quite different from the conventional transmission electron microscope. It is worthwhile to note that the typical probe currents of $10^{-10}$ to $10^{-12}\;{\AA}$ are for below the $10^{-5}$ to $10^{-7}\;{\AA}$ of a conventional. transmission microscope. This reduces specimen contamination and specimen damage due to heatings. Outstanding features of the scanning electron microscope include the 'stereoscopic observation of a bulky or fiber specimen in high resolution' and 'observation of potential distribution and electromotive force in semiconductor devices'.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.10 no.8
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• pp.1869-1876
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• 2009

Scanner which is a kind of optical devices is used to convert paper documents into document image files. The assessment of scanned document image is performed to check if there are any modification on document image files in scanning process. In assessment of scanned documents, user checks the degree of skew, noise, folded state and etc This paper proposed to how to measure geometrical modifications of document image in scanning process. In this study, we check the degree of modification in document image file by image processing and we compare the evaluation value which means the degree of modification in each items with OCR success ratio in a document image file. To analyse the correlation between OCR success ratio and the evaluation value which means the degree of modification in each items, we apply Pearson Correlation Coefficient and calculate weight value for each items to score total evaluation value of image modification degrees on a image file. The document image which has high rating score by proposed method also has high OCR success ratio.

• Proceedings of the KSME Conference
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• 2008.11a
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• pp.768-772
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• 2008

Various scanning systems have been studied in many industrial areas to acquire a range data or to reconstruct an explicit 3D model. Currently optical technology has been used widely by virtue of noncontactness and high-accuracy. In this paper, we describe a 3D laser scanning system developped to reconstruct the 3D surface of a large-scale object such as a curved-plate of ship-hull. Our scanning system comprises of 4ch-parallel laser vision modules using a triangulation technique. For multi laser vision, calibration method based on least square technique is applied. In global scanning, an effective method without solving difficulty of matching problem among the scanning results of each camera is presented. Also minimal image processing algorithm and robot-based calibration technique are applied. A prototype had been implemented for testing.