No-reference Sharpness Index for Scanning Electron Microscopy Images Based on Dark Channel Prior |
Li, Qiaoyue
(School of Information and Control Engineering, China University of Mining and Technology)
Li, Leida (School of Information and Control Engineering, China University of Mining and Technology) Lu, Zhaolin (School of Information and Control Engineering, China University of Mining and Technology) Zhou, Yu (School of Information and Control Engineering, China University of Mining and Technology) Zhu, Hancheng (School of Information and Control Engineering, China University of Mining and Technology) |
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