• 제목/요약/키워드: ITO (Indium Tin Oxide)

검색결과 835건 처리시간 0.031초

RF/DC 동시인가 마그네트론 스퍼터링 방법으로 증착된 ITO 박막의 열처리 특성 연구 (A Study on the Annealed Properties of ITO Thin Film Deposited by RF-superimposed DC Reactive Magnetron Sputtering)

  • 문진욱;김동원
    • 한국표면공학회지
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    • 제40권3호
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    • pp.117-124
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    • 2007
  • The ITO films were deposited on glass substrates by RF-superimposed dc reactive magnetron sputtering and were annealed in $N_2$ vacuum furnace with temperatures in the range of $403K{\sim}573K$ for 30 minutes. Electrical, optical and structural properties of ITO films were examined with varying annealing temperatures from 403 K to 573 K. The resistivity of as-deposited ITO films was $5.4{\times}10^{-4}{\Omega}cm$ at the sputter conditions of applied RF/DC power of 200/200 W, $O_{2}$ flow of 0.2 seem and Ar flow of 0.2 seem. As a result of annealing in the temperature range of $403K{\sim}573K$, the crystallization occurred at 423 K that is lower than the crystallization temperature caused by a conventional sputtering method. And the resistivity decreased from $5.4{\times}10^{-4}{\Omega}cm\;to\;2.3{\times}10^{-4}{\Omega}cm$, the carrier concentration and mobility of ITO films increased from $4.9{\times}10^{20}/cm^3\;to\;6.4{\times}10^{20}/cm^3$, from $20.4cm^2/Vsec\;to\;41.0cm^2/Vsec$, respectively. The transmittance of ITO films in visible became higher than 90% when annealed in the temperature range of $423K{\sim}573K$. High quality ITO thin films made by RF-superimposed dc reactive magnetron sputtering and annealing in $N_2$ vacuum furnace will be applied to transparent conductive oxides of the advanced flat panel display.

나노입자 코팅 탄소섬유 강화 복합재료의 전기전도도 향상 (Improvement of Electrical Conductivity of Carbon-Fiber Reinforced Plastics by Nano-particles Coating)

  • 서성욱;하만석;권오양;최흥섭
    • Composites Research
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    • 제23권6호
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    • pp.1-6
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    • 2010
  • 복합재 항공기 동체의 낙뢰손상방지를 목적으로 탄소섬듐-주석 산화물(ITO) 나노입자를 코팅함으로써 탄소섬유강화플라스틱(CFRP) 복합재료의 전기전도도를 향상하였다. 탄소섬유에 코팅된 ITO 나노입자는 10~40%의 농도로 콜로이드 상태에서 분사되었다. CFRP의 전기전도도는 코팅 후 3배 이상 증가하였으며 현재 B-787 복합재 항공기 동체에 사용 중인 기술인 금속메쉬를 CFRP 외층에 매몰한 경우보다도 높은 전기전도도를 얻을 수 있었으며, 나노입자 코팅으로 섬유-기지 계면에 미지는 악영향은 발견되지 않았다. 모의 낙뢰에 의한 손상영역은 각각 다른 처리를 한 재료와 조건에 따라 초음파 C-scan 이미지로 확인하였다. ITO 40% 코팅 시편의 경우 전기전도도는 B-787 샘플의 경우보다 높았지만 낙뢰에 의한 손상영역의 크기는 거의 비슷한 수준이었다.

ITO/p-InP 태양전지 제작 (The fabrication of ITO/p-InP solar cells)

  • 맹경호;김선태;송복신;문동찬
    • E2M - 전기 전자와 첨단 소재
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    • 제7권3호
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    • pp.243-251
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    • 1994
  • ITO(Indium Tin Oxide) film with thickness of 1500.angs. was prepared by an e-beam evaporator onto a glass and a p-type InP wafer (100) LEC grown Zn-doped p=2.3*10$\^$16/cm$\^$-3/), in which the components of ITO used for evaporation source were hot pressed pellets 1 mole% ln$\_$2/O$\_$3/+9 mole% SnO$\_$2/, and evaporated in O$\_$2/ ambient. The optimum conditions to preparation of ITO thin film were the substrate temperature of 350.deg. C, the injected oxygen pressure of 2*10$\^$-4/ torr, and the evaporation speed of 0.2-0.3.angs./sec, respectively. In these optimum conditions, the resistivity and the carrier concentration were 5.3*10$\^$-3/ .ohm.-cm, 6.5*10$\^$20/cm$\^$-3/, and the transmittance was over 80%. From the results of J-V measurements in ITO/p-InP structure solar cells, the higher pressure of injected oxygen, the more open circuit voltage. The efficiency of ITO/p-InP solar cell without the grid line contact, prepared by the optimum evaporation conditions, was 7.19%. By using the grid line contact, the efficiency, the open circuit voltage, the short circuit current density, the fill factor, the series resistance, and the shunt resistance were 8.5%, 0.47V, 29.48 mAcm$\^$-2/ , 61.35%, 3.ohm., and 26.6k.ohm., respectively.

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기판온도에 따른 ITO박막의 CMP특성 (CMP Properties of ITO with the deposition temperature)

  • 최권우;이영균;이우선;전영길;고필주;서용진
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2007년도 추계학술대회 논문집
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    • pp.165-165
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    • 2007
  • 투명전도박막은 ITO, $SnO_2$, ZnO, 등이 있으나 $SnO_2$는 자외선 영역까지 투과시키는 우수한 광학적 특성을 나타내지만, 상당히 큰 전기저항으로 인해 현재는 현재 ITO가 널리 이용되고 있다. ITO(Indium Tin Oxide)박막은 자외선 영역에서 반사율이 높으며 가시광선영역에서는 80%이상의 뛰어난 투과율을 가지고 있다. 또한 낮은 전기저항과 넓은 광학적 밴드갭 때문에 가장 유용한 투과전도성 재료 중에 하나이다. 이러한 특성 때문에 여러 가지 문자 표시소자의 투명전극, 태양전지의 창재료, 정전차폐를 위한 반도체 포장재료, 열반사막, 면발열체, 광전변환 소자에 응용되고 있다. 일반적으로 박막의 제작에는 저항가열법과 전자선가열법, 스퍼터링법의 물리적 증착과 화학적 증착으로 나뉜다. 본 논문에서는 증착온도를 달리 하여 RF-sputtering에 의해 ITO박막을 증착한 후 온도증가에 따른 박막의 특성을 연구하였으며 또한 광역평탄화를 위한 CMP공정을 적용하여 증착온도가 연마에 미치는 영향을 연구하였다. 본 실험에서 사용된 ITO박막은 $2{\times}2Cm$의 Corning glass위에 증착되었으며 타겟은 $In_2O_3$$SnO_2$가 9:1로 혼합된 Purity 99.99%이상의 직경 2 inch인 ITO타겟을 사용하였다. 박막 증착시 기판온도는 상온에M $200^{\circ}C$까지 변화시켰으며 RF power는 100W로 일정하게 하였으며 증착압력은 $8{\times}10^{-2}$Torr이였다. CMP공정조건은 헤드속도 60rpm, 플레이튼 속도 60rpm, 슬러리 주입 유량 60mml/min, 압력 $300g/cm^2$이였다. 전기적 특성은 four point probe를 이용하여 측정하였으며 광학적 특성은 UV-Visible Spectrometer를 이용하여 200~900nm의 파장범위에서 광투과도를 측정하였다.

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ALD 공정을 이용한 플렉시블 유기태양전지용 투명전극 형성 (Fabrication of a Transparent Electrode for a Flexible Organic Solar Cell in Atomic Layer Deposition)

  • 송근수;김형태;유경훈
    • 한국신재생에너지학회:학술대회논문집
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    • 한국신재생에너지학회 2011년도 춘계학술대회 초록집
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    • pp.121.2-121.2
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    • 2011
  • Aluminum-doped Zinc Oxide (AZO) is considered as an excellent candidate to replace Indium Tin Oxide (ITO), which is widely used as transparent conductive oxide (TCO) for electronic devices such as liquid crystal displays (LCDs), organic light emitting diodes (OLEDs) and organic solar cells (OSCs). In the present study, AZO thin film was applied to the transparent electrode of a channel-shaped flexible organic solar cell using a low-temperature selective-area atomic layer deposition (ALD) process. AZO thin films were deposited on Poly-Ethylene-Naphthalate (PEN) substrates with Di-Ethyl-Zinc (DEZ) and Tri-Methyl-Aluminum (TMA) as precursors and $H_2O$ as an oxidant for the atomic layer deposition at the deposition temperature of $130^{\circ}C$. The pulse time of TMA, DEZ and $H_2O$, and purge time were 0.1 second and 20 second, respectively. The electrical and optical properties of the AZO films were characterized as a function of film thickness. The 300 nm-thick AZO film grown on a PEN substrate exhibited sheet resistance of $87{\Omega}$/square and optical transmittance of 84.3% at a wavelength between 400 and 800 nm.

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UV Responsive Characteristics of n-Channel Schottky Barrier MOSFET with ITO as Source/Drain Contacts

  • Kim, Tae-Hyeon;Lee, Chang-Ju;Kim, Dong-Seok;Sung, Sang-Yun;Heo, Young-Woo;Lee, Jung-Hee;Hahm, Sung-Ho
    • 센서학회지
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    • 제20권3호
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    • pp.156-161
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    • 2011
  • We fabricated a schottky barrier metal oxide semiconductor field effect transistor(SB-MOSFET) by applying indium-tin-oxide(ITO) to the source/drain on a highly resistive GaN layer grown on a silicon substrate. The MOSFET, with 10 ${\mu}M$ gate length and 100 ${\mu}M$ gate width, exhibits a threshold gate voltage of 2.7 V, and has a sub-threshold slope of 240 mV/dec taken from the $I_{DS}-V_{GS}$ characteristics at a low drain voltage of 0.05 V. The maximum drain current is 18 mA/mm and the maximum transconductance is 6 mS/mm at $V_{DS}$=3 V. We observed that the spectral photo-response characterization exhibits that the cutoff wavelength was 365 nm, and the UV/visible rejection ratio was about 130 at $V_{DS}$ = 5 V. The MOSFET-type UV detector using ITO, has a high UV photo-responsivity and so is highly applicable to the UV image sensors.

Doping Controlled Emitter with a Transparent Conductor for Crystalline Si Solar Cells

  • 김민건;김현엽;최우진;이준신;김준동
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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    • pp.590-590
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    • 2012
  • A transparent conducting oxide (TCO) layer was applied in crystalline Si (c-Si) solar cells without use of the conventional SiNx-coating. A high quality indium-tin-oxide (ITO) layer was directly deposited on an emitter layer of a Si wafer. Three different types of emitters were formed by controlling the phosphorous diffusion condition. A light-doped emitter forming a thinner emitter junction showed an improved photoconversion efficiency of 14.1% comparing to 13.2% of a heavy-doped emitter. This was induced by lower recombination within a narrower depletion region of the light-doped emitter. In the aspect of light management, the intermediate refractive index of ITO is effective to reduce the light reflection leading the enhanced carrier generation in a Si absorber. For the electrical aspect, the ITO layer serves as an efficient electrical conductor and thus relieves the burden of high contact resistance of the light-doped emitter. Additionally, the ITO works as a buffer layer of Ag and Si and certainly prevents the shunting problem of Ag penetration into Si emitter region. It discusses an efficient design scheme of TCO-embedded emitter Si solar cells.

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ITO 박막의 post-annealing을 통한 UV-LED의 전기적 특성과 광 추출 효율 향상

  • 강은규;권은희;이용탁
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2012년도 제43회 하계 정기 학술대회 초록집
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    • pp.351-352
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    • 2012
  • UV LED에서 p-GaN층의 높은 일함수와 자체 면저항이 크기 때문에 current spreading layer인 ITO (indium tin oxide) 투명전극이 사용되고 있다. 따라서 높은 UV 파장대 투과율과 낮은 면 저항이 매우 중요하다. 본 연구에서, RF magnetron sputter를 사용하여 ITO 투명전극을 glass(boro33)에 120 nm 두께로 증착하였다. 그 후 RTA (rapid thermal annealing)을 이용해 120초 동안 $600^{\circ}C$에서 Air, $N_2$ (15 sccm), vacuum 환경에서 열처리를 하여 UV-Vis-NIR spectrophotometer를 사용해 ITO 박막의 투과율을 측정하고, Hall measurement system을 이용하여 전기적 특성을 측정하였다. Fig. 1과 같이 열처리 환경에 따라 ITO 박막의 투과율이 변하고 또한 Table 1과 같이 전기적 특성도 변함을 알 수 있었다. Air 환경에서의 열처리는 reference 샘플과 비교 했을 때 400 nm 이하의 파장에서 투과율이 증가하였지만 400 nm 이상의 파장에서는 투과율이 낮아짐을 볼 수 있고, 면 저항 (Ohm/sq)은 오히려 reference (as deposited) 샘플과 비교하여 24 Ohm/sq 증가하는 것을 알 수 있었다. 반면에 $N_2$, vacuum 환경에서 열처리는 reference (as deposited) 샘플 보다 380 nm 파장대에서 16% 정도 높은 투과율을 보였고, 면저항 역시 2배 이상 낮아졌다. 둘 다 비슷한 투과율과 면저항을 나타내었지만 vacuum 환경이 좀 더 우수한 광학적 특성을 나타내었고 반면에 $N_2$ 환경은 좀 더 낮은 면저항을 나타내었다. ITO 박막을 증착한 후 vacuum 환경에서 열처리를 통하여 제작된 UV-LED (중심 파장 380 nm)가 Fig. 2와 같이 입력 전류 450 mA에서 광출력이 46% 정도 향상 되었고 안정된 I-V 특성 보였다.

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Organic photovoltaic cells using low sheet resistance of ITO for large-area applications

  • 김도근;강재욱;김종국
    • 한국재료학회:학술대회논문집
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    • 한국재료학회 2009년도 추계학술발표대회
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    • pp.5.1-5.1
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    • 2009
  • Organic photovoltaic (OPV)cells have attracted considerable attention due to their potential for flexible, lightweight, and low-cost application of solar energy conversion. Since a 1% power conversion efficiency (PCE) OPV based on a single donor-acceptor heterojunction was reported by Tang, the PCE has steadily improved around 5%. It is well known that a high parallel (shunt)resistance and a low series resistance are required simultaneously to achieve ideal photovoltaic devices. The device should be free of leakage current through the device to maximize the parallel resistance. The series resistance is attributed to the ohmic loss in the whole device, which includes the bulk resistance and the contact resistance. The bulk resistance originated from the bulk resistance of the organic layer and the electrodes; the contact resistance comes from the interface between the electrodes and the active layer. Furthermore, it has been reported that the bulk resistance of the indium tin oxide (ITO) of the devices dominates the series resistance of OPVs for a large area more than $0.01\;cm^2$. Therefore, in practical application, the large area of ITO may significantly reduce the device performance. In this work, we investigated the effect of sheet resistance ($R_{sh}$) of deposited ITO on the performance of OPVs. It was found that the device performance of polythiophene-fullerene (P3HT:PCBM) bulk heterojunction OPVs was critically dependent on Rsh of the ITO electrode. With decreasing $R_{sh}$ of the ITO from 39 to $8.5\;{\Omega}/{\square}$, the fill factor (FF) of OPVs was dramatically improved from 0.407 to 0.580, resulting in improvement of PCE from $1.63{\pm}0.2$ to $2.5{\pm}0.1%$ underan AM1.5 simulated solar intensity of $100\;mW/cm^2$.

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펨토초 레이저 응용 선택적 어블레이션 연구 (Selective Removal of Thin Film on Glass Using Femtosecond Laser)

  • 유재용;조성학;박정규;윤지욱;황경현;고지 수지오카;홍종욱;허원하;다니얼 뵈머;박준형;세바스찬 잰더
    • 한국레이저가공학회지
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    • 제14권2호
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    • pp.17-23
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    • 2011
  • Active thin films are ubiquitous in the manufacture of all forms of flat panel display (FPD). One of the most widely employed thin films is indium tin oxide (ITO) and metal films used electrically conductive materials in display industries. ITO is widely used for fabrication of LCD, OLED device, and many kinds of optical applications because of transparency in visible range and its high conductivity and metal films are also widely employed as electrodes in various electric and display industries. It is important that removing specific area of layer, such as ITO or metal film on substrate, to fabricate and repair electrode in display industries. In this work, we demonstrate efficient selective ablation process to ITO and aluminum film on glass using a femtosecond laser (${\lambda}p=1025nm$) respectively. The femtosecond laser with wavelength of 1025nm, pulse duration of 400fs, and the repetition rate of 100kHz was used for selectively removing ITO and Al on glass in the air. We can successfully remove the ITO and Al films with various pulse energies using a femtosecond laser.

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