• 제목/요약/키워드: Half Value Layer

검색결과 140건 처리시간 0.032초

구내 표준 방사선사진을 이용한 구내방사선촬영기의 선질 평가 (Evaluation of the Beam Quality of Intraoral X-ray Equipments Using Intraoral Standard Films)

  • 이상섭;권혁락;심우현;오승현;이지연;전국진;김기덕;박창서
    • Imaging Science in Dentistry
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    • 제30권3호
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    • pp.183-188
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    • 2000
  • Purpose: This study was to evaluate the beam quality of intraoral X-ray equipments used at Yonsei University Dental Hospital (YUDH) using the half value layer (HVL) and the characteristic curve of intraoral standard X-ray film. Materials and Methods : The study was done using the intraoral X -ray equipments used at each clinical department at YUDH. Aluminum filter was used to determine the HVL. Intraoral standard film was used to get the characteristic curve of each intraoral X-ray equipment. Results: Most of the HVLs of intraoral X-ray equipments were higher than the least recommended thickness, but the REX 601 model used at the operative dentistry department and the X-707 model used at the pediatric dentistry department had HVLs lower than the recommended thickness. The slopes of the characteristic curves of films taken using the PANP AS 601 model and REX 601 model at operative dentistry department, the X-70S model of prosthodontic dentistry department, and the REX 601 model at the student clinic were relatively low. Conclusion: HVL and the characteristic curve of X-ray film can be used to evaluate the beam quality of intraoral X-ray equipment. In order to get the best X-ray films with the least radiation exposure to patients and best diagnostic information in clinical dentistry, X -ray equipment should be managed in the planned and organized fashion.

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6 MV X-선 빔의 등가에너지 결정 (Determination of the Equivalent Energy of a 6 MV X-ray Beam)

  • 김종언;박병도
    • 한국방사선학회논문지
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    • 제10권8호
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    • pp.591-596
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    • 2016
  • 본 연구의 목적은 실험으로 6 MV X-선 빔의 등가에너지를 결정하는 데 있다. 6 MV X-선 빔에 대한 납의 반가층은 전리함을 사용하여 측정하였다. 선감쇠계수는 측정된 반가층을 사용하여 계산하였다. 그리고 질량감쇠계수는 납의 밀도로 선감쇠계수를 나누어 얻었다. 얻어진 질량감쇠계수의 등가에너지는 미국표준기술연구소에서 주어진 납의 광자에너지 대 질량감쇠계수 자료를 사용하여 결정하였다. 그 결과로서, 6 MV X-선 빔에 대한 등가에너지는 1.61 MeV로 결정되었다. 이 등가에너지는 Reft가 보고한 것 보다 약 30% 낮게 결정되었다. 그 원인은 납 감쇠기 사이의 공기공동의 존재에 기인한 것으로 추정된다.

A pilot study of half-value layer measurements using a semiconductor dosimeter for intraoral radiography

  • Shun Nouchi;Hidenori Yoshida;Yusaku Miki;Yasuhito Tezuka;Ruri Ogawa;Ichiro Ogura
    • Imaging Science in Dentistry
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    • 제53권3호
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    • pp.217-220
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    • 2023
  • Purpose: This pilot study was conducted to evaluate half-value layer (HVL) measurements obtained using a semiconductor dosimeter for intraoral radiography. Materials and Methods: This study included 8 aluminum plates, 4 of which were low-purity (less than 99.9%) and 4 high-purity (greater than 99.9%). Intraoral radiography was performed using an intraoral X-ray unit in accordance with the dental protocol at the authors' affiliated hospital: tube voltage, 60 kVp and 70 kVp; tube current, 7 mA; and exposure time, 0.10 s. The accuracy of HVL measurements for intraoral radiography was assessed using a semiconductor dosimeter. A simple regression analysis was performed to compare the aluminum plate thickness and HVL in relation to the tube voltage (60 kVp and 70 kVp) and aluminum purity (low and high). Results: For the low-purity aluminum plates, the HVL at 60 kVp (Y) and 70 kVp (Y) was significantly correlated with the thickness of the aluminum plate (X), with Y=1.708+0.415X (r=0.999, P<0.05) and Y=1.980+0.484X (r=0.999, P<0.05), respectively. Similarly, for the high-purity aluminum plates, the HVL at 60 kVp (Y) and 70 kVp (Y) was significantly correlated with the plate thickness(X), with Y=1.696+0.454X (r=0.999, P<0.05) and Y=1.968+0.515X (r=0.998, P<0.05), respectively. Conclusion: This pilot study examined the relationship between aluminum plate thickness and HVL measurements using a semiconductor dosimeter for intraoral radiography. Semiconductor dosimeters may prove useful in HVL measurement for purposes such as quality assurance in dental X-ray imaging.

THE EFFECT OF GOLD ELECTROFORMING PROCEDURE ON GOLD-SILVER-PALLADIUM ALLOY

  • Hwang, Bo-Yeon;Kim, Chang-Whe;Lim, Young-Jun;Kim, Myung-Joo
    • 대한치과보철학회지
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    • 제45권3호
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    • pp.303-309
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    • 2007
  • Statement of problem. The effect of gold electroforming on gold alloy was not studied. Purpose. This in vitro study investigate the effect of gold electroforming on gold-silver-palladium alloy. Material and methods. Three pieces of gold strips had undergone the electroforming procedures on one side and then half of the side again electroformed. The set mode for this study was program 1 ($200{\mu}m$). And the processing time was 15min (1/20 time to form $200{\mu}m$ coping). The confocal laser scanning microscope (PASCAL 5, Carl Zeiss, Bernried, Germany) was used to measure the thickness of the pure gold layer electroformed on the gold strips. Half of the gold strip was coated two times with electroformed gold, and the other half one time. The data from the cone focal laser system was processed to get the vertical profile of the strips and the difference of the vertical height between the double coated and single coated layer was regarded as the thickness of the gold coating. The layer thickness value to built 3D image of the cone-focal laser was set $0.5{\mu}m$. Next to the measurement of the thickness of the coating, the Vicker's hardness test was done. It was performed on the double coated surface, single coated surface and non-coated surface (back side) three times each. Results. The mean thickness value gained from gold electroforming technique was measured to be $22{\mu}m$ for sample 1, $23{\mu}m$ for sample 2, $21{\mu}m$ for sample 3. In the same condition of time, power and the amount of electrolyte, the data showed no difference between samples. According to the results of variance analysis, the differences among the variations in number of coating were statistically insignificant (p>0.05), meaning that the two times of gold electroforming coating did not change the hardness of gold-silver-palladium alloy. Conclusion. The test of thickness of gold coating proved the coherency of the gold electroforming procedure, in other words, when the power, the exposed surface area, processing time and the amount of electrolytes were set same, the same thickness of gold would be coated on. The hardness test showed that the electroformed gold coating did not change the hardness of the gold-silver-palladium alloy when it is coated not more than $45{\mu}m$.

초격자 Buffer를 사용한 InGaN/GaN 양자우물에서 Piezoelectric 효과의 측정과 Strain 감소에 대한 연구 (Measurement of Piezoelectric Effect and Reduction of Strain in InGaN/GaN Quantum Well with Superlattice Buffer)

  • 공경식;안주인;이석주
    • 한국전기전자재료학회논문지
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    • 제21권6호
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    • pp.503-508
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    • 2008
  • In order to reduce the piezoelectric field originated from the well layer which resides in InGaN/GaN light emitting diode, InGaN/GaN superlattice buffer layers were grown at the bottom and the top of the active layer. Measuring the photoluminescence spectra with different reverse bias voltages clearly revealed the condition of the flat band under which the transition energy is maximized and the linewidth is minimized. Accordingly, the piezoelectric field of $In_{0.15}Ga_{0.85}N$ in our sample was estimated as -1.08 MV/cm. It is less than half the value reported in the previous studies, and it is evidenced that the strain has reduced due to the superlattice buffer layers.

에치홀의 위치와 희생층의 잔류물이 전송선 필터 응답에 미치는 영향 (Effect of Etch Hole Position and Sacrificial Layer Residue on a Novel Half-Coaxial Transmission Line Filter)

  • 김용성;백창욱;김용권
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2007년도 제38회 하계학술대회
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    • pp.284-285
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    • 2007
  • In this paper, we present the effect on a novel transmission line filter response by the etch hole position on the suspended ground and the residue on the resonator under ground plane. We defined the etch hole offset as the distance from the sidewall of the suspended ground to the nearest side of the etch holes. We simulated new filter responses to reflect the real value of the changed etch hole offset caused by characteristics of negative photoresist. Return loss is distorted by the residue on the center conductor remained after sacrificial layer removing. By comparison of simulation and measurements, we concluded the residue on the resonator distorted the RF response worse than etch hole offset variation did.

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Development of high-performance heavy density concrete using different aggregates for gamma-ray shielding

  • Ouda, Ahmed S.
    • Advances in materials Research
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    • 제3권2호
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    • pp.61-75
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    • 2014
  • This study aimed to investigate the suitability of some concrete components for producing "high-performance heavy density concrete" using different types of aggregates that could enhances the shielding efficiency against ${\gamma}$-rays. 15 mixes were prepared using barite, magnetite, goethite and serpentine aggregates along with 10% silica fume, 20% fly ash and 30% blast furnace slag to total OPC content for each mix. The mixes were subjected to compressive strength at 7, 28 and 90 days. In some mixes, compressive strengths were also tested up to 90 days upon replacing sand with the fine portions of magnetite, barite and goethite. The mixes containing magnetite along with 10% SF reaches the highest compressive strength exceeding over M60 requirement by 14% after 28 days. Whereas, the compressive strength of concrete containing barite was very close to M60 and exceeds upon continuing for 90 days. Also, the compressive strength of high-performance concrete incorporating magnetite fine aggregate was significantly higher than that containing sand by 23%. On the other hand, concrete made with magnetite fine aggregate had higher physico-mechanical properties than that containing barite and goethite. High-performance concrete incorporating magnetite fine aggregate enhances the shielding efficiency against ${\gamma}$-rays.

A Study of Shielding Properties of X-ray and Gamma in Barium Compounds

  • Seenappa, L.;Manjunatha, H.C.;Chandrika, B.M.;Chikka, Hanumantharayappa
    • Journal of Radiation Protection and Research
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    • 제42권1호
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    • pp.26-32
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    • 2017
  • Background: Ionizing radiation is known to be harmful to human health. The shielding of ionizing radiation depends on the attenuation which can be achieved by three main rules, i.e. time, distance and absorbing material. Materials and Methods: The mass attenuation coefficient, linear attenuation coefficient, Half Value Layer (HVL) and Tenth Value Layer (TVL) of X-rays (32 keV, 74 keV) and gamma rays (662 keV) are measured in Barium compounds. Results and Discussion: The measured values agree well with the theory. The effective atomic numbers ($Z_{eff}$) and electron density (Ne) of Barium compounds have been computed in the wide energy region 1 keV to 100 GeV using an accurate database of photon-interaction cross sections and the WinXCom program. Conclusion: The mass attenuation coefficient and linear attenuation coefficient for $BaCO_3$ is higher than the $BaCl_2$, $Ba(No_3)_2$ and BaSO4. HVL, TVL and mean free path are lower for $BaCO_3$ than the $BaCl_2$, $Ba(No_3)_2$ and $BaSO_4$. Among the studied barium compounds, $BaCO_3$ is best material for x-ray and gamma shielding.

(CrAs)3(MnAs)3(110) 초격자의 전자구조와 자성에 대한 제일원리 연구 (First-principles Study on the Magnetism and Electronic Structure of (CrAs)3(MnAs)3(110) Superlattice)

  • 이재일;홍순철
    • 한국자기학회지
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    • 제16권2호
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    • pp.111-114
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    • 2006
  • Zinc-blonde 구조를 가지는 CrAs와 MnAs에서 (110)면 원자층으로 이루어진 초격자의 자성을 제일원리 방법을 이용하여 연구하였다. 이를 위해 CrAs와 MnAs의 (110)층이 각기 세 층씩 교대로 반복되는 $(CrAs)_3(MnAs)_3(110)$ 초격자계의 전자구조를 총 퍼텐셜 선형보강평면파동(FLAPW) 에너지띠 방법을 이용하여 계산하였다. Cr-As로 이루어진 층과 Mn-As로 이루어진 층이 접합되는 계면에 있는 Cr과 Mn원자의 자기모멘트를 계산한 결과 각기 $3.07\;\mu_B$$3.74\;\mu_B$로 가운데 층의 Cr과 Mn의 자기모멘트 값인 $3.06\;\mu_B$$3.76\;\mu_B$보다 약간 크거나 작았다. 계산된 상태밀도로부터 이 계의 전자구조와 반쪽금속성을 고찰하였다.

금속재료 표면층의 급격한 응력구배에 대한 X-Ray회절 특성값과 측정된 변형률의 해석방법 (Analysis Method of X-Ray Diffraction Characteristic Values and Measured Strain for Steep Stress Gradient of Metal Material Surface Layer)

  • 한창석;이찬우
    • 한국재료학회지
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    • 제33권2호
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    • pp.54-62
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    • 2023
  • The most comprehensive and particularly reliable method for non-destructively measuring the residual stress of the surface layer of metals is the sin2ψ method. When X-rays were used the relationship of εφψ-sin2ψ measured on the surface layer of the processing metal did not show linearity when the sin2ψ method was used. In this case, since the effective penetration depth changes according to the changing direction of the incident X-ray, σφ becomes a sin2ψ function. Since σφ cannot be used as a constant, the relationship in εφψ-sin2ψ cannot be linear. Therefore, in this paper, the orthogonal function method according to Warren's diffraction theory and the basic profile of normal distribution were synthesized, and the X-ray diffraction profile was calculated and reviewed when there was a linear strain (stress) gradient on the surface. When there is a strain gradient, the X-ray diffraction profile becomes asymmetric, and as a result, the peak position, the position of half-maximum, and the centroid position show different values. The difference between the peak position and the centroid position appeared more clearly as the strain (stress) gradient became larger, and the basic profile width was smaller. The weighted average strain enables stress analysis when there is a strain (stress) gradient, based on the strain value corresponding to the centroid position of the diffracted X-rays. At the 1/5 Imax max height of X-ray diffraction, the position where the diffracted X-ray is divided into two by drawing a straight line parallel to the background, corresponds approximately to the centroid position.