• 제목/요약/키워드: HF2V

검색결과 213건 처리시간 0.038초

MOCVD를 이용한 Hafnium Oxide 박막 증착 (The Deposition of Hafnium Oxide Thin Film using MOCVD)

  • 오재민;이태호;김영순;현광수;안진호
    • 한국마이크로전자및패키징학회:학술대회논문집
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    • 한국마이크로전자및패키징학회 2002년도 춘계 기술심포지움 논문집
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    • pp.198-202
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    • 2002
  • $HfO_2$films were grown on Si substrate in the temperature range $250~550^{\circ}C$ using metal organic chemical vapor deposition (MOCVD) technique for a gate dielectric. Hafnium tart-butoxide and Oxygen gas were used as precursors and N2 was used as carrier gas. Impurity distribution and film structure(including interfacial layer) were studied at the deposition temperature range between 25$0^{\circ}C$ and $550^{\circ}C$. The growth rate and impurty distribution decreased with increasing temperature. The electrical properties of $HfO_2$were investigated with C-V, 1-V method and showed it has a good properties as a gate dielectric.

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Preparation and Characterization of MFIS Using PT/BFO/$HFO_2$/Si Structures

  • Kim, Kwi-Junga;Jeong, Shin-Woo;Han, Hui-Seong;Han, Dae-Hee;Jeon, Ho-Seung;Im, Jong-Hyun;Park, Byung-Eun
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2009년도 하계학술대회 논문집
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    • pp.80-80
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    • 2009
  • Recently, multiferroics have attracted much attention due to their numorous potentials. In this work, we attemped to utilize the multiferroics as an alternative material for ferroelectrics. Ferroelectric materials have been stadied to ferroelectric random access memories, however, some inevitable problems prevent it from inplementation. multiferroics shows a ferroelectricity and has low process temperature $BiFeO_3$(BFO) films have good ferroelectric properties but poor leakage characterization. Thus we tried, in this work, to adopt $HfO_2$ insulating layer for metal-ferroelectric-insulator-semiconductor(MFMIS) structure to surpress to leakage current. $BiFeO_3$(BFO) thin films were fabricared by using a sol-gel method on $HfO_2/Si$ structure. Ferroelectric BFO films on a p-type Si(100)wafer with a $HfO_2$ buffer layer have been fabricated to form a metal-ferroelectric-insulator-semiconductor (MFIS) structure. The $HfO_2$ insulator were deposited by using a sol-gel method. Then, they were carried out a rapid thermal annealing(RTA) furnace at $750\;^{\circ}C$ for 10 min in $N_2$. BFO films on the $HfO_2/Si$ structures were deposited by sol-gel method and they were crystallized rapid thermal annealing in $N_2$ atomsphere at $550\;^{\circ}C$ for 5 min. They were characterized by atomic force microscopy(AFM) and Capacitance-voltage(C-V) curve.

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펄스 레이저 증착법으로 증착된 $MgTiO_3$박막의 전기적 특성 분석 (Electrical Properties Of MgTiO$_3$ thin films grown by pulsedd laser deposition method)

  • 안순홍;노용한;이영훈;강신충;이재찬
    • 한국진공학회지
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    • 제9권3호
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    • pp.249-253
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    • 2000
  • 차세대 마이크로파 유전체 소자에 응용하기 위한 $MgTiO_3$ 박막을 펄스 레이저 증착법(PLD, pulsed laser deposition)을 이용하여 400-$500^{\circ}C$에서 비정질 상태로 실리콘 기판 위에 성장시킨 후 전기적 특성을 분석하였다. PLD로 증착된 $MgTiO_3$ 박막의 전기적 특성은 성장시 온도에 의존하였다. 즉, 증착 온도가 낮아짐에 따라 $MgTiO_3$ 박막 내부에 존재하는 이상정전하 결함 밀도가 증가하였으며, 이들 결함과 실리콘 기판과의 전하교환에 의하여 High Frequency(HF) C-V 곡선이 음의 방향으로 이동하는 현상이 관측된 것으로 사료된다. 또한, 증착 온도간 HF C-V 곡선 이동 폭 및 이상정전하 밀도는 ~l00$\AA$ 두께의 $SiO_2$ 중간층을 사용할 경우에 현저히 감소함을 확인하였다.

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플라즈마 보조 유기금속 화학기상 증착법에 의한 MCN(M=Ti, Hf) 코팅막의 저온성장과 그들의 특성연구 (Low Temperature Growth of MCN(M=Ti, Hf) Coating Layers by Plasma Enhanced MOCVD and Study on Their Characteristics)

  • 부진효;허철호;조용기;윤주선;한전건
    • 한국진공학회지
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    • 제15권6호
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    • pp.563-575
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    • 2006
  • Ti(C,N) 박막을 온도범위 $200-300^{\circ}C$에서 tetrakis diethylamido titanium유기금속 화합물을 전구체로 이용하여 pulsed DC 플라즈마 보조 유기금속 화학기상 증착법 (PEMOCVD)으로 합성하였다. 본 연구에서는 플라즈마 특성을 서로 비교하기 위하여 수소$(N_2)$와 헬륨/수소$(He/H_2)$ 혼합기체를 각각 운반기체로 사용하였으며 전구체 이외에 질소$(N_2)$와 암모니아$(NH_3)$ 기체를 반응기체로 사용하여 서로 다른 플라즈마 화학조건에서 얻어지는 박막내의 탄소함유량(C Content)의 변화를 비교하여 탄소가 가장 적게 함유된 저온 코팅막 합성공정을 찾으려고 하였다. 이를 위하여 증착시 서로 다른 pulsed bias 전압과 기체종류 하에서 여기된 플라즈마 상태의 라디칼종들과 이온화 경향을 in-situ optical emission spectroscopy(OES)법으로 플라즈마 진단분석을 실시하였다. 그 결과 $(He/H_2)$ 혼합기체를 $N_2$와 함께 사용할 경우 라디칼 종들의 이온화를 매우 효과적으로 향상시킴을 관찰하였다. 아울러 $NH_3$ 기체를 $H_2$ 또는 $He/H_2$ 혼합기체와 같이 사용할 경우는 CN 라디칼의 생성을 억제하여 결과적으로 Ti(C, N) 박막내의 탄소함량을 크게 낮춤을 알 수 있었고, CN 라디칼의 농도가 탄소 함유량과 많은 관련이 있음을 알았다. 이 결과는 바로 박막의 미세경도와도 연관이 되며, bias전압과 기체종류에 크게 의존하여 Ti(C, N) 박막의 미세경도가 1250 - 1760 Hk0.01 사이에서 나타났고, 최대치$(1760\;Hk_{0.01})$는 600 V bias 전압과 $H_2$$N_2$ 기체를 사용한 경우에 얻어졌다. HF(C, N) 박막 역시 tetrakis diethylamido hafnium 전구체와 $N_2/He-H_2$ 혼합기체를 이용하여 pulsed DC PEMOCVD 법으로 기판온도 $300^{\circ}C$ 이하, 공정압력 1 Torr, 그리고 bias전압과 기체 혼합비를 변화시키면서 증착하였다. 증착시 in-situ OES 분석결과 플라즈마 내의 질소종의 함유량 변화에 따라 증착속도가 크게 변화됨을 알 수 있었고, 많은 질소기체를 인입하면 질소종이 많아지지만 증착률은 급격히 감소하였고 박막내 탄소의 함량이 커지면서 막질이 비정질로 바뀌고 미세경도 또한 감소함을 알 수 있었다. 이는 in-situ 플라즈마 진단분석이 전체 PEMOCVD 공정에 있어서 대단히 중요하고, Ti(C,N)과 Hf(C,N) 코팅막의 탄소함량과 미세경도는 플라즈마내의 CH과 CN radical종의 세기에 크게 의존함을 의미한다. 그리고 Hf(C,N) 박막의 경우도 Ti(C,N) 박막의 경우와 유사하게 최대 미세경도값$(2460\;Hk_{0.025})$이 -600 V bias 전압과 10% 질소기체 혼합비를 사용한 경우에 얻어졌고, 이는 박막이 주로(111) 방향으로 성장됨에 기인한 것으로 사료된다.

Si and Mg Coatings on the Hydroxyapatite Film Formed Ti-29Nb-xHf Alloys by Plasma Electrolyte Oxidation

  • Park, Seon-Yeong;Choe, Han-Cheol
    • 한국표면공학회:학술대회논문집
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    • 한국표면공학회 2017년도 춘계학술대회 논문집
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    • pp.152-152
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    • 2017
  • Titanium and its alloys have been widely used for biomedical applications. However, the use of the Ti-6Al-4V alloy in biomaterial is then a subject of controversy because aluminum ions and vanadium oxide have potential detrimental influence on the human body due to vanadium and aluminum. Hence, recent works showed that the synthesis of new Ti-based alloys for implant application involves more biocompatible metallic alloying element,such as, Nb, Hf, Zr and Mo. In particular, Nb and Hf are one of the most effective Ti ${\beta}$-stabilizer and reducing the elastic modulus. Plasma electrolyte oxidation (PEO) is known as excellent method in the biocompatibility of biomaterial due to quickly coating time and controlled coating condition. The anodized oxide layer and diameter modulation of Ti alloys can be obtained function of improvement of cell adhesion. Silicon (Si) and magnesium (Mg) has a beneficial effect on bone. Si in particular has been found to be essential for normal bone and cartilage growth and development. In vitro studies have shown that Mg plays very important roles in essential for normal growth and metabolism of skeletal tissue in vertebrates and can be detected as minor constituents in teeth and bone. Therefore, in this study, Si and Mg coatings on the hydroxyapatite film formed Ti-29Nb-xHf alloys by plasma electrolyte oxidation has been investigated using several experimental techniques. Ti-29Nb-xHf (x= 0, 3, 7 and 15wt%, mass fraction) alloys were prepared Ti-29Nb-xHf alloys of containing Hf up from 0 wt% to 15 wt% were melted by using a vacuum furnace. Ti-29Nb-xHf alloys were homogenized for 2 hr at $1050^{\circ}C$. The electrolyte was Si and Mg ions containing calcium acetate monohydrate + calcium glycerophosphate at room temperature. The microstructure, phase and composition of Si and Mg coated oxide surface of Ti-29Nb-xHf alloys were examined by FE-SEM, EDS, and XRD.

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입도분포에 따른 하상퇴적물의 지구화학적 분산 및 부화 (Geochemical Dispersion and Enrichment of Fluvial Sediments Depending on the Particla Size Distribution)

  • 이현구
    • 자원환경지질
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    • 제32권3호
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    • pp.247-260
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    • 1999
  • Geochermical characteristics of the fluvial sediments deprnding on particle size distribution size were investigated in the respect of majir, minor and rare eath element chemisitry. Ratios of $Al_{2}O_{3}/Na_{2}O$ and $K_{2}O/Na_{2}O$ of the sediments show the homogeneous valus, and partly positive correlation with $SiO_{2}/Al_{2}O_{3}$, respecively. Characteristics of minor element ratios (V/Ni, Cr/V, Ni/Co and Zr/Hf)are within the lower and narrow range. Thesesuggested that sediment sources may be acidic to intermediate granitic rock, and may be explained by simple weathering and sedimentation. With increasing SiO2 contents, concentrations of $Al_{2}O_{3}$, $Fe_{2}O_{3}$, CaO and MgO decreased, but those of $K_{2}O$ and $Na_{2}O$ increased, Concentrations of Ba, Be, Cs, Cu, Li, Ni, Sr, V and Zr show comparatively normal negative and some positive trends. Compared with the mean composition of granite, concentrations of $Al_{2}O_{3}$, $Fe_{2}O_{3}$, MnO, CaO and MgO in the sediments of the study area were highly enriced. Among some minor and rare earth elements, concentrations of As, Cd, Cu, and V were enriched, but those of Be, Ce, Rb, Sc, Sr and Zn were depleted when compared with average composition of granite. By decreasing of particle size fractions, SiO2, Rb and Sr conterts decreased, but concentrations of $Al_{2}O_{3}$, $Fe_{2}O_{3}$, CaO, MgO, $TiO_{2}$, MgO, $P_{2}O_{5}$, Be, Cu, Hf, Pb, V and Zr increased. From the correlations between particle size fractions and element concenreations, some elements of $Fe_{2}O_{3}$, CaO, MgO, $P_{2}O_{5}$, Cu, Ni, Zn and Zr showed typical trends in the secondary contramination sediments. These trends are typically shown under 100 mesh fractions. It indicates that the fraction of minus 100 mesh is the optimum size fraction for geochemical and environmental survey.

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Charicteristics of HF 10-cm Type Grid Ion Source for Inert and Chemically Reactive Gases.

  • Chol, W.K;Koh, S.K;Jang, H.G;Jung, H.J;Kondranin, S.G.;Kralkina, E.A.;Bougrov, G.E.
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 1996년도 제10회 학술발표회 논문개요집
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    • pp.102-102
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    • 1996
  • This paper represents a new type low power High Frequency technological ion source (HF TIS) for ion - beam processing: the surface modification of materials, cleaning of surface, sputtering, coating of thin films, and polishing. The operational principle of HF TIS is based on the excitation of electrostatic waves in plasma located in the external magnetic field. Low power HF TIS with diameter 92 rom gives the opportunity to obtain beams of inert and chemically reactive gases with currents range from 5 to 150 mA (current density $0.015\;~\;3.5\;mA/\textrm{m}^2$) and ion beam energy 100 ~ 2500 eV at a HF power level 10 ~ 150 W. Three grid concave type ion optical system (IOS) is used for extraction and formation ofion beam.n beam.

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Band alignment and optical properties of $(ZrO_2)_{0.66}(HfO_2)_{0.34}$ gate dielectrics thin films on p-Si (100)

  • Tahir, D.;Kim, K.R.;Son, L.S.;Choi, E.H.;Oh, S.K.;Kang, H.J.;Heo, S.;Chung, J.G.;Lee, J.C.
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2009년도 제38회 동계학술대회 초록집
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    • pp.381-381
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    • 2010
  • $(ZrO_2)_{0.66}(HfO_2)_{0.34}$ thin films as gate dielectrics have been proposed to overcome the problems of tunneling current and degradation mobility inachieving a thin equivalent oxide thickness. An extremely thin $SiO_2$ layer is used in order to separate the carrier in MOSFET channel from the dielectric field fluctuation caused by phonons in the dielectric which decreases the carrier mobility. The electronic and optical properties influenced the device performance to a great extent. $(ZrO_2)_{0.66}(HfO_2)_{0.34}$ dielectric films on p-Si (100) were grown by atomic layer deposition method, for which the conduction band offsets, valence band offsets and band gapswere obtained by using X-ray photoelectron spectroscopy and reflection electron energy loss spectroscopy. The band gap, valence and conduction band offset values for $(ZrO_2)_{0.66}(HfO_2)_{0.34}$ dielectric thin film, grown on Si substrate were about 5.34, 2.35 and 1.87 eV respectively. This band alignment was similar to that of $ZrO_2$. In addition, The dielectric function (k, $\omega$), index of refraction n and the extinction coefficient k for the $(ZrO_2)_{0.66}(HfO_2)_{0.34}$ thin films were obtained from a quantitative analysis of REELS data by comparison to detailed dielectric response model calculations using the QUEELS-$\varepsilon$(k, $\omega$)-REELS software package. These optical properties are similar with $ZrO_2$ dielectric thin films.

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Al2O3-HfO2-Al2O3와 SiO2-HfO2-SiO2 샌드위치 구조 MIM 캐패시터의 DC, AC Stress에 따른 특성 분석 (Characterization of Sandwiched MIM Capacitors Under DC and AC Stresses: Al2O3-HfO2-Al2O3 Versus SiO2-HfO2-SiO2)

  • 곽호영;권혁민;권성규;장재형;이환희;이성재;고성용;이원묵;이희덕
    • 한국전기전자재료학회논문지
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    • 제24권12호
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    • pp.939-943
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    • 2011
  • In this paper, reliability of the two sandwiched MIM capacitors of $Al_2O_3-HfO_2-Al_2O_3$ (AHA) and $SiO_2-HfO_2-SiO_2$ (SHS) with hafnium-based dielectrics was analyzed using two kinds of voltage stress; DC and AC voltage stresses. Two MIM capacitors have high capacitance density (8.1 fF/${\mu}m^2$ and 5.2 fF/${\mu}m^2$) over the entire frequency range and low leakage current density of ~1 nA/$cm^2$ at room temperature and 1 V. The charge trapping in the dielectric shows that the relative variation of capacitance (${\Delta}C/C_0$) increases and the variation of voltage linearity (${\alpha}$/${\alpha}_0$) gradually decreases with stress-time under two types of voltage stress. It is also shown that DC voltage stress induced greater variation of capacitance density and voltage linearity than AC voltage stress.

Ca-Ce-Hf-Ti-O System에서의 파이로클로어 합성 (Synthesis of Pyrochlore in the System of Ca-Ce-Hf-Ti-O)

  • 채수천;배인국;장영남
    • 자원환경지질
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    • 제37권4호
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    • pp.375-381
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    • 2004
  • 장주기 방사성 폐기물인 악티나이드 원소들을 고정화시킬 수 있는 파이로클로어 (pyrochlore; CaCeH$f_xTi_{2-x}O_7$=0.2, 0.6, 1.0, 1.4, 1.8, 2.0)를 합성하여 상평형 관계 및 특성을 연구하였다. 혼합된 시료는 상온에서 400kg/$cm^2$의 압력으로 성형한 후, 산소분위기에서 1200∼1$600^{\circ}C$ 범위로 소결온도를 변화시키면서 소성하였다. 합성된 시료는 XRD를 사용하여 상분석을 실시하였다. 실험결과, 파이로클로어의 최적 합성조건은 산소분위기 하에서, 각각의 조성에 따라, 1300∼150$0^{\circ}C$로 매우 다양하였다. 합성시 생성된 상으로는 페롭스카이트, 파이로클로어 및 $A_{2}BO_{5}$산화물 등이 있으며, 본 계의 특성은 Hf의 함량증가에 따라 페롭스카이트 및 파이로클로어의 격자상수가 증가한다는 점이다. 이같은 현상은 육배위 자리를 차지하고 있는 Hf와 Ti의 이온반경의 차이에서 비롯된 것이다.