Characterization of Sandwiched MIM Capacitors Under DC and AC Stresses: Al2O3-HfO2-Al2O3 Versus SiO2-HfO2-SiO2
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Kwak, Ho-Young
(Department of Electronics Engineering, Chungnam University)
Kwon, Hyuk-Min (Department of Electronics Engineering, Chungnam University) Kwon, Sung-Kyu (Department of Electronics Engineering, Chungnam University) Jang, Jae-Hyung (Department of Electronics Engineering, Chungnam University) Lee, Hwan-Hee (Department of Electronics Engineering, Chungnam University) Lee, Song-Jae (Department of Electronics Engineering, Chungnam University) Go, Sung-Yong (DMS Co., Ltd.) Lee, Weon-Mook (DMS Co., Ltd.) Lee, Hi-Deok (Department of Electronics Engineering, Chungnam University) |
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