• 제목/요약/키워드: Ga(III)-

검색결과 282건 처리시간 0.027초

Electrochemical Behavior of Sm(III) on the Aluminium-Gallium Alloy Electrode in LiCl-KCl Eutectic

  • Ye, Chang-Mei;Jiang, Shi-Lin;Liu, Ya-Lan;Xu, Kai;Yang, Shao-Hua;Chang, Ke-Ke;Ren, Hao;Chai, Zhi-Fang;Shi, Wei-Qun
    • 방사성폐기물학회지
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    • 제19권2호
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    • pp.161-176
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    • 2021
  • In this study, the electrochemical behavior of Sm on the binary liquid Al-Ga cathode in the LiCl-KCl molten salt system is investigated. First, the co-reduction process of Sm(III)-Al(III), Sm(III)-Ga(III), and Sm(III)-Ga(III)-Al(III) on the W electrode (inert) were studied using cyclic voltammetry (CV), square-wave voltammetry (SWV) and open circuit potential (OCP) methods, respectively. It was identified that Sm(III) can be co-reduced with Al(III) or Ga(III) to form AlzSmy or GaxSmy intermetallic compounds. Subsequently, the under-potential deposition of Sm(III) at the Al, Ga, and Al-Ga active cathode was performed to confirm the formation of Sm-based intermetallic compounds. The X-ray diffraction (XRD) and scanning electron microscopy-energy dispersive spectroscopy (SEM-EDS) analyses indicated that Ga3Sm and Ga6Sm intermetallic compounds were formed on the Mo grid electrode (inert) during the potentiostatic electrolysis in LiCl-KCl-SmCl3-AlCl3-GaCl3 melt, while only Ga6Sm intermetallic compound was generated on the Al-Ga alloy electrode during the galvanostatic electrolysis in LiCl-KCl-SmCl3 melt. The electrolysis results revealed that the interaction between Sm and Ga was predominant in the Al-Ga alloy electrode, with Al only acting as an additive to lower the melting point.

HVPE 법을 통한 GaN 성장 시 기판 종류 및 V/III 비에 따른 잔류 stress 특성 연구 (Study on residual stress characteristics according to the substrate type and V/III ratio during GaN growth by HVPE)

  • 이주형;이승훈;이희애;강효상;오누리;이성철;이성국;박재화
    • 한국결정성장학회지
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    • 제30권2호
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    • pp.41-46
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    • 2020
  • 본 연구에서는 HVPE 성장법으로 GaN 성장 시 GaN 내에 잔류하는 stress로 인한 crack 현상을 감소시키고자 기판 종류 및 V/III 비를 조절하여 잔류 stress 특성을 알아보고자 하였다. Sapphire, GaN template 위에 각각 V/III 비 5, 10, 15의 조건으로 GaN을 성장시켜 형성된 hexagonal pit의 분포 및 깊이를 분석하였다. 이를 통해 GaN on GaN template 성장에서 V/III 비가 높을수록 hexagonal pit의 분포 영역 및 깊이가 증가하는 것을 확인하였다. Raman 측정을 통해 hexagonal pit 영역 및 깊이가 컸던 GaN on GaN template 성장에서 V/III 비가 높을수록 stress가 감소하는 것을 확인하였다. 이를 통해 hexagonal pit의 분포 및 깊이가 증가할수록 잔류 stress가 낮아짐을 확인할 수 있었으며, 향후 후막 GaN 성장 시 stress 감소 가능성에 대해 확인하였다.

III족 질화물 반도체의 실온 광여기 유도방출 (Stimulated emission from optically pumped column-III nitride semiconductors at room temperature)

  • 김선태;문동찬
    • E2M - 전기 전자와 첨단 소재
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    • 제8권3호
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    • pp.272-277
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    • 1995
  • We report the properties of optically pumped stimulated emission at room temperature (RT) from column-III nitride semiconductors of GaN, AlGaN/GaN double heterostructure (DH) and AlGaN/GaInN DH which prepared on a sapphire substrate using an AIN buffer-layer by the nietalorganic vapor phase epitaxy (MOVPE) method. The peak wavelength of the stimulated emission at RT from AIGaN/GaN DH is 369nm and the threshold of excitation pumping power density (P$\_$th/) is about 84kW/cm$\^$2/, and they from AlGaN/GaInN DH are 402nm and 130kW/cm$\^$2/ at the pumping power density of 200kW/cm$\^$2/, respectively. The P$\_$th/ of AIGaN/GaN and AlGaN/GaInN DHs are lower than the single layers of GaN and GaInN due to optical confinement within the active layers of GaN and GaInN, respectively.

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Ga(III)-, In(III)-, TI(III)-porphyrin 유도체를 촉매제로 한 고리성 올레핀의 산화반응 (Cycloolefins Oxidation Reaction Catalyzed by Ga(III)-, In(III)- and TI(III)-Porphyrin Derivatives)

  • 나훈길
    • 한국응용과학기술학회지
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    • 제21권1호
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    • pp.76-88
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    • 2004
  • The catalytic oxidation reaction of several cycloolefins in $CH_2Cl_2$ have been investigated using non-redox metalloporphyrin(M = Ga(III), In(III) and TI(III) complexes as a catalyst and sodium hypochlorite as a terminal oxidant. Porphyrins were $(p-CH_3O)$TPP, $(p-CH_3)$TPP, TPP, (p-F)TPP, (p-Cl)TPP and $(F_{20})$TPP (TPP=5,10,15,20-tetraphenyl-21H,23H-porphyrin) and olefins were cyclopentene, cyclohexene, cycloheptene and cyclooctene, The substrate conversion yield(%) was investigated according to the radius effect of non-redox metal ion, substituent effect and hindrance effect of metalloporphyrin. The conversion yield of cycloolefin was in the following order : $C_5$ < $C_6$ < $C_7$ = $C_8$.

Potentially Multidentate Tripodal Amine Catechol Ligands as Chelators for Ga(III) and In(III)

  • Sahoo, Suban K.;Baral, Minati;Bera, Rati Kanta;Kanungo, B. K.
    • Bulletin of the Korean Chemical Society
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    • 제30권9호
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    • pp.1956-1962
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    • 2009
  • The binding abilities of two multidentate tripodal amine catechol ligands, cis,cis-1,3,5-tris[(2,3-dihydroxybenzylamino) aminomethyl]cyclohexane (TMACHCAT, $L^1)\;and\;N^1,N^3,N^5$-tris(2-(2,3-dihydroxybenzylamino) ethyl)cyclohexane-1,3,5-tricarboxamide (CYCOENCAT, $L^2$) with Ga(III) and In(III) have been investigated by potentiometric and spectrophotometric methods in an aqueous medium of 0.1 M KCl at 25 ${\pm}\;1\;{^{\circ}C}.$ The ligands $L^1\;and\;L^2$ formed various monomeric species $MLH_3,\;MLH_2$, MLH and ML (M = $Ga^{+3}\;and\;In^{+3}$) and showed potential to form strong encapsulated tris(catechol) type complexes. The coordination modes, binding ability and selectivity of the ligands towards Ga(III) and In(III) have been discussed with the help of experimental evidences, and supported with molecular modeling calculations.

Synthesis and Characterization of Gallium Nitride Powders from a Gallium(III) Sulfate Salt in Flowing Ammonia

  • Jung, Woo-Sik
    • 한국세라믹학회지
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    • 제40권11호
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    • pp.1058-1061
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    • 2003
  • Gallium Nitride (GaN) powders were synthesized by calcining a gallium(III) sulfate salt in flowing ammonia in the temperature range 500-1100$^{\circ}C$. The process of conversion of the salt to GaN was monitored by X-Ray Diffraction (XRD). The salt decomposed to ${\gamma}$-Ga$_2$O$_3$ and then converted to GaN without ${\gamma}$-${\beta}$Ga$_2$O$_3$ phase transition. Variations in XRD patterns and weight loss of samples with temperature indicate that the conversion of ${\gamma}$-Ga$_2$O$_3$ to GaN does not proceed through Ga$_2$O but stepwise via amorphous gallium oxynitride (GaO$\_$x/N$\_$y/) as intermediates. Room-temperature photoluminescence spectra of GaN powders obtained showed the emission peak at 363 nm and no yellow band.

Synthesis and Characterization of Gallium Nitride Powders and Nanowires Using Ga(S2CNR2)3(R = CH3, C2H5) Complexes as New Precursors

  • Jung, Woo-Sik;Ra, Choon-Sup;Min, Bong-Ki
    • Bulletin of the Korean Chemical Society
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    • 제26권1호
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    • pp.131-135
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    • 2005
  • Gallium nitride (GaN) powders and nanowires were prepared by using tris(N,N-dimethyldithiocarbamato)gallium(III) (Ga(DmDTC)$_3$) and tris(N,N-diethyldithiocarbamato)gallium(III) (Ga(DeDTC)$_3$) as new precursors. The GaN powders were obtained by reaction of the complexes with ammonia in the temperature ranging from 500 to 1100 ${^{\circ}C}$. The process of conversion of the complexes to GaN was monitored by their weight loss, XRD, and $^{71}$Ga magic-angle spinning (MAS) NMR spectroscopy. Most likely the complexes decompose to $\gamma$ -Ga$_2$S$_3$ and then turn into GaN via amorphous gallium thionitrides (GaS$_x$N$_y$). The reactivity of Ga(DmDTC)$_3$ with ammonia was a little higher than that of Ga(DeDTC)$_3$. Room-temperature photoluminescence spectra of asprepared GaN powders exhibited the band-edge emission of GaN at 363 nm. GaN nanowires were obtained by nitridation of as-ground $\gamma$ -Ga$_2$S$_3$ powders to GaN powders, followed by sublimation without using templates or catalysts.

r-Plane sapphire 위에 HVPE에 의해 성장한 a-plane GaN에피텍셜층의 V/III족 ratio에 따른 특성 변화 (Effects of the V/III ratio on a-plane GaN epitaxial layer on r-plane sapphire grown by HVPE)

  • 하주형;박미선;이원재;최영준;이혜용
    • 한국결정성장학회지
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    • 제24권3호
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    • pp.89-93
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    • 2014
  • V/III족 ratio의 변화에 따른 r-plane의 sapphire 위에 HVPE로 성장한 a-plane GaN 에피텍셜층의 특성변화를 연구하였다. V/III족 ratio가 증가함에 따라서, a-plane (11-20) GaN에 대한 Rocking Curve의 FWHM의 값이 감소하며, 성장된 GaN의 표면 거칠기도 감소하고, 성장성도는 증가하다가 V/III족 ratio 7까지는 증가하다가 다시 감소하는 경향을 보여준다. 즉 V/III족 ratio 10에서 a-plane (11-20) GaN에 대한 Rocking Curve의 FWHM의 가장 작은 829 arcsec값을 보이고, 표면거칠기도 가장 작은 1.58 nm 값을 보인다. 또한 광학현미경상에서 관찰되는 내부 Crack 또는 void가 가장 적게 발생하였다. 그리고 M모양의 Azimuth angle 의존도를 전 샘플에서 보이며, V/III족 ratio 10에서 FWHM 최대값과 최소값의 편차값이 439 arcscec로 가장 작은 차이를 보였다.

III-V족 질화물 반도체 성장과 청색 LED 제작 특성

  • 이철로;임재영;손성진
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 1998년도 제14회 학술발표회 논문개요집
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    • pp.93-93
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    • 1998
  • III-V족 질화물반도체를 이용한 광 및 전자소자 용용에 있어서 가장 중요한 고홈위 u undoped GaN 에피충 성장과 GaN 에피충의 doping 특허 p-type doping의 복성융 고찰한다. 그리고 III-V nitride 이용한 band gap en명neertng에 있어서 가장 중요한 InGaN 생장파 81 및 :at codoplng 륙성융 평가 분석 한다. 위의 기반기술융 기본으로 하여 InGaN/AlG때 DH s$\sigma$ucture lED훌 제작하고 이의 륙성 용 명가분석하였다.

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