• Journal of the Korea Institute of Information Security & Cryptology
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• v.19 no.2
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• pp.75-82
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• 2009

In this paper, we test for security targeting on APIs of Windows as that is used by many people worldwide. In order to test APIs in DLL fils of Windows OS, we propose Automated Windows API Fuzz Testing(AWAFT) that can execute fuzz testing automatically and implemented the practical tool for AWAFT. AWAFT focuses on buffer overflows and parsing errors of function parameters. Using the tool, we found 177 errors in the system folder of Windows XP SP2. Therefore, AWAFT is useful for security testing of Windows APIs. AWAFT can be applied to libraries of third party software in Windows OS for the security.

• Journal of the Korea Institute of Information Security & Cryptology
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• v.31 no.5
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• pp.911-917
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• 2021

As software gets an increasing amount of patches, lots of software bugs are increasingly caused by such software patches, collectively known as regression bugs. To proactively detect the regressions bugs, both industry and academia are actively searching for a way to augment fuzz testing, one of the most popular automatic bug detection techniques. In this paper, we investigate the status quo of the studies on augmenting fuzz testing for regression bug detection and, based on the limitations of current proposals, provide an outlook of the relevant research.

• KSII Transactions on Internet and Information Systems (TIIS)
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• v.12 no.9
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• pp.4248-4270
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• 2018

This research aims at a new practical Intent fuzzing tool for detecting Intent vulnerabilities of Android apps causing the robustness problem. We proposed two new ideas. First, we designed an Intent specification language to describe the structure of Intent, which makes our Intent fuzz testing tool flexible. Second, we proposed an automatic tally method classifying unique failures. With the two ideas, we implemented an Intent fuzz testing tool called Hwacha, and evaluated it with 50 commercial Android apps. Our tool offers an arbitrary combination of automatic and manual Intent generators with executors such as ADB and JUnit due to the use of the Intent specification language. The automatic tally method excluded almost 80% of duplicate failures in our experiment, reducing efforts of testers very much in review of failures. The tool uncovered more than 400 unique failures including what is unknown so far. We also measured execution time for Intent fuzz testing, which has been rarely reported before. Our tool is practical because the whole procedure of fuzz testing is fully automatic and the tool is applicable to the large number of Android apps with no human intervention.

• KSII Transactions on Internet and Information Systems (TIIS)
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• v.13 no.7
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• pp.3511-3532
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• 2019

Coverage-guided fuzzing is an efficient solution that has been widely used in software testing. By guiding fuzzers through the coverage information, seeds that generate new paths will be retained to continually increase the coverage. However, we observed that most samples follow the same few high-frequency paths. The seeds that exercise a high-frequency path are saved for the subsequent mutation process until the user terminates the test process, which directly affects the efficiency with which the low-frequency paths are tested. In this paper, we propose a fuzzing solution, ER-Fuzz, that truncates the recording of a high-frequency path to influence coverage. It utilizes a deep learning-based classifier to locate the high and low-frequency path transfer points; then, it instruments at the transfer position to promote the probability low-frequency transfer paths while eliminating subsequent variations of the high-frequency path seeds. We implemented a prototype of ER-Fuzz based on the popular fuzzer AFL and evaluated it on several applications. The experimental results show that ER-Fuzz improves the coverage of the original AFL method to different degrees. In terms of the number of crash discoveries, in the best case, ER-Fuzz found 115% more unique crashes than did AFL. In total, seven new bugs were found and new CVEs were assigned.

• Proceedings of the Korea Information Processing Society Conference
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• 2013.11a
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• pp.831-834
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• 2013

최근 퍼징(Fuzzing, Fuzz Testing)이 소프트웨어의 취약점을 찾아내기 위한 방법으로 활발하게 사용되고 있다. 퍼징은 반복적으로 비정상적인 데이터를 무작위로 생성하여 대상 소프트웨어에 입력 값으로 전달해 오작동을 유도하고, 오작동의 원인을 분석하여 소프트웨어의 취약성을 찾아낸다. 퍼징에서 사용되는 입력 값인 테스트 케이스에 따라서 취약점 탐지율 및 탐지 시간이 결정된다. 따라서 어떻게, 어떤 테스트 케이스를 생성하여 퍼징을 실행 할 것인지가 퍼징 연구의 핵심이다. 퍼징을 위해 생성하는 테스트 케이스는 숫자가 굉장히 많기 때문에 최근에 테스트 케이스의 크기를 축약하여 퍼징 결과 분석을 위해 소요되는 시간을 줄이는 연구가 발하게 진행되고 있다. 본 논문에서는 테스트 케이스 축약에 이용되는 다양한 알고리즘들에 대해 소개하고, 그 각각을 비교 분석하여 향후 퍼징의 테스트 케이스 축약에 관한 연구에 기여하고자 한다.

• KIPS Transactions on Computer and Communication Systems
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• v.2 no.9
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• pp.399-404
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• 2013

MSEC(Microsoft Security Engineering Center) performed fuzz testing Windows Vista with 350 million test cases for 14 months before launching it. They analyzed crashes resulted from the testing and developed crash analyzer !exploitable based on the data used to determine exploitability. In this paper, we describe how MS crash analyzer determines exploitability of crashes. Besides, we suggest an improvement to overcome the limitations found in the MS crash analyzer during the analysis.

• Proceedings of the Korea Information Processing Society Conference
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• 2013.11a
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• pp.680-683
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• 2013

방화벽, 백신, IPS, 취약점 점검 시스템 등 중요 시스템의 보안을 위해 다수의 소프트웨어들이 운용되고 있다. 그 중 취약점 점검 시스템은 중요 서버의 보안 취약점을 점검하여 사전에 보안 위협을 예방한다는 측면에서 중요하다. 그러나 서버의 취약점을 점검해주는 소프트웨어 자체에 취약점이 존재한다면 취약점 보완을 위해 도입한 시스템이 취약점을 내포하고 있는 모순된 상황을 발생시킨다. 본 논문에서는 취약점 점검 시스템의 매니저와 에이전트의 점검 패킷을 분석하여 데이터 필드에 임의의 값을 주입하는 SPIKE 기반의 퍼즈 테스팅 기법으로 매니저와 에이전트 모두에서 DoS(Denial of Service) 취약점을 발견하였다. 해당 취약점은 다수의 SQL 세션을 생성하고 시스템의 CPU 점유율을 100%로 높여 시스템의 다른 서비스조차 이용할 수 없는 상태를 보였다.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.19 no.1
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• pp.603-608
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• 2018

Although the voltage-applied discharge method is most widely used in the semiconductor and display industries, periodic management costs are incurred because the method causes defects due to the absorption of ambient fine dust and causes emitter tip contamination due to the discharge. The emitter tip contamination problem is caused by the accumulation of fine particles in ambient air due to the corona discharge of the ionizer. Fuzzy ball generation accelerates the wear of the emitter tip and deteriorates the performance of the ionizer. Although a mechanical cleaning method using a manual brush or an automatic brush is effective for contaminant removal, it requires management of additional mechanical parts by the user. In some cases, contaminants accumulated in the emitter may be transferred to the wafer or product. In order to solve this problem, we developed an ionizer for a clean environment that can remove the pencil-type emitter tip and directly ionize the surrounding gas molecules using the tungsten wire located inside the ion tank. As a result of testing and certification by the Korea Institute of Machinery and Materials, the average concentration was $0.7572particles/ft^3$, the decay time was less than two seconds, and the ion valance was 7.6 V, which is satisfactory.