• Proceedings of the KIEE Conference
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• 2008.07a
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• pp.1963-1964
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• 2008

Scan design is a structured design-for-testability technique in which flip-flops are re-designed so that the flip-flops are chained in shift registers. We propose a new technique to re-design about clock operation. This technique propose about low power operation of scan clock and saved time of test operation.

• Progress in Superconductivity
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• v.4 no.1
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• pp.37-41
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• 2002

In this work. we have designed two different kinds of Rapid Single Flux Quantum (RSFQ) OR-gates. One was based on the already developed RSFQ cells and the other was aimed to develop a more compact version. In the first circuit, we used a combination of two D Flip-Flops and a merger and in the other circuit we used a combination of RS Flip-Flops and Confluence Buffer. We tested the circuit performance by using the simulation tools, Xic and Wrspice. We obtained the operation margins of the circuit elements by a margin calculation program, and we obtained the minimum operation margins of $\pm$30%. The circuits were laid out, aimed to fabricate by using the existing KRISS Nb process. KRISS Nb process includes the $Nb／Al_2$$O_3$／Nb trilayer fabricated by DC magnetron sputtering and the reactive ion etching technique for the definition of the features. The major tools used in the layouts were Xic and L-meter.

• Journal of Electrical Engineering and information Science
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• v.2 no.3
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• pp.7-13
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• 1997

To overcome the large hardware overhead attendant in the full scan design, the concept of partial scan design has emerged with the virtue of less area and testability close to full scan. Combinational Structure has been developed to avoid the use of sequential test generator. But the patterns sifted on scan register have to be held for sequential depth period upon the aid of the dedicated HOLD circuit. In this paper, a new levelized structure is introduced aiming to exclude the need of extra HOLD circuit. The time to stimulate each scan latch is uniquely determined on this structure, hence each test pattern can e applied by scan shifting and then pulsing a system clock like the full scan but with much les scan flip-flops. Experimental results show that some sequential circuits are levelized by just scanning self-loop flip-flops.

• ETRI Journal
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• v.38 no.3
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• pp.479-486
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• 2016

System-on-chip (SoC) designs have a number of flip-flops; the more flip-flops an SoC has, the longer the associated scan test application time will be. A scan shift operation accounts for a significant portion of a scan test application time. This paper presents physical-aware approaches for speeding up scan shift operations in SoCs. To improve the speed of a scan shift operation, we propose a layout-aware flip-flop insertion and scan shift operation-aware physical implementation procedure. The proposed combined method of insertion and procedure effectively improves the speed of a scan shift operation. Static timing analyses of state-of-the-art SoC designs show that the proposed approaches help increase the speeds of scan shift operations by up to 4.1 times that reached under a conventional method. The faster scan shift operation speeds help to shorten scan test application times, thus reducing test costs.

• The Transactions of the Korea Information Processing Society
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• v.7 no.10
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• pp.3226-3235
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• 2000

The more complex and larger semiconductor integraed circuits become, the core important delay test becomes which guarantees that semiconductor integrated circuits operate in time. In this paper, we propose a new partial enhanced scan method that can generate test patterns for path delay faults offectively. We implemented a new partial enhanced scan method based on an automatic test pattern generator(ATPG) which uses implication and justification . First. we generate test patterns in the standard scan environment. And if test patterns are not generated regularly in the scan chain, we determine flip-flops which applied enhanced scan flip-flops using the information derived for running an automatic test pattern generator inthe circuti. Determming enhanced scan flip-flops are based on a fault coverage or a hardware overhead. through the expenment for JSCAS 89 benchmark sequential circuits, we compared the fault coverage in the standard scan enviroment and enhance scan environment, partial enhanced scan environment. And we proved the effectiveness of the new partial enhanced scan method by identifying a high fault coverage.

• Proceedings of the IEEK Conference
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• 2000.07a
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• pp.347-350
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• 2000

We present the design of ternary flip-flop which is based on ternary logic so as to process ternary data. These flip-flops are fabricated with ternary voltage mode NOR, NAND, INVERTER gates. These logic gate circuits are designed using CMOS and obtained the characteristics of a lower voltage, a lower power consumption as compared to other gates. These circuits have been simulated with the electrical parameters of a standard 0.25 micron CMOS technology and 2.5 volts supply voltage. The Architecture of proposed ternary flip-flop is highly modular and well suited for VLSI implementation, only using ternary gates.

• Journal of IKEEE
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• v.8 no.1 s.14
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• pp.47-53
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• 2004

We present the design of ternary flip-flop which is based on ternary logic so as to process ternary data. These flip-flops are composed with ternary voltage mode NMAX, NMIN, INVERTER gates. These logic gate circuits are designed using CMOS and obtained the characteristics of a lower voltage, lower power consumption as compared to other gates. These circuits have been simulated with the electrical parameters of a standard 0.35um CMOS technology and 3.3Volts supply voltage. The architecture of proposed ternary flip-flop is highly modular and well suited for VLSI implementation, only using ternary gates.

• Journal of Korea Society of Industrial Information Systems
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• v.19 no.4
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• pp.33-39
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• 2014

In this paper, a new on-chip aging sensing circuit based on flip-flops is proposed to detect a circuit failure of MOSFET digital circuits casued by aging phenomenon such as HCI and BTI. The proposed circuit uses timing windows to warn against a guardband violation of sequential circuits, and generates three warning bits right before circuit failures occur. The generated bits can apply to an adaptive self-tuning method for reliable system design as control signals. The aging sensor circuit has been implemented using 0.11um CMOS technology and evaluated by $4{\times}4$ multiplier with power gating structure.

• Proceedings of the IEEK Conference
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• 2005.11a
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• pp.865-868
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• 2005

This paper presents a Clock-gating technique that reduces power dissipation of the sequential circuits in the system. The Master Clock of a Clock-gating technique is formed by a quaternary variable. It uses the covering relationship between the triggering transition of the clock and the active cycles of various flip-flops to generate a slave clock for each flip-flop in the circuit. At current RTL designs flip-flop is acted by Master clock's triggering but the Slave Clock of Clock-gating technique doesn't occur trigger when external input conditions have not matched with a condition of logic table. We have applied our clocking technique to UART controller of 8bit microprocess

• The Transactions of the Korean Institute of Electrical Engineers A
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• v.48 no.9
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• pp.1161-1166
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• 1999

Delay testing has become highlighted in the field of digital circuits as the speed and the density of the circuits improve greatly. However, delay faults in sequential circuits cannot be detected easily due to the existence of state registers. To overcome this difficulty a new scan filp-flop is devised which can be used for both stuck-at testing and delay testing. In addition, the new scan flip-flop can be applied to both the existing functional justification method and the newly-developed reverse functional justification method which uses scan flip-flops as storing the second test patterns rather than the first test patterns. Experimental results on ISCAS 89 benchmark circuits show that the number of testable paths can be increased by about 10% on the average.