Analysis of Dimension-Dependent Threshold Voltage Roll-off and DIBL for Nano Structure Double Gate FinFET (나노구조 이중게이트 FinFET의 크기변화에 따른 문턱전압이동 및 DIBL 분석)
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- Journal of the Korea Institute of Information and Communication Engineering
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- v.11 no.4
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- pp.760-765
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- 2007