• Journal of the Institute of Electronics and Information Engineers
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• v.50 no.2
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• pp.114-121
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• 2013

As the weight of embedded memory within Systems-On-Chips(SoC) rapidly increases to 80-90% of the number of total transistors, the importance of testing embedded memory in SoC increases. This paper proposes IEEE std. 1500 wrapper based Programmable Memory Built-In Self-Test(PMBIST) architecture which can support various kinds of test algorithm. The proposed PMBIST guarantees high flexibility, programmability and fault coverage using not only March algorithms but also non-March algorithms such as Walking and Galloping. The PMBIST has an optimal hardware overhead by an optimum program instruction set and a smaller program memory. Furthermore, the proposed fault information processing scheme guarantees improvement of the memory yield by effectively supporting three types of the diagnostic methods for repair and diagnosis.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.36C no.12
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• pp.47-58
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• 1999

As the performance of processors improves, cache memories are used to overcome the difference of speed between processors and main memories. Generally cache memories are embedded and small sizes, fault coverage is a more important factor than test time in testing point of view. A new test algorithm and a new BIST architecture are developed to detect various fault models with a relatively small overhead. The new concurrent BIST architecture uses the comparator of cache management blocks as response analyzers for tag memories. A modified scan-chain is used for pre-testing of comparators which can reduce test clock cycles. In addition several boundary scan instructions are provided to control the internal test circuitries. The results show that the new algorithm can detect SAFs, AFs, TFs linked with CFs, CFins, CFids, SCFs, CFdyns and DRFs models with O(12N), where N is the memory size and the new BIST architecture has lower overhead than traditional architecture by about 11%.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.60 no.11
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• pp.2000-2006
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• 2011

Asynchronous phenomenon occurs on the synchronous generators under power system when a generator's amplitude of electromagnetic force, phase angle, frequency and waveform etc become different from those of other synchronous generators which can follow instantly varying speed of turbine. Because the amplitude of electromagnetic force, phase frequency and waveform differ from those of other generators with which are to be put into parallel operation due to the change of excitation condition for load sharing and the sharing load change, if reactive current in the internal circuit circulates among generators, the efficiency varies and the stator winding of generators are overheated by resistance loss. Where calculation method of protection settings and Logic for Protection of Generator Asynchronization will be recommended, A distance relay scheme is commonly used for backup protection. This scheme, called a step distance protection, is comprised of 3 steps for graded zones having different operating time. As for the conventional step distance protection scheme, Zone 2 can exceed the ordinary coverage excessively in case of a transformer protection relay especially. In this case, there can be overlapped protection area from a backup protection relay and, therefore, malfunctions can occur when any fault occurs in the overlapped protection area. Distance relays and overcurrent relays are used for backup protection generally, and both relays have normally this problem, the maloperation, caused by a fault in the overlapped protection area. Corresponding to an IEEE standard, this problem can be solved with the modification of the operating time. On the other hand, in Korea, zones are modified to cope with this problem in some specific conditions. These two methods may not be obvious to handle this problem correctly because these methods, modifying the common rules, can cause another coordination problem. To overcome asynchronizing protection this paper describes an improved backup protection coordination scheme using a new Logic that will be suggested.

• ETRI Journal
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• v.26 no.6
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• pp.520-534
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• 2004

As the density of memories increases, unwanted interference between cells and the coupling noise between bit-lines become significant, requiring parallel testing. Testing high-density memories for a high degree of fault coverage requires either a relatively large number of test vectors or a significant amount of additional test circuitry. This paper proposes a new tiling method and an efficient built-in self-test (BIST) algorithm for neighborhood pattern-sensitive faults (NPSFs) and new neighborhood bit-line sensitive faults (NBLSFs). Instead of the conventional five-cell and nine-cell physical neighborhood layouts to test memory cells, a four-cell layout is utilized. This four-cell layout needs smaller test vectors, provides easier hardware implementation, and is more appropriate for both NPSFs and NBLSFs detection. A CMOS column decoder and the parallel comparator proposed by P. Mazumder are modified to implement the test procedure. Consequently, these reduce the number of transistors used for a BIST circuit. Also, we present algorithm properties such as the capability to detect stuck-at faults, transition faults, conventional pattern-sensitive faults, and neighborhood bit-line sensitive faults.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.38 no.8
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• pp.72-84
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• 2001

The timings of all computational elements in the micropipeline circuits are important. The previous researches on path delay testing using scan methods make little account of the characteristic of the path delay tests that the second test pattern must be more controllable. In this paper, a new scan latch is proposed which is suitable to path delay testing of the micropipelines and has small area overhead. Results show that path delay faults in the micropipeline circuits using the new scan are testable robustly and the fault coverage is higher than the previous researches. In addition, the new scan latch for path delay faults testing in the micropipeline circuits can be easily expanded to the applications such as BIST for stuck-at faults.

• JSTS:Journal of Semiconductor Technology and Science
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• v.12 no.3
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• pp.286-292
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• 2012

Scan techniques are almost mandatorily adopted in designing current System-on-a-Chip (SoC) to enhance testability, but inadvertently secret keys can be stolen through the scan test channels of crypto SoCs. An efficient scan design technique is proposed in this paper to protect the secret key of an Advanced Encryption Standard (AES) core embedded in an SoC. A new instruction is added to IEEE 1149.1 boundary scan to use a fake key instead of user key, in which the fake key is chosen with meticulous care to improve the testability as well. Our approach can be implemented as user defined logic with conventional boundary scan design, hence no modification is necessary to any crypto IP core. Conformance to the IEEE 1149.1 standards is completely preserved while yielding better performance of area, power, and fault coverage with highly robust protection of the secret user key.

• Journal of KIISE:Computer Systems and Theory
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• v.36 no.1
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• pp.33-39
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• 2009

This paper presents a new secure scan design technique to protect secret key from scan-based side channel attack for an Advanced Encryption Standard(AES) core embedded on an System-on-a-Chip(SoC). Our proposed secure scan design technique can be applied to crypto IF core which is optimized for applications without the IP core modification. The IEEE1149.1 standard is kept, and low area and power consumption overheads and high fault coverage can be achieved compared to the existing methods.

• Journal of KIISE:Computer Systems and Theory
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• v.30 no.2
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• pp.99-107
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• 2003

This paper proposes a design for testability (DFT) and testability analysis method for register-transfer level (RTL) circuits. The proposed method executes testability analysis - controllability and observability - on the RTL circuit and determines the insertion points to enhance the testability. Then with the associated priority based on the testability, we insert only a few of the test multiplexers resulting in minimized area overhead. Experimental results shows a higher fault coverage and a shorter test generation time than the scan method. Also, the proposed method takes a shorter test application time required.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.40 no.1
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• pp.30-38
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• 2003

UDP library of Verilog HDL has been used for simulation of digital systems. But it takes a lot of time and efforts to generate a gate-level library equivalent to the UDP library manually due to the characteristic of UDP that does not support synthesis. It is indispensable to generate equivalent gate-level model in testing the digital systems because fault coverage can be reduced without the equivalent gate-level models. So, it is needed to automate the process of generating the equivalent gate-level models. An algorithm to solve this problem has been proposed, but it is unnecessarily complex and time-consuming. This paper suggests a new improved algorithm to implement the conversion to gate-level models, which exploits the characteristic of UDP Experimental results are demonstrated to show the effectiveness of the new algorithm.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.34C no.9
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• pp.53-60
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• 1997

In this paper, an efficient BILBO(named EBILBO) is proposed for batch testing application when a BIST (built-in self test) circuit is implemented on ASIC. In a large and complex circuit, the proposed algorithm of batch testing has one pin-count that can easily control 4 test modes in the normal speed of circuit operation. For the implementation of the BIST cifcuit, the test patern needed is generated by PRTPG(pseudo-random test pattern generator) and the ouput is observed by proposed algorithm is easily modified, such as the modelling of test pattern genration, signature EBILBO area and performance of the implemented BIST are evaluated using ISCAS89 benchmark circuits. As a resutl, in a circuit above 600 gates, it is confirmed that test patterns are genrated flexibly about 500K as EBILBO area is 59%, and the range of fault coverage is from 88.3% to 100%. And the optimized operation frequency of EBILBO designed and the area are 50MHz and 150K respectively. On the BIST circit of the proposed batch testing, the test mode of EBILBO is able to execute as realtime that has te number of s$\^$+/n$\^$+/(2s/2p-1) clocks simultaneously with the normal mode of circuit operation. Also the proposed algorithm is made of the library with VHDL coding thus, it will be widely applied to DFT (design for testability) that satisfies the design and test field.