• 대한방사선기술학회지:방사선기술과학
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• 제22권2호
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• pp.33-39
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• 1999

This paper included a data analysis of the unit of medical devices using mainternance recording card that had medical devices of unit failure mode, hospital of failure mode and MTBF. The results of the analysis were as follows : 1. Medical devices of unit failure mode was the highest in QC/PM such A hospital as 33.9%, B hospital 30.9%, C hospital 30.3%, second degree was the Electrical and Electronic failure such A hospital as 23.5%, B hospital 25.3%, C hospital 28%, third degree was mechanical failure such A hospital as 19.5%, B hospital 22.5%, C hospital 25.4%. 2. Hospital of failure mode was the highest in Mobile X-ray device(A hospital 62.5%, B hospital 69.5%, C hospital 37.4%), and was the lowest in Sono devices(A hospital 16.76%, B hospital 8.4%, C hospital 7%). 3. Mean time between failures(MTBT) was the highest in SONO devices and was the lowest in Mobile X-ray devices which have 200 - 400 failure hours. 4. Anverage failure ratio was the highest in Mobile X-ray devices(A hospital 31.3%, B hospital 34.8%, C hospital 18.7%), and was the lowest in Sono(Ultrasound) devices (A hospital 8.4%, B hospital 4.2%, C hospital 3.5%). 5. Failure ratio results of medical devices according to QC/PM part of unit failure mode were as follows ; A hospital was the highest part of QC/PM (50%) in Mamo X-ray device and was the lowest part of QC/PM(26.4%) in Castro X-ray. B hospital was the highest part of QC/PM(56%) in Mobile X-ray device, and the lowest part of QC/PM(12%) in Gastro X-ray. C hospital was the highest part of QC/PM(60%) in R/F X-ray device, and the lowest a part of QC/PM(21%) in Universal X-ray. It was found that the units responsible for most failure decreased by systematic management. We made the preventive maintenance schedule focusing on adjustement of operating and dust removal.

• 한국항공우주학회지
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• 제43권5호
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• pp.449-455
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• 2015

Built-In-Test(이하: BIT)는 항공기 비행안전을 위해 반드시 필요한 기능으로 항공전자 장비의 경우 95% 이상의 높은 고장 진단능력을 요구하고 있다. BIT가 요구도에 명시된 고장 진단능력을 만족시키는지 확인하기 위해 BIT 성능분석이 필요하다. BIT 성능분석을 위해 FMECA (Failure Mode Effect Critical Analysis)에 기술된 고장모드를 활용하는 방법이 많이 사용되고 있으나, 본 논문에서는 분석 오류를 최소화할 수 있는 전자부품 기반의 BIT 성능분석 방법론을 소개한다. 또한, BIT 성능분석에서 제외될 수 있는 비행안전에 영향을 미치지 않는 전자부품 및 전자부품의 고장모드를 실제 개발사례에 적용하여 불필요한 BIT 기능 구현을 방지하고 정확한 BIT 성능분석을 수행할 수 있도록 하였다. BIT Demo를 수행하여 BIT 성능분석 결과와 실제 BIT 성능이 일치함을 확인하였다.

• 한국지반공학회:학술대회논문집
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• 한국지반공학회 1994년도 가을 학술발표회 논문집
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• pp.231-234
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• 1994

Concentrated stresses due to the tunnel excavation easily cause failure around opening in the soft rock mass layer. Thus, while excavatng tunnel in the soft rock mass layerm it is very important to predict the possibility of failure or yielding zones around tunnel boundary. There are two typical methods to predict these; 1) the analysis of field monioring data and 2) numerical analysis. In this study, it was attempted to describe the time-dependent or progressive rock mass manner due to the continuous failure and fracturing caused by surrounding underground openings using the second method. In order to apply the effects of progressive failure underground, an iterative technique was used with the Hoek and Brown rock mass failure theory. By developing and simulating, three different shapes of twin tunnels, this research simulated and estimated the proper size of critical pillar width between tunnels, distributed stresses on the tunnel sides, and convergences of tunnel crowns. Moreover, results out progressive failure technique based on the Hoek and Brown theory were compared with the results out of Mohr-Coulomb theory.

• Structural Engineering and Mechanics
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• 제62권1호
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• pp.43-54
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• 2017

In this study, the failure behavior of composite material in the biaxial and off-axis loading is studied based on a computational micromechanical model. The model is developed so that the combination of mechanical and thermal loading conditions can be considered in the analysis. The modified generalized plane strain assumption of the theory of elasticity is used for formulation of the micromechanical modeling of the problem. A truly meshless method is employed to solve the governing equation and predict the distribution of micro-stresses in the selected RVE of composite. The fiber matrix interface is assumed to be perfect until the interface failure occurs. The biaxial and off-axis loading of the SiC/Ti and Kevlar/Epoxy composite is studied. The failure envelopes of SiC/Ti and Kevlar/Epoxy composite in off-axis loading, biaxial transverse-transverse and axial-transverse loading are predicted based on the micromechanical approach. Various failure criteria are considered for fiber, matrix and fiber-matrix interface. Comparison of results with the available results in the litreture shows excellent agreement with experimental studies.

• Structural Engineering and Mechanics
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• 제32권1호
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• pp.37-53
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• 2009

In this paper the problem of calculating the probability that the responses of a wind-excited structure exceed specified thresholds within a given time interval is considered. The failure domain of the problem can be expressed as a union of elementary failure domains whose boundaries are of quadratic form. The Domain Decomposition Method (DDM) is employed, after being appropriately extended, to solve this problem. The probability estimate of the overall failure domain is given by the sum of the probabilities of the elementary failure domains multiplied by a reduction factor accounting for the overlapping degree of the different elementary failure domains. The DDM is extended with the help of Line Sampling (LS), from its original presentation where the boundary of the elementary failure domains are of linear form, to the current case involving quadratic elementary failure domains. An example involving an along-wind excited steel building shows the accuracy and efficiency of the proposed methodology as compared with that obtained using standard Monte Carlo simulations (MCS).

• 한국신뢰성학회지:신뢰성응용연구
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• 제5권2호
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• pp.221-239
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• 2005

General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide used electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mode caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.

• 한국환경과학회지
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• 제16권4호
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• pp.487-493
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• 2007

In this study is analysis which dams breach shapes are effect on peak discharge of dam-failure. The dam breach shapes and failure time are important peak discharge when dam failure. When dam failure times are 1hr, 2hr and 3hr condition for the ECRD and 0.1hr and 0.2hr for the CG and CFRD that breach shapes changed base length $B_b=1Hd,\;B_b=2Hd\;and\;B_b=3Hd$. As the results from DAMBRK(Dam Break model) peak discharge are increase base widths lengthen. As failure time is longer then peak discharge is decrease. So peak discharge is increase more short of dam failure time. Also peak discharge is increase become larger dam breach shapes.

• Corrosion Science and Technology
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• 제4권5호
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• pp.201-206
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• 2005

Starting with the meaning of the word quality, diverse concepts connoted by the term are examined. Instead of a bathtub curve, the desirable shape of a failure rate covering the entire life of a good product, which might be called hockey-stick line, is introduced. From the hockey-stick line and the definition of reliability, two measurements are extracted. The terms r-reliability (failure rate) and durability (product life) are explained. The conceptual analysis of failure mechanics explains that reliability technology pertains to design area. The desirable shape of hazard rate curve of electronic items, hockey-stick line, clarifies that Mean-Time-to-failure (MTTF) as the inverse of failure rate can be regarded a nominal life. And Bx life, different from MTTF, is explained. Reliability relationships between components and set products are explained. Reshaped definitions of r-reliability and durability are recommended. The procedure to improve reliability and the reasons for failing to identify failure mode are clarified in order to search right solutions. And generalized Life-Stress failure model is recommended for the calculation of acceleration factor.

• 한국안전학회지
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• 제20권3호
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• pp.1-8
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• 2005

The industrial induction motor is widely used in the rotating electrical machine for the transmission of power. It is very reliable equipment, but it could lead to the loss of production and lift when failure occurs. Therefore, the failure data is acquired and analyzed by attaching an exclusive instrument to existing induction motor. However, these instruments could lead to side effects, increasing the production costs, because they are very expensive. The purpose of this study is the development of an induction motor bearing failure diagnosis system constructed using LabVIEW which can be supplied the kernelled function, process monitoring and current signature analysis. In addition, the availability and reasonability of the constructed system was examined for an induction motor with failure defects in outer raceway and ball bearing. From the results, it shows that failure diagnosis system constructed is useful for real-time monitoring with detection of bearing defects over the web.

• 비파괴검사학회지
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• 제27권6호
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• pp.520-530
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• 2007

Combination of the parametric and the wavelet analyses of acoustic emission (AE) signals was applied to identify the failure modes in carbon fiber reinforced plastic (CFRP) composite laminates during tensile testing. AE signals detected by surface mounted lead-zirconate-titanate (PZT) and polyvinylidene fluoride (PVDF) sensors were analyzed by parametric analysis based on the time of occurrence which classifies AE signals corresponding to failure modes. The frequency band level-energy analysis can distinguish the dominant frequency band for each failure mode. It was observed that the same type of failure mechanism produced signals with different characteristics depending on the stacking sequences and the type of sensors. This indicates that the proposed method can identify the failure modes of the signals if the stacking sequences and the sensors used are known.