• Analytical Science and Technology
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• v.5 no.4
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• pp.381-387
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• 1992

Optimum counting condition of a low level liquid scintillation counter for radiocarbon dating has been determined to minimize the contribution of tritium activity and get the highest FOM by the variation of scintillation solutions, scintillation solution to benzene ratio, and ${\beta}$-ray spectrum counting ranges. Under the condition, background count rate has been reduced to $2.26{\pm}0.03cpm$, and the maximum measurable age reached to about 40,000 years. And the practicality of counting system has been verified by the analysis of shell and peat samples.

• Current Optics and Photonics
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• v.4 no.2
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• pp.134-140
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• 2020

A significant enhancement of the magneto-optical Faraday rotation and extraordinary optical transmission (EOT) in the cascaded double-fishnet (CDF) structure with periodic rectangular apertures is theoretically predicted by using the extended finite difference time domain (FDTD) method. The results demonstrate that the transmittance spectrum of the CDF structure has two EOT resonant peaks in a broad spectrum spanning visible to near-infrared wavebands, one of them coinciding with the enhanced Faraday rotation and large figure of merit (FOM) at the same wavelength. It is most important that the resonant position and intensity of the transmittance, Faraday rotation and FOM can be simply tailored by adjusting the incident wavelength, the thickness of the magnetic layer, and the offset between two metallic rectangular apertures, etc. Furthermore, the intrinsic physical mechanism of the resonance characteristics of the transmittance and Faraday rotation is thoroughly studied by investigating the electromagnetic field distributions at the location of resonance. It is shown that the transmittance resonance is mainly determined by different hybrid modes of surface plasmons (SPs) and plasmonic electromagnetically induced transparency (EIT) behavior, and the enhancement of Faraday rotation is mostly governed by the plasmonic electromagnetically induced absorption (EIA) behavior and the conversion of the transverse magnetic (TM) mode and transverse electric (TE) mode in the magnetic dielectric layer.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.07b
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• pp.794-797
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• 2004

The object of investigation is represented by PbxSrl-xTiO3(PST) thin films, which were fabricated by the alkoxide-based sol-gel method on Pt/Ti/SiO2/Si substrate. We have investigated both structural and dielectric properties of PST thin films aimed to tunable microwave device applications as a function of Pb/Sr ratio. PST thin films showedtypical polycrystalline structure with a dense microstructure without secondary phase formation. Dielectric properties of PST films were found as strongly dependent on Pb/Sr composition ratio. Increasing of Pb content leads to simultaneous increasing of both dielectric constant and dielectric loss characteristics of PST films. The figure of merit (FOM) Parameter (FOM : (%) tunability / tan (%)) reached a maximal value of 27.5 corresponding to Pb/Sr ratio of 40/60. The tunability increased with increasing Pb content. The dielectric constants, dielectric loss and tunability of the PST thin films at Pb/sr ratio of 40/60 measured at 100 kHz were 335, 0.0174 and 47.89 %, respectively.

• The Transactions of the Korean Institute of Power Electronics
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• v.20 no.6
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• pp.558-565
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• 2015

Gallium nitride high-electron mobility transistor (GaN HEMT) is the strongest candidate for replacing Si MOSFET. Comparing the figure of merit (FOM) of GaN with the state-of-the-art super junction Si MOSFET, the FOM is much better because of the wide band gap characteristics and the heterojunction structure. Although GaN HEMT has many benefits for the power conversion system, the performance of the power conversion system with the GaN HEMT is sensitive because of its low threshold voltage ($V_{th}$) and even lower parasitic capacitance. This study examines the characteristics of a phase-shifted full-bridge dc-dc converter with cascode GaN HEMT. The problem of unoptimized dead time is analyzed on the basis of the output capacitance of GaN HEMT. In addition, the printed circuit board (PCB) layout consideration is analyzed to reduce the negative effects of parasitic inductance. A comparison of the experimental results is provided to validate the dead time and PCB layout analysis for a phase-shifted full-bridge dc-dc converter with cascode GaN HEMT.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.15 no.1
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• pp.68-72
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• 2004

The integrated voltage-controlled-oscillator(VOC) operating at 1.75 ㎓ is designed using the InGaP/GaAs HBT process. The proposed noise removal circuit and FR-4 substrate structure in this letter show the better characteristic of the phase noise and reduce the size of the VCO. The frequency tuning range of the VCO is about 200 ㎒ and the phase noise at 120 ㎑ offset is -119.3 ㏈c/㎐. The power consumption of the VCO core is 11.2 ㎽ at 2.8 V supply voltage and the output power is -2 ㏈m. The calculated figure of merit(FOM) is 191.7, which shows the best performance compared with the previous FET or HBT VCO.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.07b
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• pp.648-651
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• 2004

Pb0.5Sr0.5TiO3(PST) thin films were deposited on the LaNiO3 (LNO(100))/Si and Pt/Ti/SiO2/Si substrates by the alkoxide-based sol-gel method. Structural and dielectric properties of PST thin films for the tunable microwave device applications were investigated. The PST films, which were directly grown on the Pt/Ti/SiO2/Si substrates showed the random orientation. For the LNO/Si substrates, the PST thin films exhibited highly (100) orientation. Compared with randomly oriented films, the highly (100)-oriented PST thin films showed better dielectric constant, tunability, and figure of merit (FOM). The dielectric constant, tunability, and FOM of the highly (100)-oriented PST thin film increased with increasing annealing temperature due to the decrease in lattice distortion. The differences in dielectric properties may be attributed to the change in the film stress and the in-plane oriented Polar axis depending on the substrate was used. The dielectric constants, dielectric loss and tunability of the PST thin films deposited on the LNO/Si substrates measured at 1 MHz were 483, 0.002, and 60.1%, respectively.

• Journal of radiological science and technology
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• v.42 no.4
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• pp.279-284
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• 2019

The purpose of this study was to find the best protocol for balance of image quality and dose in brain CT scan. Images were acquired using dual-source CT and AAPM water phantom, noise and dose were measured, and effective dose was calculated using computer simulation program ALARA(S/W). In order to determine the ratio of image quality and dose by each protocol, FOM (figure of merits) equation with normalized DLP was presented and the result was calculated. judged that the ratio of image quality and dose was excellent when the FOM maximized. Experimental results showed that protocol No. 21(120 kVp, 10 mm, 1.5 pitch) was the best, the organ with the highest effective dose was the brain(33.61 mGy). Among organs with high radiosensitivity, the thyroid gland was 0.78 mGy and breast 0.05 mGy. In conclusion, the optimal parameters and the organ dose in the protocol were also presented from the experiment, It may be helpful to clinicians who want to know the protocol about the optimum state of image quality and dose.

• Nuclear Engineering and Technology
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• v.52 no.12
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• pp.2821-2835
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• 2020

The phenomenon identification and ranking table (PIRT) is an important basis in the nuclear power plant (NPP) thermal-hydraulic analysis. This study focuses on the importance ranking of the input parameters when lacking the PIRT, and the target scenario is the small break loss of coolant accident (SBLOCA) in a pressurized water reactor (PWR) CPR1000. A total of 54 input parameters which might have influence on the figure of merit (FOM) were identified, and the sensitivity measure of each input on the FOM was calculated through an optimized moment-independent global sensitivity analysis method. The importance ranking orders of the parameters were transformed into the Savage scores, and the parameters were categorized based on the Savage scores. A parameter importance ranking table for the SBLOCA scenario of the CPR1000 reactor was obtained, and the influences of some important parameters at different break sizes and different accident stages were analyzed.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.35 no.1
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• pp.37-43
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• 2022

In this study, we investigated the optical, electrical and exothermic characteristics of ITO/Ag/ITO multilayer structures prepared with various Ag thicknesses on quartz and PI substrates. The transparent conducting properties of the ITO/Ag/ITO multilayer films depended on the thickness of the mid-layer metal film. The ITO/Ag (14 nm)/ITO showed the highest Haccke's figure of merit (FOM) of approximately 19.3×10^-3 Ω^-1. In addition, the exothermic property depended on the substrate. For an applied voltage of 3.7 V, the ITO/Ag (14 nm)/ITO multilayers on quartz and PI substrates were heated up to 110℃ and 200℃, respectively. The bending tests demonstrated a comparable flexibility of the ITO/Ag/IT multilayer to other transparent electrodes, indicating the potential of ITO/Ag/ITO multilayer as a flexible transparent conducting heater.

• Journal of the Korean Society for Heat Treatment
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• v.36 no.4
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• pp.193-197
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• 2023

Transparent and conducting titanium (Ti) doped indium oxide (TIO) thin films were deposited on the poly-imide (PI) substrate with radio frequency magnetron sputtering and then electron irradiation was conducted on the TIO film's surface to investigate the effect electron irradiation on the crystallization and opto-electrical properties of the films. All x-ray diffraction (XRD) pattern showed two diffraction peaks of the In₂O₂ (431) and (444) planes with regardless of the electron beam irradiation energy. In the AFM analysis, the surface roughness of as deposited films was 3.29 nm, while the films electron irradiated at 700 eV, show a lower RMS roughness of 2.62 nm. In this study, the FOM of as deposited TIO films is 6.82 × 10^-3 Ω^-1, while the films electron irradiated at 500 eV show the higher FOM value of 1.0 × 10^-2 Ω^-1. Thus, it is concluded that the post-deposition electron beam irradiation at 500 eV is the one of effective methods of crystallization and enhancement of opto-electrical performance of TIO thin film deposited on the PI substrate.