• Title/Summary/Keyword: FIB simulation

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Development of Inductively Coupled Plasma Gas Ion Source for Focused Ion Beam (유도결합형 플라즈마 소스를 이용한 집속 이온빔용 가스 이온원 개발)

  • Lee, Seung-Hun;Kim, Do-Geun;Kang, Jae-Wook;Kim, Tae-Gon;Min, Byung-Kwon;Kim, Jong-Kuk
    • Journal of the Korean Society for Precision Engineering
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    • v.28 no.1
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    • pp.19-23
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    • 2011
  • Recently, focused ion beam (FIB) applications have been investigated for the modification of VLSI circuit, the MEMS processing, and the localized ion doping, A multi aperture FIB system has been introduced as the demands of FIB applications for high speed and large area processing increase. A liquid metal ion source has problems, a large angular divergence and a metal contamination into a substrate. In this study, a gas ion source was introduced to replace a liquid metal ion source. The gas ion source generated inductively coupled plasma (ICP) in a quartz tube (diameter: 45 mm). Ar gas fed into the quartz was ionized by a 2 turned radio frequency antenna. The Ar ions were extracted by 2 extraction grids. The maximum extraction voltage was 10 kV. A numerical simulation was used to optimize the design of extraction grids and to predict an ion trajectory. As a result, the maximum ion current density was 38 $mA/cm^2$ and the spread of ion energy was 1.6 % for the extraction voltage.

Characteristics of electric field in the liquid metal ion source with a suppressor

  • Min, Boo-Ki;Cho, Byeong-Seong;Oh, Hyun-Joo;Kang, Seung-Oun;Choi, Eun-Ha
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.08a
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    • pp.283-283
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    • 2010
  • The liquid metal ion sources(LMIS) in FIB system have many advantages of high current density, high brightness and low ion energy spread. Most FIB systems use LMIS because the ion beam spot size of LMIS is smaller than other ion sources. LMIS is basically emitted by an extractor but the new electrode called the suppressor is able to control the emission current. We investigated characteristics LMIS with a suppressor, the function of the suppressor in LMIS, the change of the electric field by the suppressor and the advantages of using the suppressor. The characteristics of the threshold voltage and current-voltage (I-V) were observed under the varying extracting voltage with floated suppressor voltage, and under the varying suppressor voltages with fixed extractor voltage. We also simulated LMIS with the suppressor through CST(Computer Simulation Technology). The emission current increases as the suppressor voltage decreases because the suppressor voltage which restrains the electric field goes down, The threshold voltage increases as the suppressor voltage increases. We can explain characteristics and functions of LMIS with a suppressor using the electric field.

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A Study on the Forward Momentum of a Soft Recoil System (연식주퇴 시스템의 전방운동량에 관한 연구)

  • Park, Sun-Young;Bae, Jae-Sung;Hwang, Jai-Hyuk;Kang, Kuk-Jeong;Ahn, Sang-Tae
    • Journal of the Korea Institute of Military Science and Technology
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    • v.13 no.6
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    • pp.976-981
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    • 2010
  • A soft-recoil or FOOB (Fire-Out-Of-Battery) system can reduce the recoil force considerably. Its firing sequency is different from that of a conventional or FIB (Fire-In-Battery) system. In FOOB system, the gun is latched and preloaded in its battery position prior to firing. When unlatched, the gun is accelerated to the forward direction and then the forward momentum of the recoil part is generated. Since this momentum reduces the recoil impulse, the recoil force will decrease significantly. When designing the soft-recoil system it is important to design the forward momentum profile of a recoiling part. In the present study, the method to determine the forward momentum has been studied and its optimum value has been obtained theoretically. The numerical simulation of the soft-recoil system is performed to show that the present soft-recoil system works functionally well.

Monte-Carlo Simulation for Exposure and Development of Focused Ion Beam Lithography (집속이온빔 리소그라피 (Focused Ion Beam Lithography)외 노출 및 현상에 대한 몬데칼로 전산 모사)

  • Lee, Hyun-Yong;Kim, Min-Su;Chung, Hong-Bay
    • Proceedings of the KIEE Conference
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    • 1994.07b
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    • pp.1246-1249
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    • 1994
  • Thin amorphous film of $a-Se_{75}Ge_{25}$ acts as a positive resist in ion beam lithography. Previously, we reported the optical characteristics of amorphous $Se_{75}Ge_{25}$ thin film by the low-energy ion beam exposure and presented analytically calculated values such as ion range, ion concentration and ion transmission coefficient, etc. As the calculated results of analytical calculation, the energy loss per unit distance by $Ga^+$ ion is about $10^3[keV/{\mu}m]$ and nearly constant for all energy range. Especially, the projected range and struggling for 80 [KeV] $Ga^+$ ion energy are 0.0425[${\mu}m$] and 0.020[${\mu}m$], respectively. Hear, we present the results of Monte-Carlo computer simulation of Ga ion scattering, exposure and development in $a-Se_{75}Ge_{25}$ resist film for focused ion beam(FIB) lithography. Monte-Carlo method is based on the simulation of individual particles through their successive collisions with resist atoms. By the summation of the scattering events occurring in a large number N(N>10000) of simulated trajectories within the resist, the distribution for the range parameters is obtained. Also, the deposited energy density and the development pattern by a Gaussian or a rectangular ion beam exposure can be obtained.

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ndnSIM based NDN Network Implementation and Performance Evaluation (ndnSIM 기반 NDN 네트워크 구현 및 성능 평가)

  • Park, Sanghyeon;Lim, Huhnkuk
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.26 no.5
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    • pp.725-730
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    • 2022
  • Named Data Networking (NDN) is a representative technology of ICN that realizes the future Internet architecture. NDN searches for data by its content and not by its host IP address. The consumer generates an interest packet and sends it to the NDN network. The NDN network uses three tables such as CS, FIB, and PIT and forwards the received interest packet to the next hop. The producer transmits the data packet to the consumer through a name-based forwarding scheme. In this paper, we design and implement an ndnSIM-based NDN network and perform performance evaluation. We analyze the ndnSIM structure and develop a 6-node congested NDN network and a 9-node grid NDN network using ndnSIM. In the simulation, the performance of latency and throughput of the interest packet rate are measured. We analyze the effect of congestion on the latency and throughput of the NDN network. This approach will help researchers in the future.

Provider's Mobility Supporting Proactive Neighbor Pushing Scheme in CCN (CCN에서 정보제공자의 이동성 지원을 위한 푸싱 기법)

  • Woo, Taehee;Kwon, Taewook
    • Journal of the Korea Institute of Military Science and Technology
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    • v.19 no.6
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    • pp.721-729
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    • 2016
  • CCN(Content-Centric Network) enables users to retrieve content using the content's name. Researchers face critical challenges in terms of mobility. Since the routing information is part of the content name, when the provider moves, it is necessary to update all the routers routing information. However, this requires significant costs. In this paper, we propose PNPCCN(Proactive Neighbor Pushing CCN), considering the popularity and rarity of mobility support, for providers in CCN environments. Via simulation studies, we demonstrate that our solutions are effective in terms of shorter numbers of retransmitted Interest packets, and average download times and higher delivery ratios during mobility.

A Study on Control of a Soft Recoil System for Recoil Force Reduction (사격충격력 저감을 위한 연식주퇴계의 제어에 관한 연구)

  • Shin, Chul-Bong;Bae, Jae-Sung;Hwang, Jai-Hyuk;Kang, Kuk-Jeong
    • Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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    • 2007.11a
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    • pp.560-564
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    • 2007
  • In order to reduce the level of recoil force, new recoil technology must be employed. The present study discusses a soft-recoil mechanism that can reduce dramatically the recoil force. The dynamics of the soft-recoil system with hydraulic dampers are described and simulated. The results of the simulation show that FOOB system can reduce the recoil force and the recoil stroke compared to conventional systems. However, the FOOB system is not able to perform well when the fault modes happen. Hence, this study uses the MR damper to achieving FOOB under fault modes.

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A Study on Fault Mode Control of a Soft Recoil System (연식주퇴 시스템의 오류모드 제어기법에 관한 연구)

  • Shin, Chul-Bong;Bae, Jae-Sung;Hwang, Jai-Hyuk;Kang, Kuk-Jeong
    • Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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    • 2008.04a
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    • pp.255-259
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    • 2008
  • A soft-recoil system, which is a new technology, can dramatically reduce a recoil force. Due to the inaccurate explosion, various fault modes may happen. These fault modes can cause the serious damage of the recoil system and must be suppressed to avoid them. In the present study, the fault mode control method of the soft-recoil system is investigated. A hydraulic damper is working under normal mode and a MR damper is additionally working when the fault modes happen. In the design of the fault mode controller, the detection method of the fault mode is important as well as its suppression. The results of the simulation show that the soft-recoil system performs when the fault modes happen.

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Beam Focusing Performance of Electrostatic Lens using SIMION Simulator (SIMION 시뮬레이터를 이용한 정전렌즈의 빔 집속 성능)

  • Oh, Maeng-Ho;Jeong, In-Sung;Lee, Jong-Hang
    • Journal of the Korean Society for Precision Engineering
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    • v.26 no.4
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    • pp.128-133
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    • 2009
  • Focused-ion-beam (FIB) system is capable of both machining and measuring in nano-scale; hence nano-scale focusing quality is important. This paper investigates design parameters of two electrostatic lenses in order to achieve the best ion beam focusing performance. Commercial SIMION simulator is used to optimize the dimensions of the condenser and objective lenses and investigate the influence of assembly error on focusing quality The simulation results show that the beam focusing quality is not influenced by angle deviation within ${\pm}0.02\;deg$ and geometrical eccentricity within ${\pm}50$ micrometers.

The Characteristics of Focused Ion Beam Utilized Silicon Mold Fabrication on the Micro/Nano Scale (집속이온빔을 이용한 마이크로/나노스케일에서의 실리콘 금형 가공 특성)

  • Kim, Heung-Bae;Noh, Sang-Lai
    • Journal of the Korean Society for Precision Engineering
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    • v.28 no.8
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    • pp.966-974
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    • 2011
  • The use of ion beams in the micro/nano scale is greatly increased by technology development. Especially, focused ion beams (FIBs) have a great potential to fabricate the device in sub micro scale. Nevertheless, FIB has several limitations, surface swelling in low ion dose regime, precipitation of incident ions, and the redeposition effect due to the sputtered atoms. In this research, we demonstrate a way which can be used to fabricate mold structures on a silicon substrate using FIBs. For the purpose of the demonstration, two essential subjects are necessary. One is that focused ion beam diameter as well as shape has to be measured and verified. The other one is that the accurate rotational symmetric model of ion-solid interaction has to be mathematically developed. We apply those two, measured beam diameter and mathematical model, to fabricate optical lenses mold on silicon. The characteristics of silicon mold fabrication will be discussed as well as simulation results.