• Title/Summary/Keyword: Error function

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Noncentral F-Distribution for an M-ary Phase Shift Keying Wedge-Shaped Region

  • Kim, Jung-Su;Chong, Jong-Wha
    • ETRI Journal
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    • v.31 no.3
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    • pp.345-347
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    • 2009
  • This letter presents an alternative analytical expression for computing the probability of an M-ary phase shift keying (MPSK) wedge-shaped region in an additive white Gaussian noise channel. The expression is represented by the cumulative distribution function of known noncentral F-distribution. Computer simulation results demonstrate the validity of our analytical expression for the exact computation of the symbol error probability of an MPSK system with phase error.

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A Comparative Study for Several Bayesian Estimators Under Squared Error Loss Function

  • Kim, Yeong-Hwa
    • Journal of the Korean Data and Information Science Society
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    • v.16 no.2
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    • pp.371-382
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    • 2005
  • The paper compares the performance of some widely used Bayesian estimators such as Bayes estimator, empirical Bayes estimator, constrained Bayes estimator and constrained Bayes estimator by means of a new measurement under squared error loss function for the typical normal-normal situation. The proposed measurement is a weighted sum of the precisions of first and second moments. As a result, one can gets the criterion according to the size of prior variance against the population variance.

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Semiparametric Bayesian estimation under functional measurement error model

  • Hwang, Jin-Seub;Kim, Dal-Ho
    • Journal of the Korean Data and Information Science Society
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    • v.21 no.2
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    • pp.379-385
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    • 2010
  • This paper considers Bayesian approach to modeling a flexible regression function under functional measurement error model. The regression function is modeled based on semiparametric regression with penalized splines. Model fitting and parameter estimation are carried out in a hierarchical Bayesian framework using Markov chain Monte Carlo methodology. Their performances are compared with those of the estimators under functional measurement error model without semiparametric component.

Determination of Target Value under Automatic Vision Inspection Systems (자동시각검사환경하에서 공정 목표치의 설정)

  • 서순근;이성재
    • Journal of Korean Society for Quality Management
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    • v.29 no.3
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    • pp.66-78
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    • 2001
  • This paper deals with problem of determining process target value under automated visual inspection(AVI) system. Three independent error sources - digitizing error, illumination error, and positional error - which have a close relationship with the performance of the AVI system, are considered. Assuming that digitizing error is uniformly or normally distributed and illumination and positional errors are normally distributed, respectively, the distribution function for the error of measured lengths is derived when the length of a product is measured by the AVI system. Then, Optimal target values under two error models of AVI system are obtained by minimizing the total expected cost function which consists of give away, rework and penalty cost. To validate two process setting models, AVI system for drinks filling process is made up and test results are discussed.

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Maximization of Zero-Error Probability for Adaptive Channel Equalization

  • Kim, Nam-Yong;Jeong, Kyu-Hwa;Yang, Liuqing
    • Journal of Communications and Networks
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    • v.12 no.5
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    • pp.459-465
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    • 2010
  • A new blind equalization algorithm that is based on maximizing the probability that the constant modulus errors concentrate near zero is proposed. The cost function of the proposed algorithm is to maximize the probability that the equalizer output power is equal to the constant modulus of the transmitted symbols. Two blind information-theoretic learning (ITL) algorithms based on constant modulus error signals are also introduced: One for minimizing the Euclidean probability density function distance and the other for minimizing the constant modulus error entropy. The relations between the algorithms and their characteristics are investigated, and their performance is compared and analyzed through simulations in multi-path channel environments. The proposed algorithm has a lower computational complexity and a faster convergence speed than the other ITL algorithms that are based on a constant modulus error. The error samples of the proposed blind algorithm exhibit more concentrated density functions and superior error rate performance in severe multi-path channel environments when compared with the other algorithms.

Adaptive Learning Rate and Limited Error Signal to Reduce the Sensitivity of Error Back-Propagation Algorithm on the n-th Order Cross-Entropy Error (오류 역전파 알고리즘의 n차 크로스-엔트로피 오차신호에 대한 민감성 제거를 위한 가변 학습률 및 제한된 오차신호)

  • 오상훈;이수영
    • Journal of the Korean Institute of Telematics and Electronics C
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    • v.35C no.6
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    • pp.67-75
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    • 1998
  • Although the nCE(n-th order cross-entropy) error function resolves the incorrect saturation problem of conventional EBP(error back-propagation) algorithm, the performance of MLP's (multilayer perceptrons) trained using the nCE function depends heavily on the order of the nCE function. In this paper, we propose an adaptive learning rate to make the performance of MLP's insensitive to the order of the nCE error. Additionally, we propose a limited error signal of output node to prevent unstable learning due to the adaptive learning rate. The effectiveness of the proposed method is demonstrated in simulations of handwritten digit recognition and thyroid diagnosis tasks.

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Selection of a Predictive Coverage Growth Function

  • Park, Joong-Yang;Lee, Gye-Min
    • Communications for Statistical Applications and Methods
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    • v.17 no.6
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    • pp.909-916
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    • 2010
  • A trend in software reliability engineering is to take into account the coverage growth behavior during testing. A coverage growth function that represents the coverage growth behavior is an essential factor in software reliability models. When multiple competitive coverage growth functions are available, there is a need for a criterion to select the best coverage growth functions. This paper proposes a selection criterion based on the prediction error. The conditional coverage growth function is introduced for predicting future coverage growth. Then the sum of the squares of the prediction error is defined and used for selecting the best coverage growth function.

An recovery algorithm and error position detection in digital circuit mimicking by self-repair on Cell (세포의 자가 치료 기능을 모사한 디지털 회로에서의 오류위치 확인 및 복구 알고리즘)

  • Kim, Seok-Hwan;Hur, Chang-Wu
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2015.10a
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    • pp.842-846
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    • 2015
  • In this study, we propose an algorithm of the method of recovering quickly find the location of the error encountered during separate operations in the functional structure of complex digital circuits by mimicking the self-healing function of the cell. By the digital circuit was divided by 9 function block unit of function, proposes a method that It can quickly detect and recover the error position. It was the detection and recovery algorithms for the error location in the digital circuit of a complicated structure and could extended the number of function block for the $3{\times}3$ matrix structure on the digital circuit.

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An Error Detection and Recovery Algorithm in Digital Circuit Mimicking by Self-Repair on Cell (세포의 자가 치료 기능을 모사한 디지털 회로에서의 오류 검출 및 복구 알고리즘)

  • Kim, Soke-Hwan
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.19 no.11
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    • pp.2745-2750
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    • 2015
  • Abstract should be placed here In this study, we propose an algorithm of the method of recovering quickly find the location of the error encountered during separate operations in the functional structure of complex digital circuits by mimicking the self-healing function of the cell. By the digital circuit was divided by 9 function block unit of function, proposes a method that It can quickly detect and recover the error position. It was the detection and recovery algorithms for the error location in the digital circuit of a complicated structure and could extended the number of function block for the $3{\times}3$ matrix structure on the dital circuit.

A Study on the Performance Analysis of 4-ary Scaling Wavelet Shift Keying (4-ary 스케일링 웨이브릿 편이 변조 시스템의 성능 분석에 관한 연구)

  • Jeong, Tae-Il;Ryu, Tae-Kyung;Kim, Jong-Nam;Moon, Kwang-Seok;Kim, Hyun-Deok
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.14 no.5
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    • pp.1155-1163
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    • 2010
  • An algorithm of the conventional wavelet shift keying is carried out that the scaling function and wavelet are encoded to 1(mark) and 0(space) for the input binary data, respectively. Two bit modulation technique which uses four carrier frequencies is existed. Four carrier frequencies are defined as scaling function, inversed scaling function, wavelet, and inversed wavelet, which are encoded to 10, 11, 00 and 01, respectively. In this paper, we defined 4-ary SWSK (4-ary scaling wavelet shift keying) which is two bit modulation, and it is derived to the probability of bit error and symbol error of the defined system from QPSK. In order to analyze to the performance of 4-ary SWSK, we are obtained in terms of the probability of bit error and symbol error for QPSK (quadrature phase shift keying), MFSK(M-ary frequency shift keying) and proposed method. As a results of simulation, we confirmed that the proposed method was superior to the performance in terms of the probability of bit error and symbol error.