• Journal of the Korean Society for Precision Engineering
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• v.19 no.3
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• pp.137-143
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• 2002

This paper presents the In-process compensation to control cutter runout and improve the machined surface quality. Cutter runout compensation system consists of the micro-positioning servo system with piezoelectric actuator which is embeded in the sliding table to manipulate radial depth of cut in real-time. Cutting force feedback control was proposed in the angle domain based upon repetitive learning control strategy to eliminate chip load variation in end milling process. Micro-positioning control due to adaptive actuation force response improves the machined surface quality by compensation runout effect induced cutting force variation. This result will provide lots of information to build-up the preciswion machining technology.

• Journal of the Korean Society for Precision Engineering
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• v.12 no.3
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• pp.82-91
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• 1995

The purpose of this research is to develop a new real-time process control system. In this paper, a theoretical method for acquiring the control limit of cutting process(cutting surface) according to the required value(geometric tolerance) based on geometrical relations was propsed. In particular, the three following points are amphasized. Firstly, the process control was based on the cutting process, and the control limit was determined from the analysis of geometrical relations. Secondly, AMGD(Actual Measured Geometrical Deviation) was used as a new substitute value in process analysis. Thirdly, fuzzy reasoning was introduced to get the control limit flexibility according to the variations in the required value and general consideration of each measurememnt items.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.21 no.45
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• pp.237-246
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• 1998

In most statistical process control(SPC), control charts are used in which samples are taken and a suitable statistic is determined and plotted. In these control charts, control limits, ${\mu}{\pm}textsc{k{\sigma}}$, from which a decision is made are mostly ${\mu}{\pm}3{\sigma}$ and current literature in control charts are mainly concerned with detecting a shift in the mean. Therefore, when $\sigma$ is increased considerably after a long time, using control limits set at the first time causes a great deal of economic loss. In this paper the solutions to determine new control limits which maximizes the profit per unit produced and reduce $\sigma$ to economically optimal level for a certain cost when $\sigma$ is increased due to process deterioration are proposed. By applying new control limits, $\alpha$ error decreases considerably compared to apply initial control limits when $\sigma$ is increased due to process deterioration. Therefore, false alarm investigation cost drops down to the level of initial a error. And also this solution provides useful information regarding replacement of a process when the process is reviewed regularly.

• Journal of Institute of Control, Robotics and Systems
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• v.4 no.2
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• pp.246-255
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• 1998

This paper presents a novel method for real-time malfunction detection of plasma etching process using EPD signal traces. First, many reference EPD signal traces are collected using monochromator and data acquisition system in normal etching processes. Critical points are defined by applying differentiation and zero-crossing method to the collected reference signal traces. Critical parameters such as intensity, slope, time, peak, overshoot, etc., determined by critical points, and frame attributes transformed signal-to symbol of reference signal traces are saved. Also, UCL(Upper Control Limit) and LCL(Lower Control Limit) are obtained by mean and standard deviation of critical parameters. Then, test EPD signal traces are collected in the actual processes, and frame attributes and critical parameters are obtained using the above mentioned method. Process malfunctions are detected in real-time by applying SPC(Statistical Process Control) method to critical parameters. the Real-time malfunction detection method presented in this paper was applied to actual processes and the results indicated that it was proved to be able to supplement disadvantages of existing quality control check inspecting or testing random-selected devices and detect process malfunctions correctly in real-time.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.39 no.2
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• pp.37-45
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• 2016

Control chart is representative tools of statistical process control (SPC). It is a graph that plotting the characteristic values from the process. It has two steps (or Phase). First step is a procedure for finding a process parameters. It is called Phase I. This step is to find the process parameters by using data obtained from in-controlled process. It is a step that the standard value was not determined. Another step is monitoring process by already known process parameters from Phase I. It is called Phase II. These control chart is the process quality characteristic value for management, which is plotted dot whether the existence within the control limit or not. But, this is not given information about the economic loss that occurs when a product characteristic value does not match the target value. In order to meet the customer needs, company not only consider stability of the process variation but also produce the product that is meet the target value. Taguchi's quadratic loss function is include information about economic loss that occurred by the mismatch the target value. However, Taguchi's quadratic loss function is very simple quadratic curve. It is difficult to realistically reflect the increased amount of loss that due to a deviation from the target value. Also, it can be well explained by only on condition that the normal process. Spiring proposed an alternative loss function that called reflected normal loss function (RNLF). In this paper, we design a new control chart for overcome these disadvantage by using the Spiring's RNLF. And we demonstrate effectiveness of new control chart by comparing its average run length (ARL) with ${\bar{x}}-R$ control chart and expected loss control chart (ELCC).

• Journal of the Korean Data and Information Science Society
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• v.15 no.2
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• pp.285-295
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• 2004

Statistical process control(SPC) and engineering process control(EPC) are two complementary strategies for quality improvement. An integrated process control(IPC) can use EPC to reduce the effect of predictable quality variations and SPC to monitor the process for detection of special causes. In this paper we assume an IMA(1,1) model as a disturbance process and an occurrence of a level shift in the process, and we consider the economic performance for applying an EWMA chart to monitor MMSE-controlled processes. The numerical results suggest that the IPC scheme in an IMA(1,1) disturbance model does not give additional advantages in the economic aspect.

• Journal of Korean Society for Quality Management
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• v.40 no.3
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• pp.327-336
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• 2012

Purpose: In this study, we research the hurdle rate method to suggest the robust control chart for a contaminated process less vulnerable to fault values than existing control charts. Methods: We produce the results of p, ARL values to compare the performance of two control charts, $\bar{x}-s$ that has been used typically and TM-TS that is suggested by this paper. We implement the simulation focusing on three cases, change of deviation, mean and both of them. Results: We draw a conclusion that the TM-TS control chart has better efficiency than $\bar{x}-s$ control chart over the three cases. Conclusion: We insist that applying TM-TS control chart for a polluted process is more effective than $\bar{x}-s$ control chart.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.22 no.52
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• pp.347-354
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• 1999

Statistical Process Control(SPC) which uses control charts is widely used to inspect and improve manufacturing process as a effective method. A parametric method is the most common in statistical process control. Shewhart chart was made under the assumption that measurements are independent and normal distribution. In practice, this assumption is often excluded, for example, in case of (equation omitted) chart, when the subgroup sample is small or correlation, it happens that measured data have bias or rejection of the normality test. A bootstrap method can be used in such a situation, which is calculated by resampling procedure without pre-distribution assumption. In this study, applying bootstrap percentile method to (equation omitted) chart, it is compared and evaluated standard process control limit with bootstrap percentile control limit. Also, under the normal and non-normal distributions, where parameter is 0.5, using computer simulation, it is compared standard parametric with bootstrap method which is used to decide process control limits in process quality.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1995.10a
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• pp.411-414
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• 1995

Statistical Process Control (SPC) is a set of methodologies for signaling the presence of undesired sources of variation in manufacturing processes. Expert System in SPC can serve as a valuable tool to automate the analysis and interpretation of control charts. In this paper we put forward a method of successful application of Expert System to SPC in manufacturing process.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.22 no.50
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• pp.55-63
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• 1999

Past studies on economic control charts for controlling process means assumed that the measures of a quality characteristic do not have measurement error. In practice, however, this assumption is frequently violated. In this paper, the economic design models of three control charts(Xbar control chart, Xbar control chart with warning limits, and CUSUM control chart) for controlling process means are developed on the assumption that the measures can have measurement error. The effects of measurement error on the process control cost and design parameters of three economic control charts are examined. According to the experiments done in this study, when measurement error exists, the economic CUSUM control chart has lower process control cost in comparison with two other control charts. When measurement error becomes larger, both the sample size and the sampling interval increase while the control limits decrease.