• 한국전기전자재료학회논문지
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• 제20권10호
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• pp.829-838
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• 2007

The stochiometric mix of evaporating materials for the $CdGa_2Se_4$ single crystal thin films was prepared from horizontal furnace. To obtain the single crystal thin films, $CdGa_2Se_4$ mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the Hot Wall Epitaxy (HWE) system. The source and substrate temperature were $630^{\circ}C$ and $420^{\circ}C$, respectively. The crystalline structure of single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD).The carrier density and mobility of $CdGa_2Se_4$ single crystal thin films measured from Hall effect by van der Pauw method are $8.27{\times}10^{17}\;cm^{-3},\;345\;cm^2/V{\cdot}s$ at 293 K. respectively. The temperature dependence of the energy band gap of the $CdGa_2Se_4$ obtained from the absorption spectra was well described by the Varshni's relation, $Eg(T)\;=\;2.6400\;eV\;-\;(7.721{\times}10^{-4}\;eV/K)T^2/(T+399\;K)$. After the as-grown single crystal $CdGa_2Se_4$ thin films were annealed in Cd-, Se-, and Ga -atmospheres, the origin of point defects of single crystal $CdGa_2Se_4$ thin films has been investigated by PL at 10 K. The native defects of $V_{Cd}$, $V_{Se}$, $Cd_{int}$, and $Se_{int}$ obtained by PL measurements were classified as donors or accepters. We concluded that the heat-treatment in the Cd-atmosphere converted single crystal $CdGa_2Se_4$ thin films to an optical p-type. Also, we confirmed that Ga in $CdGa_2Se_4/GaAs$ did not form the native defects because Ga in single crystal $CdGa_2Se_4$ thin films existed in the form of stable bonds.

• 암석학회지
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• 제10권3호
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• pp.202-211
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• 2001

루미네센스(luminescence)는 석영이나 장석 등과 같은 무기결정이 외부에서 에너지를 받아 흡수된 에너지를 빛으로 바꿔 외부에 방출하는 물리적인 현상이다. 가전자대(valence band)에 존재하는 하전입자들은 전리성 방사선에 의해 전자와 정공(hole)으로 이온화 되고, 이온화된 전자와 정공들은 결정 내에서 자유로이 움직이다가 결정 내에 존재하는 격자결함에 포획된다. 이러한 결정을 빛으로 여기하면 격자결함에 포획된 전자들이 결함에서 빠져 나와 발광중심(recombination center)에서 정공과 재결합하면서 빛을 동반하게 되는데, 이를 광 여기 루미네센스(optically stimulated luminescence; OSL)라 한다. 열 루미네센스(thermoluminescence; TL) 연대 측정법의 원리와 같이, 광 여기 루미네센스를 적당한 조건에서 관측하면 퇴적층의 연대 계산에 응용할 수 있다. 광 여기 루미네센스를 연대측정에 이용하면 빛에 민감한 전자들만 여기시킬 수 있는 장점이 있다. 이 연구에서는 신기 퇴적층으로부터 분리된 석영을 청색 파장의 빛으로 여기하여 그로부터 검출된 광 여기 루미네센스를 신기 퇴적층의 연대 산출에 응용하였다. 논문에서는 광 여기 루미네센스 연대측정법과 관련된 일련의 실험방법 및 최근에 소개된 연구성과, 그리고 앞으로 보다 신뢰도 높은 연대측정 결과를 얻기 위해 연구되어야 할 내용을 이 연구에서 수행한 신기 퇴적층의 연대측정 결과와 함께 기술하였다.

• 비파괴검사학회지
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• 제25권2호
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• pp.117-126
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• 2005

[ $AgGaS_2$ ] 단결정 박막을 수평 전기로에서 합성한 $AgGaS_2$ 다결정을 증발원으로하여, hot wall epitaxy(HWE) 방법으로 증발원과 기판 (반절연성 -GaAs (100))의 온도를 각각 $590^{\circ}C,\;440^{\circ}C$로 고정하여 성장하였다. 이때 단결정 박막의 결정성은 광발광 스펙트럼과 이중결정 X-선 요동곡선 (DCRC)으로 부터 구하였다. $AgGaS_2$의 광흡수 스펙트럼으로부터 구한 온도에 의존하는 에너지 밴드갭 $E_g(T)$는 Varshni. 공식에 fitting한 결과 $E_g(T)=2.7284 eV-(8.695{\times}10^{-4}eV/K)T^2/T(T+332K)$를 잘 만족하였다. 성장된 $AgGaS_2$, 단결정 박막을 Ag, Ga, S분위기에서 각각 열처리하여 10K에서 photoluminescience(PL) spectrum을 측정하여 점 결함의 기원을 알아보았다. PL 측정으로부터 얻어진 $V_{Ag},\;V_s,\;Ag_{int}$, 그리고 $S_{int}$는 주개와 받개로 분류되어졌다. $AgGaS_2$ 단결정 박막을 Ag분위기에서 열처리하면 n형으로 변환됨을 알 수 있었다. 또한, Ca 분위기에서 열처리하면 열처리 이전의 PL스펙트럼을 보이고 있어서, $AgGaS_2$ 단결정 박막에서 Ga은 안정된 결합의 형태로 있기 때문에 자연 결함의 형성에는 관련이 없음을 알았다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2005년도 추계학술대회 논문집 Vol.18
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• pp.111-112
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• 2005

To obtain the single crystal thin films, $CuInSe_2$, mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the hot wail epitaxy (HWE) system. The source and substrate temperatures were 620$^{\circ}C$ and 410$^{\circ}C$, respectively. The crystalline structure of the single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). The carrier density and mobilily of $CuInSe_2$ single crystal thin films measured with Hall effect by van der Pauw method are $9.62\times10^{16}$ $cm^{-3}$ and $296cm^2/V{\cdot}s$ at 293 K, respectively. The temperature dependence of the energy band gap of the CulnSe$_2$ obtained from the absorption spectra was well described by the Varshni's relation E$_g$(T) = 1.1851 eV - ($8.99\times10^{-4}$ ev/K)T$_2$/(T + 153K). After the as-grown $CuInSe_2$ single crystal thin films was annealed in Cu-, Se-, and In-atmospheres the origin of point defects of $CuInSe_2$ single crystal thin films has been investigated by the photoluminescence(PL) at 10 K. The nat ive defects of V$_{Cu}$, $V_{Se}$, Cu$_{int}$, and $Se_{int}$ obtained by PL measurements were classified as a donors or accepters type. And we concluded that the heat-treatment in the Cu-atmosphere converted $CuInSe_2$ single crystal thin films to an optical n-type. Also, we confirmed that In in $CuInSe_2$/GaAs did not form the native defects because In in $CuInSe_2$ single crystal thin films existed in the form of stable bonds.

• 한국소음진동공학회:학술대회논문집
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• 한국소음진동공학회 2013년도 춘계학술대회 논문집
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• pp.835-841
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• 2013

Modern solid-state gyroscopes (HRG) with hemispherical resonators from high-purity quartz glass and special surface superfinishing and ultrathin gold coating become the best instruments for precise-grade inertial reference units (IRU) targeting long-term space missions. Designing of these sensors could be a notable contribution into development of Korea as a space nation. In participial, 40mm diameter thin-shell resonator from high-purity fused quartz, fabricated as a single-piece with its supporting stem has been designed, machined, etched, tuned, tested, and delivered by STM Co. (ATS of Ukraine) several years ago; an extremely-high Q-factor (upto 10~20 millions) has been shown. Understanding of the best way how to match such a unique sensor with inner glass assembly of the gyro means how to use the high potential in a maximal extent; and this has become the urgent task. Inner quartz glass assembly has a very thin indium (In) layer soldered the resonator and its silica base (case), but effects of internal resonances between operational modal pair of the shell-cup and its side (parasitic) modes can notable degrade the potential of the sensor as a whole, instead of so low level of resonator's intrinsic losses. Unfortunately, there are special combinations of dimensions of the parts (so-called, "resonant sizes"), when intensive losses of energy occurs. The authors proposed to use the length of stem's fixture as an additional design parameter to avoid such cases. So-called, a cyclic scheme of finite element method (FEM) and ANSYS software were employed to estimate different combinations of gyro assembly parameters. This variant has no mismatches of numerical origin due to FEM's discrete mesh. The optimum length and dangerous "resonant lengths" have been found. The special attention has been paid to analyses of 3D effects in a cup-stem transient zone, including determination of a difference between the positions of geometrical Pole of the resonant hemisphere and of its "dynamical Pole", i.e., its real zone of oscillation node. Boundary effects between the shell (cup) and 3D short "beams" (inner and outer stems) have been ranged. The results of the numerical experiments have been compared with the classic model of a quasi-hemispherical shell band with inextensional midsurface, and the solution using Rayleigh's functions of the $1^{st}$ and $2^{nd}$ kinds. To guarantee the truth of the recommended sizes to a designer of the real device, the analytical and FEM results have been compared with experimental data for a party of real resonators. The consistency of the results obtained by different means has been shown with errors less than 5%. The results notably differ from the data published earlier by different researchers.

• 공업화학
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• 제28권5호
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• pp.547-553
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• 2017

본 연구는 $TiO_2$ 골격에 Pd을 삽입시켰을 때 나타나는 광 촉매 성능의 차이에 초점을 두고, $TiO_2$와 x mol% $Pd-TiO_2$(x = 0.25, 0.5, 0.75 그리고 1.0)의 5가지 촉매를 제안하였다. 전형적인 졸-겔 방법을 사용하여 촉매를 합성하고 각 촉매의 페놀 광 분해 성능을 평가하였다. XRD, TEM, SEM/EDS, UV/Vis 분광법, 광 발광 분광법 등을 이용하여 촉매의 물리화학적 특성을 확인하였고, 광 발광 분광법 및 광 전류 측정으로 광학적 특성을 확인하였다. Pd 이온을 첨가하면 촉매의 밴드 갭이 감소하고, 광 생성된 전자와 정공 사이의 전하 분리가 쉽게 발생한다. 결과적으로, 0.75 mol% $Pd-TiO_2$ 촉매상의 페놀 광 분해 성능은 순수한 $TiO_2$보다 3배 더 높았는데, 이는 광 촉매 반응 중에 Pd 이온이 전자캡쳐 역할을 하여 일어난 결과로 여겨진다.

• 지구물리와물리탐사
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• 제2권4호
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• pp.184-190
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• 1999

가스 하이드레이트는 전세계적으로 새로운 에너지 자원으로 활용 가능성을 포함하고 있어 연구가 활발하게 진행되고 있다. 한국자원연구소에서는 1997년 부터 동해에서 메탄 하이드레이트 부존 잠재력 규명을 위한 탄성파 탐사를 하고 있다. 탄성파 자료에서 하이드레이트 부존을 의미하는 일반적인 특성은 해저면과 평행하게 나타나는 BSR(Bottom Simulating Reflection)과 BSR 상부에서 보이는 진폭감소 그리고 BSR 하부에서 보이는 진폭증가와 구간속도의 감소 그리고 BSR에서 반사파의 역전현상 등이 있다. 따라서 위와 같은 하이드레이트 부존특성을 탐지하기 위한 목적으로 실시되는 자료처리는 진 진폭을 유지하는 자료처리, 정밀 속도분석 및 AVO분석 등이 요구된다. 본 연구는 1998년 동해에서 취득된 탄성파 탐사자료를 처리하여 하이드레이트 부존 가능성을 확인하고자 하였다. 적용된 자료처리 공정은 구형확산 보정과 주파수 필터링, 공심점 분류, 정밀 속도분석 공정 등이다. AVO분석은 이용된 현장자료가 AVO를 분석할 정도의 입사각을 유지하고 있지 않아 제외하였다. 정밀 속도분석은 반복적으로 속도 스펙트럼을 구하는 방법으로 정확한 중합속도 결정이 가능한 XYA를 이용하였으며 자료처리의 모든 공정은 국내고유의 탄성파 자료처리 소프트웨어인 Geobit 2.9.5 를 이용하였다. 자료처리 결과 음원위치 $1650\~1900$에서 해저면으로 부터 약 $367\~477m$ 깊이(왕복주시 약 1800ms)에 해저면과 평행하게 발달한 BSR을 확인할 수 있었으며, BSR부근에서 구간속도 감소 뿐만 아니라 해저면 반사파의 위상과 반대인 반사파 역전현상도 확인할 수 있었다.

• 한국세라믹학회지
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• 제40권11호
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• pp.1078-1084
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• 2003

비선형 광학재료 및 광촉매를 개발하기 위하여, $Na_2$O-Nb$_2$ $O_{5}$-Te $O_2$계 유리를 일반적인 용융 및 급냉하는 방법으로 제조하였다. 그리고 $Na_2$O-Nb$_2$ $O_{5}$-Te $O_2$계 유리의 광학적 성질과 나노-결정화거동을 조사하였다. $Na_2$O-Nb$_2$ $O_{5}$-Te $O_2$계 유리의 광학적 성질과 물리적 성질은 다음과 같다. 굴절률(n) 은 2.04$\pm$0.04, 밀도(g/㎤)는 4.87$\pm$0.58, 광 에너지 밴드(eV)는 3.14$\pm$0.04이였다. 나노결정으로 구성된 투명한 결정화유리는 3$50^{\circ}C$에서 l시간 열처리한 후, 이것을 다시 40$0^{\circ}C$에서 l 시간 열처리하여 얻었다. 나노결정으로 구성된 Cubie 결정상은 47$0^{\circ}C$ 이상의 온도에서 새로운 결정상으로 변화하였다.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2009년도 제38회 동계학술대회 초록집
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• pp.14-15
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• 2010

Recently there has been growing interest in topological insulators or the quantum spin Hall (QSH) phase, which are insulating materials with bulk band gaps but have metallic edge states that are formed topologically and robust against any non-magnetic impurity [1]. In a three-dimensional material, the two-dimensional surface states correspond to the edge states (topological metal) and their intriguing nature in terms of electronic and spin structures have been experimentally observed in bulk Bi1-xSbx single crystals [2,3,4]. However, if we want to know the transport properties of these topological metals, high purity samples as well as very low temperature will be needed because of the contribution from bulk states or impurity effects. In a recent report, it was also shown that an intriguing coupling between the surface and bulk states will occur [5]. A simple solution to this bothersome problem is to prepare a topological metal on an ultrathin film, in which the surface-to-bulk ratio is drastically increased. Therefore in the present study, we have investigated if there is a method to make an ultrathin Bi1-xSbx film on a semiconductor substrate. From reflection high-energy electron diffraction observation, it was found that single crystal Bi1-xSbx films (0${\sim}30\;{\AA}A$ can be prepared on Si(111)-$7{\times}7$. The transport properties of such films were characterized by in situ monolithic micro four-point probes [6]. The temperature dependence of the resistivity for the x=0.1 samples was insulating when the film thickness was $240\;{\AA}A$. However, it became metallic as the thickness was reduced down to $30\;{\AA}A$, indicating surface-state dominant electrical conduction. Figure 1 shows the Fermi surface of $40\;{\AA}A$ thick Bi0.92Sb0.08 (a) and Bi0.84Sb0.16 (b) films mapped by angle-resolved photoemission spectroscopy. The basic features of the electronic structure of these surface states were shown to be the same as those found on bulk surfaces, meaning that topological metals can be prepared at the surface of an ultrathin film. The details will be given in the presentation.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2013년도 제45회 하계 정기학술대회 초록집
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• pp.99-99
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• 2013

In this talk, I will present two research works in progress, which are: i) mapping of piezoelectric polarization and associated charge density distribution in the heteroepitaxial InGaN/GaN multi-quantum well (MQW) structure of a light emitting diode (LED) by using inline electron holography and ii) in-situ observation of the polarization switching process of an ferroelectric Pb(Zr1-x,Tix)O3 (PZT) thin film capacitor under an applied electric field in transmission electron microscope (TEM). In the first part, I will show that strain as well as total charge density distributions can be mapped quantitatively across all the functional layers constituting a LED, including n-type GaN, InGaN/GaN MQWs, and p-type GaN with sub-nm spatial resolution (~0.8 nm) by using inline electron holography. The experimentally obtained strain maps were verified by comparison with finite element method simulations and confirmed that not only InGaN QWs (2.5 nm in thickness) but also GaN QBs (10 nm in thickness) in the MQW structure are strained complementary to accommodate the lattice misfit strain. Because of this complementary strain of GaN QBs, the strain gradient and also (piezoelectric) polarization gradient across the MQW changes more steeply than expected, resulting in more polarization charge density at the MQW interfaces than the typically expected value from the spontaneous polarization mismatch alone. By quantitative and comparative analysis of the total charge density map with the polarization charge map, we can clarify what extent of the polarization charges are compensated by the electrons supplied from the n-doped GaN QBs. Comparison with the simulated energy band diagrams with various screening parameters show that only 60% of the net polarization charges are compensated by the electrons from the GaN QBs, which results in the internal field of ~2.0 MV cm-1 across each pair of GaN/InGaN of the MQW structure. In the second part of my talk, I will present in-situ observations of the polarization switching process of a planar Ni/PZT/SrRuO3 capacitor using TEM. We observed the preferential, but asymmetric, nucleation and forward growth of switched c-domains at the PZT/electrode interfaces arising from the built-in electric field beneath each interface. The subsequent sideways growth was inhibited by the depolarization field due to the imperfect charge compensation at the counter electrode and preexisting a-domain walls, leading to asymmetric switching. It was found that the preexisting a-domains split into fine a- and c-domains constituting a $90^{\circ}$ stripe domain pattern during the $180^{\circ}$ polarization switching process, revealing that these domains also actively participated in the out-of-plane polarization switching. The real-time observations uncovered the origin of the switching asymmetry and further clarified the importance of charged domain walls and the interfaces with electrodes in the ferroelectric switching processes.