• 태양에너지
• /
• 제15권2호
• /
• pp.91-99
• /
• 1995

분무열분해법으로 $SnO_2$ 박막을 증착하여 반응변수들이 증착에 미치는 영향을 연구하였다. 분무용액의 농도가 0.01M인 경우 증착온도가 낮을 때에는 증착과정이 표면반응의 지배를 받으며 증착온도가 증가함에 따라 $400^{\circ}C$까지는 물질전달의 지배율이 증가한다. $400^{\circ}C$ 이상에서는 분무압력이 낮을 때는 물질전달의 지배율이 증가한다. $400^{\circ}C$ 이상에서는 분무압력이 낮을 때는 물질전달에 의해, 분무압력이 높을 때는 표면반응에 의해 지배를 받는다. 분무용액의 농도가 증가함에 따라 증착속도는 증가하였으며 본 실험의 경우 Rideal-Eley 기구에 의해 증착반응이 일어났다. 기판의 온도가 증가함에 따라 증착속도는 증가하다가 $400^{\circ}C$ 이상에서는 균일한 핵생성에 의하여 증착속도는 감소하였다. 분무지속 시간에 비례하여 증착층의 두께는 증가하였으며 기판과 증착층간에는 물리적인 접착을 이루고 있다.

• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2012년도 제43회 하계 정기 학술대회 초록집
• /
• pp.78-78
• /
• 2012

In this presentation I will review the expanding thermal plasma chemical vapour deposition (ETP-CVD) technology, a deposition technology capable of reaching ultrahigh deposition rates. High rate deposition of a-Si:H, ${\mu}c$-Si:H, a-SiNx:H and silicon nanocrystals will be discussed and their various applications, mainly for photovoltaic applications demonstrated. An important aspect over the years has been the fundamental investigation of the growth mechanism of these films. The various in situ (plasma) and thin film diagnostics, such as Langmuir probes, retarding field analyzer, (appearance potential) mass spectrometry and cavity ring absorption spectroscopy, spectroscopic ellipsometry to name a few, which were successfully applied to measure radical and ion density, their temperature and kinetic energy and their reactivity with the growth surface. The insights gained in the growth mechanism provided routes to novel applications of the ETP-CVD technology, such as the ultrahigh high growth rate of silicon nanorystals and surface passivation of c-Si surfaces.

• 대한전기학회논문지:전기물성ㆍ응용부문C
• /
• 제52권4호
• /
• pp.169-172
• /
• 2003

Silicon nanocrystalline thin films on p-type (100) silicon substrate have been fabricated by pulsed laser deposition technique using a Nd:YAG laser with the wavelength of 355, 532, and 1064 nm. The base vacuum in the chamber was down to $10^-6$ Torr and the laser energy densities were 1.0~3.0 J/$\textrm{cm}^2$ After deposition, silicon nanocrystalline thin films have been annealed at nitrogen gas. Strong Blue and green luminescence from silicon nanocrystalline thin films have been observed at room temperature by photoluminescence and its peak energies shift to green when the wavelength is increased from 355 to 1064 nm.

• E2M - 전기 전자와 첨단 소재
• /
• 제9권8호
• /
• pp.776-782
• /
• 1996

The electrical properties of vapor deposition polymerized polymide thin films for getting an in-line system with manufacturing process of semiconductor device, have been studied. Polyimide thin films fabricated by vapor deposition polymerization(VDP) method based on PMDA and 4,4'-DDE monomer were confirmed by FT-IR spectra. It is found that the major conduction carriers of thin films are ions, and the hopping length of ions is almost same with monomer length at the temperature over 120.deg. C through the analysis of electrical conduction mechanism. Also, The activation energy is about 0.69 eV at the temperature of >$30^{\circ}C$ - >$150^{\circ}C$ and it is shown that the resistivity at which thin films can be used as an insulating film between layers of semiconductor device, is 3.2*10$^{15}$ .ohm.cm.

• Applied Science and Convergence Technology
• /
• 제23권1호
• /
• pp.40-43
• /
• 2014

We investigated the growth characteristics and interfacial properties of $HfO_2$ films deposited on Ge substrate through atomic layer deposited (ALD) by using an in-situ medium energy ion scattering analysis. The growth kinetics of $HfO_2$ grown on a $GeO_2/Ge$ substrate through ALD is similar to that grown on an $SiO_2/Si$ substrate. However, the incubation period of $HfO_2$ deposition on Ge is shorter than that on Si. The $HfO_2$ grown on the GeO/Ge substrate shows a significant diffusion of Hf atoms into the substrate interface and GeO volatilization after annealing at $700^{\circ}C$. The presence of low-quality Ge oxide or suboxide may degrade the electrical performance of device.

• Nuclear Engineering and Technology
• /
• 제35권2호
• /
• pp.171-177
• /
• 2003

A dynamic compartment model was required for the prediction of radiological consequences of the tritiated vapor released from the nuclear facility after an accident. A computer code, ECOREA-T, was developed by incorporating the unit models for the evaluation of tritium behavior in the environment. Dry deposition of tritiated vapor from the atmosphere to the soil was calculated using a deposition velocity. Transport of tritium from the atmosphere to the plant was calculated using a specific activity model, and the result was compared with the Belot's analytic solution. Root uptake of tritiated water from the soil and formation of OBT from T were considered in the model. The ECOREA-T code was verified by comparing the results from the other computer codes using a scenario developed through BIOMOVS II study. The results showed good agreements.

• 한국방사성폐기물학회:학술대회논문집
• /
• 한국방사성폐기물학회 2017년도 춘계학술논문요약집
• /
• pp.169-170
• /
• 2017

• 한국전기전자재료학회논문지
• /
• 제26권10호
• /
• pp.754-759
• /
• 2013

Aluminum oxide($Al_2O_3$) film deposited by atomic layer deposition (ALD) is known to supply excellent surface passivation properties on crystalline Si surfaces. Since $Al_2O_3$ has fixed negative charge, it forms effective surface passivation by field effect passivation on the rear side in p-type silicon solar cell. However, $Al_2O_3$ layer formed by ALD process needs very long process time, which is not applicable in mass production of silicon solar cells. In this paper, plasma-assisted ALD(PA-ALD) was applied to form $Al_2O_3$ to reduce the process time. $Al_2O_3$ synthesized by ALD on c-Si (100) wafers contains a very thin interfacial $SiO_2$ layer, which was confirmed by FTIR and TEM. To improve passivation quality of $Al_2O_3$ layer, the deposition temperature was changed in range of $150{\sim}350^{\circ}C$, then the annealing temperature and time were varied. As a result, the silicon wafer with aluminum oxide film formed in $250^{\circ}C$, $400^{\circ}C$ and 10 min for the deposition temperature, the annealing temperature and time, respectively, showed the best lifetime of 1.6ms. We also observed blistering with nanometer size during firing of $Al_2O_3$ deposited on p-type silicon.

• 한국수소및신에너지학회논문집
• /
• 제28권6호
• /
• pp.610-617
• /
• 2017

This paper presents a study of the effect of thickness of porous Al-Ni electrodes, on the Hydrogen Evolution Reaction (HER) in alkaline media. As varying deposition time at 300 W DC sputtering power, the thickness of the Al-Ni electrodes was controlled from 1 to $20{\mu}m$. The heat treatment was carried out in $610^{\circ}C$, followed by selective leaching of the Al-rich phase. XRD studies confirmed the presence of $Al_3Ni_2$ intermetallic compounds after the heat treatment, indicating the diffusion of Ni from the Ni-rich phase to Al-rich phase. The porous structure of the Al-Ni electrodes after the selective leaching of Al was also confirmed in SEM-EDS analysis. The double layer capacitance ($C_{dl}$) and roughness factor ($R_f$) of the electrodes were increased for the thicker Al-Ni electrodes. As opposed to the general results in above, there were no further improvements of the HER activity in the case of the electrode thickness above $10{\mu}m$. This result may indicate that the $R_f$ is not the primary factor for the HER activity in alkaline media.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 2007년도 Techno-Fair 및 추계학술대회 논문집 전기물성,응용부문
• /
• pp.112-113
• /
• 2007

We synthesize ZnO nanowires (NWs) doped with 3 wt% Ga on sapphire substrate using a hot-walled pulsed laser deposition (PLD) system named PLD in Furnace. A proprietary target rotating system is employed in the furnace to ensure the homogeneity of the deposition. The kinetic energy of the laser-ablazed ZnO is controlled for the optimization of NW formation. The physical properties of the resultant NWs are presented.