• Applied Microscopy
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• 제35권1호
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• pp.1-13
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• 2005

전자현미경 관찰에 있어서 최종적인 목표는 정확한 정보를 포함하는 좋은 사진을 얻는 것이라 할 수 있다. 이를 위하여는 사진에 인공물이 포함되지 않도록 표본의 채취, 처리, 관찰 및 사진 작업 등 모든 단계에서 주의를 기울여야 한다. 본 고에서는 통상적인 전자현미경 관찰을 위한 시료의 채취로부터 사진의 현상, 인화에 이르는 여러 단계에서 발생될 수 있는 인공물들과 그 원인을 살펴 보고 해결책을 제시함으로써 전자현미경 관찰을 위한 표본의 올바른 제작과 미세구조의 해석에 도움을 주고자 하였다.

• 한국미생물·생명공학회지
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• 제15권2호
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• pp.95-97
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• 1987

Streptomyces mitakaensis 균사체를 lysozyme으로 처리하여 원형질체를 형성하면서 형태변이를 전자현미경으로 관찰하였다. 정상 균사체는 균사를 형성하고 포자를 형성했으며, 세포벽과 세포막이 완전한 상태로 나타났으나, lysozyme을 처리한 후에는 균사체 말단에서 단일세포가 분리되고, 세포벽이 분리되기 시작하여 30분-60분 후에는 원래 세포의 약 3배 이상 팽대한 원형질체를 관찰할 수 있었다.

• Applied Microscopy
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• 제28권4호
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• pp.477-490
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• 1998

Most spiders have four pairs of simple eyes. A few families of the spider have their developed eyes to an extent visual cues make up a significant of information to response from the external stimuli. Most spiders respond to the external stimuli around them. Specially, they are very sensitive to vibrations from the air, the ground, their webs, or even the surface of water. The present study was undertaken to examine the evolutionary development and function of eye with the observation of visual ultrastructure of Atypus coreanus Kim, 1985 using the electron microscopy. They have weak mobility, limited territory and low developed eyes. Atypus coreanus was collected from Mt. Ungil, Namyangju-gun, Kyonggi province. The fine structure of these eyes was examined by electron microscopy, and prepard by teasing method for scanning electron microscopic observation. As a result, the eyes of Atypus coreanus was composed of cornea, lens, vitreous body, retina, and rhabdome.

• Applied Microscopy
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• 제52권
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• pp.4.1-4.11
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• 2022

Field emission scanning electron microscopy (FESEM) is an essential tool for observing surface details of specimens in a high vacuum. A series of specimen procedures precludes the observations of living organisms, resulting in artifacts. To overcome these problems, Takahiko Hariyama and his colleagues proposed the concept of the "nanosuit" later referred to as "NanoSuit", describing a thin polymer layer placed on organisms to protect them in a high vacuum in 2013. The NanoSuit is formed rapidly by (i) electron beam irradiation, (ii) plasma irradiation, (iii) Tween 20 solution immersion, and (iv) surface shield enhancer (SSE) solution immersion. Without chemical fixation and metal coating, the NanoSuit-formed specimens allowed structural preservation and accurate element detection of insulating, wet specimens at high spatial resolution. NanoSuit-formed larvae were able to resume normal growth following FESEM observation. The method has been employed to observe unfixed and uncoated bacteria, multicellular organisms, and paraffin sections. These results suggest that the NanoSuit can be applied to prolong life in vacuo and overcome the limit of dead imaging of electron microscopy.

• 한국전자현미경학회:학술대회논문집
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• 한국현미경학회 2005년도 제36차 추계학술대회 및 제4회 HVEM 이용자 워크샵
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• pp.144-146
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• 2005

• Applied Microscopy
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• 제51권
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• pp.19.1-19.7
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• 2021

The main purpose of this paper is the preparation of transmission electron microscopy (TEM) samples from the microsized powders of lithium-ion secondary batteries. To avoid artefacts during TEM sample preparation, the use of ion slicer milling for thinning and maintaining the intrinsic structure is described. Argon-ion milling techniques have been widely examined to make optimal specimens, thereby making TEM analysis more reliable. In the past few years, the correction of spherical aberration (Cs) in scanning transmission electron microscopy (STEM) has been developing rapidly, which results in direct observation at an atomic level resolution not only at a high acceleration voltage but also at a deaccelerated voltage. In particular, low-kV application has markedly increased, which requires a sufficiently transparent specimen without structural distortion during the sample preparation process. In this study, sample preparation for high-resolution STEM observation is accomplished, and investigations on the crystal integrity are carried out by Cs-corrected STEM.

• Applied Microscopy
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• 제48권4호
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• pp.122-125
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• 2018

The focused ion beam (FIB) method is widely used to prepare specimens for observation by transmission electron microscopy (TEM), which offers a wide variety of imaging and analytical techniques. TEM has played a significant role in material investigation. However, the FIB method induces amorphization due to bombardment with the high-energy gallium ($Ga^+$) ion beam. To solve this problem, electron beam induced deposition (EBID) is used to form a protective layer to prevent damage to the specimen surface. In this study, we introduce an optimized TEM specimen preparation procedure by comparing the EBID of carbon and tungsten as protective layers in FIB. The selection of appropriate EBID conditions for preparing specimens for TEM analysis is described in detail.

• Applied Microscopy
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• 제48권4호
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• pp.130-131
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• 2018

Electron channeling contrast imaging (ECCI) is one of the imaging techniques in scanning electron microscopy based on a variation in electron backscattering yield depending on the direction of the primary electron beam with respect to the crystal lattice. The ECCI provides not only observation of the distribution of individual grains and grain boundaries but also identification of the defects such as dislocations, twins, and stacking faults. The ECCI at the interface between recrystallized and deformed region of shot peening treated nickel clearly demonstrates the microstructural evolution during the recrystallization including original grain boundaries, and thus can provide better insight into the recrystallization behavior.

• 한국표면공학회지
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• 제35권5호
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• pp.289-294
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• 2002

ZnTe films have been grown on (100) GaAs substrate with two representative problems. The one is lattice mismatch, the other is thermal expansion coefficients mismatch of ZnTe /GaAs. It claims here, the relationship of film thickness and defects distribution with (100) ZnTe/GaAs using hot wall epitaxy (HWE) growth was investigated by transmission electron microscopy (TEM). It analyzed on the two-sort side using TEM with cross-sectional transmission electron microscopy (XTEM) and high-resolution electron microscopy (HREM). Investigation into the nature and behavior of dislocations with dependence-thickness in (100) ZnTe/ (100) GaAs hetero-structures grown by transmission electron microscopy (TEM). This defects range from interface to 0.7 $\mu\textrm{m}$ was high density, due to the large lattice mismatch and thermal expansion coefficients. The defects of low density was range 0.7$\mu\textrm{m}$~1.8$\mu\textrm{m}$. In the thicker range than 1.8$\mu\textrm{m}$ was measured hardly defects.

• Applied Microscopy
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• 제43권2호
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• pp.88-97
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• 2013

Technical investigation to figure out the problems arising during in-situ heating electron backscatter diffraction (EBSD) analysis inside scanning electron microscopy (SEM) was carried out. EBSD patterns were successfully acquired up to $830^{\circ}C$ without degradation of EBSD pattern quality in steels. Several technical problems such as image drift and surface microstructure pinning were taking place during in-situ experiments. Image drift problem was successfully prevented in constant current supplying mode. It was revealed that the surface pinning problem was resulted from the $TiO_2$ oxide particle formation during heating inside SEM chamber. Surface pinning phenomenon was fairly reduced by additional platinum and carbon multi-layer coating before in-situ heating experiment, furthermore was perfectly prevented by improvement of vacuum level of SEM chamber via leakage control. Plane view in-situ observation provides better understanding on the overall feature of recrystallization phenomena and cross sectional in-situ observation provides clearer understanding on the recrystallization mechanism.