Transmission Electron Microscopy Specimen Preparation for Two Dimensional Material Using Electron Beam Induced Deposition of a Protective Layer in the Focused Ion Beam Method |
An, Byeong-Seon
(School of Advanced Materials Science & Engineering, Sungkyunkwan University)
Shin, Yeon Ju (Cooperative Center for Research Facilities, Sungkyunkwan University) Ju, Jae-Seon (Cooperative Center for Research Facilities, Sungkyunkwan University) Yang, Cheol-Woong (School of Advanced Materials Science & Engineering, Sungkyunkwan University) |
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