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Artifacts Frequently Encountered in Electron Micrographs  

Park, Chang-Hyun (Electron Microscope Facility, Korea University College of Medicine)
Cho, Kang-Yong (Department of Pathology, Anam Hospital, Korea University Medical Center, Korea University)
Uhm, Chang-Sub (Department of Anatomy, Korea Lung Tissue Bank, Korea University College of Medicine)
Publication Information
Applied Microscopy / v.35, no.1, 2005 , pp. 1-13 More about this Journal
Abstract
Fine photographs are essential in the electron microscopy. Artifacts can be introduced during all steps of electron microscopy; specimen processing, observation and printing. Every caution is necessary to avoid the artifact formation. In this review, the authors discussed the causes of various artifacts and suggested the solution to help the correct tissue handling and electron microscopic observations.
Keywords
Artifact; Development; Electron micrograph; Observation; Printing; Tissue processing;
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