• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 제5회 영호남 학술대회 논문집
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• pp.7-11
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• 2003

for many years already, testing laboratories, research institutes and manufactures try to find a reliable water tree accelerated ageing test that is able to show whether a polymer Medium Voltage cable os susceptible to water treeing or not. Test on laboratory samples, model cable designs, and fell size cable are presented. Apart form aging, another important aspect of any accelerated aging test is the right choice of th preconditioning method. THTS paper is the analysis of weibull distribution method after an accelerated aging test of MV(Medium Cable) cable.

• 전기학회논문지
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• 제64권4호
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• pp.592-597
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• 2015

3D-IC is a novel semiconductor packaging technique stacking dies to improve the performance as well as the overall size. TSV is ideal for 3D-IC because it is convenient for stacking and excellent in electrical characteristics. However, due to high-density and micro-size of TSVs, they should be tested with a non-invasive manner. Thus, we introduce a TSV test method on test prober without a direct contact in this paper. A capacitive coupling effect between a probe tip and TSV is used to discriminate small TSV faults like voids and pin-holes. Through EM simulation, we can verify the size of eye-patterns with various frequencies is good for TSV test tools and non-contact test will be promising.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2006년도 제37회 하계학술대회 논문집 C
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• pp.1343-1344
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• 2006

There have been numerous accelerated aging laboratory tests for evaluating suitability of polymeric materials and devices. Aging test for materials and its full scale device has been conducted. Service experience plays a key role in the utility section of composite insulators. A meaningful and reliable accelerated aging test is needed for evaluating composite insulator. During the service these insulators are subjected to aging stress such as humidity, pollution, and electrical field, and erosion and tracking of the weathershed occurs. This paper presents the criteria of reliability evaluation and evaluation facilities for 22.9 kV suspension composite insulator. We adopt the criteria of reliability evaluation consist of two test methods. One is CEA tracking wheel test for examining the tracking and erosion performance of composite insulator. The other is multi-stress aging test for examining effects of environmental factors such as UV, temperature, humidity, etc on composite insulator.

• 한국복합재료학회:학술대회논문집
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• 한국복합재료학회 2002년도 춘계학술발표대회 논문집
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• pp.109-113
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• 2002

Interfacial and electrical properties for the carbon fiber reinforced epoxy-amine terminated (AT) PEI composites were performed using microdroplet test and electrical resistance measurements. As AT PEI content increased, the fracture toughness of epoxy-AT PEI matrix increased, and IFSS was improved due to the improved toughness and energy absorption mechanisms of AT PEI. The microdroplet in the carbon fiber/neat epoxy composite showed brittle microfailure mode. At 15 wt% AT PEI content, ductile microfailure mode appeared because of improved fracture toughness. After curing, the changes of electrical resistance (ΔR) with increasing AT PEI content increased gradually because of thermal shrinkage. The matrix fracture toughness was correlated to IFSS, TEC and electrical resistance. In cyclic strain test, the maximum stress and their slope of the neat epoxy case were higher than those of 15 wt% AT PEI. The results obtained from electrical resistance measurements under curing process and reversible stress and strain were consistent well with matrix toughness properties.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 춘계학술대회 논문집 방전 플라즈마 유기절연재료 초전도 자성체연구회
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• pp.25-29
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• 2004

Corona on polymer materials causes deterioration by the combined action of the discharge striking the surface and the action of certain chemical compounds that are formed by the discharges. In the design and manufacture of polymer insulators must be sufficiently large to avoid corona discharges, otherwise a shielding or corona ring (grading ring) needs to be installed on the insulator. To conduct this purpose, many researchers have investigated end-fitting of polymer insulator by voltage distribution simulation and electrical test. Grading rings are used to improve the performance of the insulator in multiple ways. They can reduce corona and associated audible noise and radio influence and television interference. The factors determining the uses of a grading ring are line voltage, geometry and dimensions of end fittings, geometry and dimensions of line hardware, and environmental conditions. In this paper, electrical property of polymer insulator with end-fitting design have been investigated by electrical field analysis, various end-fitting design, tracking wheel test, corona inception voltage and extinction voltage. Electrical field analysis is conducted by FEM program and various end-fitting is designed through this result. Designed end-fittings are manufactured and their performance is conducted by electrical performance test.

• 대한전자공학회논문지SD
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• 제46권5호
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• pp.1-8
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• 2009

스캔 기반 테스트 방법은 큰 순차 회로를 테스트하기 위한 매우 효율적이며 널리 사용되는 방법이다. 그러나 스캔 기반 테스트 방법은 테스트 패턴을 긴 스캔 체인을 통해서 순차적으로 인가해야 하기 때문에 긴 테스트 인가 시간을 필요로 한다. 또한, 스캔 쉬프트 동작이 정상 동작과 비교할 때 전력 소모를 급격히 증가시킨다. 이러한 문제점을 해결하기 위해서, 본 논문에서는 테스트 패턴 인가 시간과 테스트시의 전력 소모를 줄이기 위한 새로운 스캔 구조를 제안한다. 제안하는 스캔 구조는 스캔 체인을 여러 개의 세그먼트로 분할하고 specified bit를 포함하지 않는 세그먼트들을 바이패스 한다. 바이패스 되는 스캔 세그먼트들은 테스트 패턴 인가 동작에서 제외되기 때문에 테스트 패턴 인가 시간과 테스트시의 소모 전력이 상당히 줄어들게 된다.

• Journal of Electrical Engineering and Technology
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• 제8권4호
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• pp.840-849
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• 2013

This paper presents a statistical approach to analyze electrical tree inception voltage, electrical tree breakdown voltage and tree breakdown time of unsaturated polyester resin subjected to AC voltage. The aim of this work was to show that Weibull and lognormal distribution may not be the most suitable distributions for analysis of electrical treeing data. In this paper, an investigation of statistical distributions of electrical tree inception voltage, electrical tree breakdown voltage and breakdown time data was performed on 108 leaf-like specimen samples. Revelations from the test results showed that Johnson SB distribution is the best fit for electrical tree inception voltage and tree breakdown time data while electrical tree breakdown voltage data is best suited with Wakeby distribution. The fitting step was performed by means of Anderson-Darling (AD) Goodness-of-fit test (GOF). Based on the fitting results of tree inception voltage, tree breakdown time and tree breakdown voltage data, Johnson SB and Wakeby exhibit the lowest error value respectively compared to Weibull and lognormal.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2009년도 제40회 하계학술대회
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• pp.2172_2173
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• 2009

UL 1699 규정에서 제시된 다양한 시험방법을 분류하고, 시험방법 중의 하나인 carbonized path arc clearing time test의 시험설비를 구축하였으며, 시험방법 및 절차에 대해 소개하였다. 또한 국내에서 개발되어진 cord 타입 AFCI를 대상으로 시험을 실시하였으며 시험결과 국내에서 개발되어진 cord 타입의 AFCI는 부하전류 3[A]에서도 아크고장을 검출하며 모든 시험전류에서 적합하게 아크를 차단하는 것을 알 수 있었다.

• 품질경영학회지
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• 제46권2호
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• pp.311-326
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• 2018

Purpose: Using international specifications, this study classified international standards and automobile manufacturers' test items based on the kind of test used and determined the test order for ISO 16750. Methods: The effects of international standards' environmental factors were examined, based on the major impacts of the product and the results of product failure. Automobile manufacturers' test items were compared with the test item in the ISO 16750. A generic algorithm was then used to determine the test sequence for ISO 16750. Results: International standards and automobile manufacturers' common test items were classified. The test sequence of ISO 16750 was determined for five cases. Conclusion: Although mechanical and environmental tests share many common features, there are differences in the details of the tests. There is a common sequence of tests, but weights are allocated tests differently.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2010년도 하계학술대회 논문집
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• pp.360-360
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• 2010

반도체 산업은 지속적인 design rule 감소로 인해 직접도 및 Pin Count가 점점 증가함에 따라 보증해야할 회로의 수와 기능이 더불어 증가하고 있으며, 그 중 Test Cost 감소 방법 확보가 시급하게 되었다. 이에 따라 Test Cost 감소와 직결된 Test Time 감소 방법이 다양하게 제시되고 연구되고 있다. 본 논문은 Test Time의 한 부분인 반도체 검사 장비 (Automatic Test Equipment)의 효율적인 제어 방법을 제공함으로써, 관련 분야의 이해를 돕고자 한다.