• Journal of the Korean Institute of Telematics and Electronics
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• v.8 no.5
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• pp.10-19
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• 1971

Problems and technologies involved in integrating an audio preamplifier in terms of thick film technology has been discussed in detail. In particular, an attempt has been made to find methods for functional trimming of the amplifer by employing computer analysis. Among seven resistors integrated on a alumina substrate, only one resistor was found to be very sensitive to over all performance of the preamplifier. By trimming this resistor to its freguency charcteristic reguirements, it was possible to cut down trimming labor by one seventh. Besides, problems concerning resistor conductor contacts, crossover parasitic capacitance and the relations between noise per(ormance and trimming method are discussed in detail.

• Journal of the Korean Vacuum Society
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• v.7 no.4
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• pp.410-414
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• 1998

The dependence of substrate material and electrode position were studied by radiation analysis of Ar discharge, and electron beam radiation was applied to confirm the crosslinked structure of the film. Comparing the conductor substrate with the insulator substrate, the former had lager peak density of radiation spectrum than latter. From the result of peak density of metastable state and ion, it was confirmed that the peak density of ion was falling to the down limit with increasing the distance of electrode by analyzing the radiation spectrum of polymerized films. When the polymerized styrene films was exposed to electron beam, it was possible to form a pattern with the insulator substrate.

• Progress in Superconductivity and Cryogenics
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• v.22 no.4
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• pp.14-19
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• 2020

Here we present the comparative experimental study of the stability of the superconducting state in 4 mm YBCO tapes with copper lamination against local heat disturbances at 77 K. The samples are either directly cooled by immersing a bare YBCO tape into a liquid nitrogen pool or operate in nearly-adiabatic conditions when the tape is covered by a 0.6 mm layer of Kapton insulation. Main quench characteristics, i.e. minimum quench energies (MQEs) and normal zone propagation (NZP) velocities for both samples are measured and compared. Minimum NZP currents are determined by a low ohmic resistor technique eligible for obtaining V - I curves with a negative differential resistance. The region of transport currents satisfying the stationary stability criterion is found for the different cooling conditions. Finally, we use the critical temperature margin as a universal scaling parameter to compare the MQEs obtained in this work for YBCO tapes at 77 K with those taken from literature for low-temperature superconductors in vacuum at 4.2 K, as well as for MgB2 wires cooled with a cryocooler down to 20 K.

• Journal of the Korean institute of surface engineering
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• v.48 no.2
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• pp.38-42
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• 2015

Atomic layer deposition (ALD) is essential for the fabrication of nanoscale electronic devices because it has excellent conformality, atomic scale thickness control, and large area uniformity. Metal thin films are one of the important material components for electronic devices as a conductor. As the size of electronic devices shrinks, the thickness of metal thin films is decreased down to few nanometers, and the metal films become non-continuous due to inherent island growth of metal below a critical thickness. So, fabrication of continuous metal thin films by ALD is fundamentally and practically important. Since ALD films are grown through self-saturated reactions between precursors on surface, initial growth characteristics significantly depend on the surface properties and the selection of precursors. In this work, we investigated ALD Pt on $TiO_2$ substrate by using trimethyl-methyl-cyclopentadienyl-Platinum ($MeCpPtMe_3$) precursor and $O_3$ reactant. By using $O_3$ instead of $O_2$, initial nucleation rate of ALD Pt was increased on $TiO_2$ surface, resulting in formation of continuous thin Pt films. Morphologies of ALD Pt on $TiO_2$ were characterized by using Scanning Electron Microscope (SEM) and Energy-Dispersive X-ray Spectroscopy (EDS). Crystallinity of ALD Pt on $TiO_2$ correlated with its growth characteristics was analyzed by X-Ray Diffraction (XRD).

• Progress in Superconductivity and Cryogenics
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• v.6 no.4
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• pp.27-31
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• 2004

This paper describes the development and fabrication of a high temperature superconducting motor which consists of HTS rotor and air-core stator. The machine was designed for the rated power of 100hp at 1800 rpm. The HTS field windings are composed of the double-pancake coils wound with AMSC's SUS-reinforced Bi-2223 tape conductor. These were assembled on the support structure and fixed by a bandage of glass-fiber composite. The cooling system is based on the heat transfer mechanism of the thermosyphon by using GM cryocooler as cooling source. The cold head is in contact with the condenser of a Ne-filled thermosyphon. The rotor assembly was tested independently at the stationary state and combined with stator. Characteristic parameters such as reactances, inductances, and time constants were determined to obtain a consistent overview of the machine operation properties. This motor has met all design parameters by demonstrating HTS field winding, cryogenic refrigeration systems and an air-core armature winding cooled with air. The HTS field winding could be cooled down below 30K. No-load test of open-circuit characteristics(OCC) and short-circuit characteristics(SCC) and load test with resistive load bank were conducted in generator mode. Maximum operating current of field winding at 30K was 120A. From OCC and SCC test results synchronous inductance and synchronous reactance were 2.4mH, 0.49pu, respectively. Efficiency of this HTS machine was 93.3% in full load(100hp) test. This paper will present design, construction, and basic experimental test results of the 100hp HTS machine.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.523-523
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• 2012

As the wafer geometric requirements continuously complicated and minutes in tens of nanometers, the expectation of real-time add-on sensors for in-situ plasma process monitoring is rapidly increasing. Various industry applications, utilizing plasma impedance monitor (PIM) and optical emission spectroscopy (OES), on etch end point detection, etch chemistry investigation, health monitoring, fault detection and classification, and advanced process control are good examples. However, process monitoring in semiconductor manufacturing industry requires non-invasiveness. The hypothesis behind the optical monitoring of plasma induced ion current is for the monitoring of plasma induced charging damage in non-invasive optical way. In plasma dielectric via etching, the bombardment of reactive ions on exposed conductor patterns may induce electrical current. Induced electrical charge can further flow down to device level, and accumulated charges in the consecutive plasma processes during back-end metallization can create plasma induced charging damage to shift the threshold voltage of device. As a preliminary research for the hypothesis, we performed two phases experiment to measure the plasma induced current in etch environmental condition. We fabricated electrical test circuits to convert induced current to flickering frequency of LED output, and the flickering frequency was measured by high speed optical plasma monitoring system (OPMS) in 10 kHz. Current-frequency calibration was done in offline by applying stepwise current increase while LED flickering was measured. Once the performance of the test circuits was evaluated, a metal pad for collecting ion bombardment during plasma etch condition was placed inside etch chamber, and the LED output frequency was measured in real-time. It was successful to acquire high speed optical emission data acquisition in 10 kHz. Offline measurement with the test circuitry was satisfactory, and we are continuously investigating the potential of real-time in-situ plasma induce current measurement via OPMS.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.16 no.3
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• pp.93-100
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• 2002

In this paper, in ordor to examine the relevant technical facts which are very instructive to revise the domestic standard for lightning protection systems, standards and technical guideline for the protection of structure against lightning were reviewed, and several issues of the domestic standards were experimentally investigated. As a consequence, the insulator of relatively low implse voltage and a large percentage of lighting rods is flashovered by relatively low impulse voltage and a lage percentage of lighting current flows through supporting mast. Thus the potential gradient in the vicinity of supporter for lighting rods is extremely increased and the role of lighting propection systems is nullified. It seems obvious that the flashover of insular supporting lighting rod can range from erratic operation of microelectronic devices to minor physical ham or even death, or costly damage electrical equipment.

• Korean Journal of Optics and Photonics
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• v.19 no.4
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• pp.249-254
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• 2008

We developed a new x-ray image sensor utilizing a reflection-mode liquid crystal panel as its sensitive element, and tested its functionality by using it to obtain an x-ray image of a printed circuit board. In the liquid crystal x-ray image sensors hitherto reported, the liquid crystal layer is in direct contact with the photoconductive film which is deposited on a glass substrate. In the fabrication of the new x-ray image sensor, a liquid crystal panel is fabricated in the first step by using a pair of glass plates of a few centimeters thicknrss. Then one of the glass substrates is ground until its thickness is reduced to about $60\;{\mu}m$. After polishing the glass plate, dielectric films for high reflectance at 630 nm, a film of amorphous selenium for photoconduction, and a transparent conductive film for electrode are deposited in sequence. The new x-ray image sensor has several merits: primarily, fabrication of a large area sensor is more easily compared with the old fashioned x-ray image sensors. Since the reflection type liquid crystal panel has a very steep response curve, the new x-ray sensor has much more sensitivity to x-rays compared with the conventional x-ray area sensor, and the radiation dosage can be reduced down to less then 20%. By combining the new x-ray sensor with CCD camera technology, real-time x-ray images can be easily captured. We report the structure, fabrication process and characteristics of the new x-ray image sensor.

• Progress in Superconductivity and Cryogenics
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• v.24 no.3
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• pp.57-61
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• 2022

One of the major applications of REBCO coated conductor (CC) tapes is in superconducting magnets or coils that are designed for high magnet fields. For such applications, the CC tapes were exposed to a high level of stresses which includes uniaxial tensile or transverse compressive stresses resulting from a large magnetic field. Thus, CC tapes should endure such mechanical load or deformation that can influence their electromechanical performance during manufacturing, cool-down, and operation. It has been reported that the main cause of critical current (I_c) degradation in CC tapes utilized in coil windings for superconducting magnets was the delamination due to transversely applied stresses. In most high-magnetic-field applications, the operating limits of the CC tapes will likely be imposed by the electromechanical properties together with its I_c dependence on temperature and magnetic field. In this study, we examined the influence of the transverse compressive stress on the I_c degradation behaviors in various commercially available CC tapes which is important for magnet design Four differently processed REBCO CC tapes were adopted to examine their I_c degradation behaviors under transverse compression using an anvil test method and a newly developed instantaneous I_c measurement system. As a result, all REBCO CC tapes adopted showed robustness against transverse compressive stresses for REBCO coils, notably at transverse compressive stresses until 250 MPa. When the applied stress further increased, different Ic degradation behaviors were observed depending on the sample. Among them, the one that was fabricated by the IBAD/MOCVD process showed the highest compressive stress tolerance.

• Geophysics and Geophysical Exploration
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• v.5 no.4
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• pp.299-308
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• 2002

We have derived an analytical expression for the sensitivity of the frequency domain small-loop electromagnetic (EM) surveys over a two-layer earth in order to estimate the depth of investigation with an instrument having the source-receiver separation of about 2 m. We analyzed the sensitivities to the lower layer normalized by those to the upper half-space and estimated the depth of investigation from the sensitivity analyses and the mutual impedance ratio. The computational results showed that the in-phase components of the sensitivity to the lower layer dominates those to the upper layer when the thickness of the upper layer is less than 20 m, while the quadrature components are not sensitive to the lower layer over the entire frequency range. Hence we confirmed that the accurate measurement of the in-phase component is essential to increase the depth of investigation in the multi-frequency small-loop EM survey. When conductive basement of 10 ohm-m underlies the upper layer of 100 ohm-m, an accurate measurement of the in-phase components ensures the depth of the investigation more than 10 m even accounting a noise effect, from which we conclude that the small-loop EM survey is quite effective in imaging the conductive plume down to a considerable depth. On the other hand, in the presence of the resistive basement of 1,000 ohm-m, the depth of investigation may not exceed 5 m considering the instrumental accuracy, which implies that the application of the small-loop EM survey is not recommended over the resistive environment other than detecting the buried conductor.