• Proceedings of the Materials Research Society of Korea Conference
• /
• 1992.05b
• /
• pp.80-80
• /
• 1992

• Proceedings of the IEEK Conference
• /
• 2002.06b
• /
• pp.213-216
• /
• 2002

A double-heterostructure AIGaAs/GaAs PHEMT (Pseudomorphic High Electron Mobility Transistor) using digital recess has been successfully realized. Futhermore, the differences of gm,nax, fT, fmax between two samples are as low as 0.62%, 1.58% and 2.56 % respectively. Experimental results are presented demonstrating the etch rate and Process invariability with respect to hydrogen peroxide and acid exposure times with uniformity among devices on a sample.

• Journal of the Korean Institute of Telematics and Electronics A
• /
• v.29A no.3
• /
• pp.59-65
• /
• 1992

In this paper, the Numerov method is applied to solve the Schroedinger equation for $Al_{0.3}Ga_{0.7}AS/GaAs/Al_{0.3}Ga_{0.7}As$ double-heterojunction HEMT structures. The 3 subband energy levels, corresponding wave functions, 2-dimensional electron gas density, and conduction band edge profile are calculated from a self-consistent iterative solution of the Schroedinger equation and the Poisson equation. In addition, 2-dimensional electron gas densities in a quantum well of double heterostructure are calculated as a function of applied gate voltage. The density in the double heterojunction quantum well is increased to about more than 90%, however, the transconductance of the double heterostructure HEMT is not improved compared to that of the single heterostructure HEMT. Thus, double-heterojunction structures are expected to be suitable to increase the current capability in a HEMT device or a power HEMT structure.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
• /
• v.13 no.11
• /
• pp.943-949
• /
• 2000

In this paper, the single and double heterostructure organic light-emitting devices(OLEDs) were fabricated. The single heterostructure OLED(TYPE 1) is consisted of TPD as a HTL(hole transfer layer) and Alq$_3$as an EML(emitting layer). The double heterostructure OLED(TYPE 2) is consisted of TPD as a HTL, Alq$_3$as an EML and PBD as an ETL(electron transfer layer). The another double heterostructure OLED(TYPE 3) is consisted of TPD as a HTL, PBD as an EML and Alq$_3$as an ETL. We obtained a strong green emission device with maximum EL emission wavelength 500nm in TYPE 3. When the applied voltage was 12V, the emission luminescence was 120.9cd/㎡. The chromaticity index of TYPE 3 was x=0.29, y=0.50. In the characteristic plot of current-voltage, TYPE 3 device was turned on at 6.9V. This voltage was a fairly low turn-on voltage. TYPE 1 and 2 device were turned on at 10V and 8.9V respectively. These types showed no good properties over that of TYPE 3.

• Korean Journal of Materials Research
• /
• v.8 no.5
• /
• pp.419-423
• /
• 1998

The conditions for optimizing mass transport for making buried heterostructure (BH) InGaAsP/lnP lasers are discussed. The double heterostructure InGaAsP/lnP laser structures were grown by Liquid Phase Epitaxy (LPE) and etched into mesas. The active layer was selectively etched along [llO] and the mass transport was carried out in the LPE reactor to cover the sides of the active layer and form a BH structure. The threshold temperature for the appreciable mass transport is measured to be 670$670^{\circ}C$ when the holding time is set to 40 min. The width of the region re¬filled by mass transport is observed to increase as the temperature increases.

• Journal of the Korean Institute of Telematics and Electronics
• /
• v.21 no.5
• /
• pp.11-16
• /
• 1984

In this paper, the construction of the Liquid Phase Epitaxy system for fabricating III-V compound semiconductor devices and the method of growing AIGaAs/GaAs Double-Hetero-structure are discussed. The possibility of this Double-Heterostructure for the Light Emitting Diode is confirmed also.

• Proceedings of the IEEK Conference
• /
• 2000.11b
• /
• pp.13-16
• /
• 2000

A quantum-wire field effect transistor(QW-FET) using asymmetric double InGaAs channel and Si-delta doped barrier has been fabricated. It exhibited good modulation and saturation characteristic in the range of ${\mu}\textrm{A}$ current level. For estimated channel width of 150nm QW-FET, maximum transconductance was about 400 mS/mm which is higher than a conventional heterostructure FET(HFET) with the same epi-structure.

• Korean Journal of Materials Research
• /
• v.5 no.4
• /
• pp.420-425
• /
• 1995

AlGaN/GaInN 이중이종접합구조(double heterostructure :DH)를 대기압 유기금속기상에 피텍셜(MOVPE)법으로 AIN 와충층을 이용하여 사파이어 기판위에 성장하고, 실온에서의 광여기법에 의한 청색영역의 단면모드 유도방출특성과 편광특성을 조사하였다. 여기광원의 광밀도가 증가함에 따라 청색 영역에서의 유도방출 피크는 낮은 에너지 쪽으로 이동하였고, 유도방출 피크파장은 여기광밀도가 200kW/$cm^{2}$일때 402nm 이었으며, 스펙트럼의 반치폭은 18meV 이었다. 또한 유도방출에 필요한 여기광밀도의 임계치는 130 kW/$cm^{2}$ 이었다. AlGaN/GaInN로부터 방출되는 유도방출 광은 임계치 이상에서 TE-mode로 편광 되었다.

• Korean Journal of Materials Research
• /
• v.5 no.4
• /
• pp.445-450
• /
• 1995

AIN 완충층을 이용하여 대기압 유기금속에피텍셜 (MOVPE)법으로 사파이어 기판위에 성장시킨 AlGaN/GaN 이중 이종접합구조(double heterostructure : DH)의 고밀도 광여기에 의한 자외선 영역에서의 단면모드 유도방출 특성에 대하여 조사하였다. 실온에서 여기광 밀도 200kW/$cm^{2}$에서 방출된 AlGaN/GaN DH의 유도방출 피크파장과 반치폭은 각각 369nm와 22.4meV이었으며, 80K의 온도에서는 각각 360.1nm와 13.4meV이었다. 고밀도 광여기에 의하여 단면모드 자외영역 유도방출을 얻기에 필요한 입사광 밀도의 임계치는 실온과 80K의 온도에서 각각 89kW/$cm^{2}$와 44kW/$cm^{2}$이었다.

• Journal of the Korean Institute of Telematics and Electronics
• /
• v.22 no.4
• /
• pp.72-75
• /
• 1985

1.3$\mu$m double-heterostructure GaInAsP/InP wafers have been grown by LPE and broad contact laser diodes have been fabricated. Electrical and optical characteristics of these lasers under pulsed lasing operation at room temperature are described. Typical threshold currents are below 2 Amp. corresponding to threshold current densities of 3 - 6 KAmp./$\textrm{cm}^2$ and peak lasing wavelength is shown to be at 1.315 $\mu$m.