• Title/Summary/Keyword: Diode equivalent model

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Analysis of effect of parasitic schottky diode on sense amplifier in DDI DRAM (DDI DRAM의 감지 증폭기에서 기생 쇼트키 다이오드 영향 분석)

  • Chang, Sung-Keun;Kim, Youn-Jang
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.11 no.2
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    • pp.485-490
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    • 2010
  • We propose the equivalent circuit model including all parasitic components in input gate of sense amplifier of DDI DRAM with butting contact structure. We analysed the effect of parasitic schottky diode by using the proposed model in the operation of sense amplifier. The cause of single side fail and the temperature dependence of fail rate in DDI DRAM are due to creation of the parasitic schottky diode in input gate of sense amplifier. The parasitic schottky diode cause the voltage drop in input gate, and result in decreasing noise margin of sense amplifier. therefore single side fail rate increase.

A PSPICE Circuit Modeling of Strained AlGaInN Laser Diode Based on the Multilevel Rate Equations

  • Lim, Dong-Wook;Cho, Hyung-Uk;Sung, Hyuk-Kee;Yi, Jong-Chang;Jhon, Young-Min
    • Journal of the Optical Society of Korea
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    • v.13 no.3
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    • pp.386-391
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    • 2009
  • PSPICE circuit parameters of the blue laser diodes grown on wurtzite AlGaInN multiple quantum well structures were extracted directly from the three level rate equations. The relevant optical gain parameters were separately calculated from the self-consistent multiband Hamiltonian. The resulting equivalent circuit model for a blue laser diode was schematically presented, and its modulation characteristics, including the pulse response and the frequency response, have been demonstrated by using a conventional PSPICE.

Structure Optimization of ESD Diodes for Input Protection of CMOS RF ICs

  • Choi, Jin-Young
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.17 no.3
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    • pp.401-410
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    • 2017
  • In this work, we show that the excessive lattice heating problem due to parasitic pnp transistor action in the diode electrostatic discharge (ESD) protection device in the diode input protection circuit, which is favorably used in CMOS RF ICs, can be solved by adopting a symmetrical cathode structure. To explain how the recipe works, we construct an equivalent circuit for input human-body model (HBM) test environment of a CMOS chip equipped with the diode protection circuit, and execute mixed-mode transient simulations utilizing a 2-dimensional device simulator. We attempt an in-depth comparison study by varying device structures to suggest valuable design guidelines in designing the protection diodes connected to the $V_{DD}$ and $V_{SS}$ buses. Even though this work is based on mixed-mode simulations utilizing device and circuit simulators, the analysis given in this work clearly explain the mechanism involved, which cannot be done by measurements.

Low Reverse Saturation Current Density of Amorphous Silicon Solar Cell Due to Reduced Thickness of Active Layer

  • Iftiquar, S M;Yi, Junsin
    • Journal of Electrical Engineering and Technology
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    • v.11 no.4
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    • pp.939-942
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    • 2016
  • One of the most important characteristic curves of a solar cell is its current density-voltage (J-V) curve under AM1.5G insolation. Solar cell can be considered as a semiconductor diode, so a diode equivalent model was used to estimate its parameters from the J-V curve by numerical simulation. Active layer plays an important role in operation of a solar cell. We investigated the effect thicknesses and defect densities (Nd) of the active layer on the J-V curve. When the active layer thickness was varied (for Nd = 8×1017 cm-3) from 800 nm to 100 nm, the reverse saturation current density (Jo) changed from 3.56×10-5 A/cm2 to 9.62×10-11 A/cm2 and its ideality factor (n) changed from 5.28 to 2.02. For a reduced defect density (Nd = 4×1015 cm-3), the n remained within 1.45≤n≤1.92 for the same thickness range. A small increase in shunt resistance and almost no change in series resistance were observed in these cells. The low reverse saturation current density (Jo = 9.62×10-11 A/cm2) and diode ideality factor (n = 2.02 or 1.45) were observed for amorphous silicon based solar cell with 100 nm thick active layer.

Analysis of RF-DC Conversion Efficiency of Composite Multi-Antenna Rectifiers for Wireless Power Transfer

  • Deng, Chao;Huang, Kaibin;Wu, Yik-Chung;Xia, Minghua
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.11 no.10
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    • pp.5116-5131
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    • 2017
  • This paper studies the radio frequency to direct current (RF-DC) conversion efficiency of rectennas applicable to wireless power transfer systems, where multiple receive antennas are arranged in serial, parallel or cascaded form. To begin with, a 2.45 GHz dual-diode rectifier is designed and its equivalent linear model is applied to analyze its output voltage and current. Then, using Advanced Design System (ADS), it is shown that the rectifying efficiency is as large as 66.2% in case the input power is 15.4 dBm. On the other hand, to boost the DC output, three composite rectennas are designed by inter-connecting two dual-diode rectifiers in serial, parallel and cascade forms; and their output voltage and current are investigated using their respective equivalent linear models. Simulation and experimental results demonstrate that all composite rectennas have almost the same RF-DC conversion efficiency as the dual-diode rectifier, yet the output of voltage or current can be significantly increased; in particular, the cascade rectenna obtains the highest rectifying efficiency.

EMI Noise Source Reduction of Single-Ended Isolated Converters Using Secondary Resonance Technique

  • Chen, Zhangyong;Chen, Yong;Chen, Qiang;Jiang, Wei;Zhong, Rongqiang
    • Journal of Power Electronics
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    • v.19 no.2
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    • pp.403-412
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    • 2019
  • Aiming at the problems of large dv/dt and di/dt in traditional single-ended converters and high electromagnetic interference (EMI) noise levels, a single-ended isolated converter using the secondary resonance technique is proposed in this paper. In the proposed converter, the voltage stress of the main power switch can be reduced and the voltage across the output diode is clamped to the output voltage when compared to the conventional flyback converter. In addition, the peak current stress through the main power switch can be decreased and zero current switching (ZCS) of the output diode can be achieved through the resonance technique. Moreover, the EMI noise coupling path and an equivalent model of the proposed converter topology are presented through the operational principle of the proposed converter. Analysis results indicate that the common mode (CM) EMI noise and the differential mode (DM) EMI noise of such a converter are deduced since the frequency spectra of the equivalent controlled voltage sources and controlled current source are decreased when compared with the traditional flyback converter. Furthermore, appropriate parameter selection of the resonant circuit network can increase the equivalent impedance in the EMI coupling path in the low frequency range, which further reduces the common mode interference. Finally, a simulation model and a 60W experimental prototype of the proposed converter are built and tested. Experimental results verify the theoretical analysis.

Analysis of Vibration-powered Piezoelectric Energy Harvesters by Using Equivalent Circuit Models (등가 회로 모델을 이용한 압전 진동 에너지 수확 장치의 해석)

  • Kim, Jae-Eun
    • Transactions of the Korean Society for Noise and Vibration Engineering
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    • v.20 no.4
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    • pp.397-404
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    • 2010
  • The use of equivalent circuit models of piezoelectric energy harvesters is inevitable when power circuitry including rectifying and smoothing circuit elements is connected to them for evaluating DC electrical outputs. This is because it is difficult to incorporate the electro-mechanical coupling resulting from the additional circuitry into the conventional finite element analysis. Motivated by this observation, we propose a method to accurately extract the equivalent circuit parameters by using commercially available FEM software such as ANSYS which provides three-dimensional AC piezoelectric analysis. Then the equivalent circuit can be analyzed by circuit simulators such as $SimPowerSystems^{TM}$ of MATLAB. While the previous works have estimated the circuit parameters by experimental measurements or by analytical solutions developed only for limited geometries and boundary conditions, the proposed method has no such limitation because piezoelectric energy harvesters of any shapes and boundary conditions can be treated in FEM software. For the verification of the proposed method, multi-modal AC electrical power output by using a corresponding equivalent circuit is compared with that by ANSYS. The proposed method is then shown to be very useful in the subsequent evaluation of DC electrical output which is obtained by attaching a bridge diode and a storage capacitor to a piezoelectric energy harvester.

PSPICE Modeling and Characterization of Optical Transmitter with 1550 nm InGaAsP LDs (1550 nm InGaAsP LD 광송신회로의 PSPICE 모델 및 광변조 특성 해석)

  • Goo, Yu-Rim;Kim, Jong-Dae;Yi, Jong-Chang
    • Korean Journal of Optics and Photonics
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    • v.22 no.1
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    • pp.35-39
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    • 2011
  • The PSPICE equivalent circuit elements of a 1550 nm InGaAsP laser diode were derived by using multi-level rate equations. The device parameters were extracted by using a self-consistent numerical method for the optical gain properties of the MQW active regions. The resulting equivalent circuit model is also applied to an actual optical transmitter, and its PSPICE simulation results show good agreement with the measured results once the parasitic capacitance due to the packaging is taken into account.

A Study on the Power Loss Simulation of IGBT for HVDC Power Conversion System

  • Cho, Su Eog
    • Journal of the Korean Society of Industry Convergence
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    • v.24 no.4_1
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    • pp.411-419
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    • 2021
  • In this study, IGBT_Total_Loss and DIODE_Total_Loss were used to analyze the slope of the junction temperature for each section for temperature and duty variables in order to simply calculate the junction temperature of the power semiconductor (IGBT). As a result of the calculation, IGBT_Max_Junction_Temp and DIODE_Max_Junction_Temp form a proportional relationship with temperature for each duty. This simulation data shows that the power loss of a power semiconductor is calculated in a complex manner according to the current dependence index, voltage dependence index, and temperature coefficient. By applying the slope for each condition and section, the junction temperature of the power semiconductor can be calculated simply.