• The Journal of the Institute of Internet, Broadcasting and Communication
• /
• v.22 no.5
• /
• pp.123-128
• /
• 2022

Applying rigorous modal transmission-line theory (MTLT), the properties of resonant diffraction gratings under conical light incidence is investigated. The mode vectors pertinent to resonant diffraction under conical mounting vary less with incident angle than those associated with diffraction gratings in classical mounting. Furthermore, as the evanescent diffracted waves drive the leaky modes responsible for the resonance effects, the conical mounting imbues diffraction gratings with larger angular tolerance than their classical counterparts. Based on these concepts, the angular-spectral and wavelength-spectral performance of resonant diffraction gratings in conical and classical mounts by numerical calculations with spectra found for conical incidence are quantified. These results will be useful in various applications demanding resonant diffraction gratings that are efficient and physically sparse.

• Journal of the Optical Society of Korea
• /
• v.1 no.2
• /
• pp.67-73
• /
• 1997

Light wave diffraction from multiple superposed volume gratings is inestigated using a perturbative iteration method of the integral equation of Maxwell's wave equation. The host material and index gratings are anisotropic and non-coplanar multiple volume gratings are considered. In this method, the paraxial approximation and lack of backward scattering in conventional coupled mode theory are not assumed. Systematic analysis of anisotropic wave diffraction due to multiple noncoplanar volume index gratings is performed in increasing level of diffraction orders corresponding to successive iterations.

• 한국정보디스플레이학회:학술대회논문집
• /
• 2004.08a
• /
• pp.373-376
• /
• 2004

The measurement of diffraction of LCOS microdisplay with various pixel size, interpixel gap, pixel height and coatings demonstrates that pixel size is the leading factor for diffraction loss, while the role of varying pixel gap is less significant comparatively. One-dimensional diffraction simulation is found to be in good agreement with the measurement. Noticeable deviation occurs when pixel size is as small as 8um.

• Journal of The Korean Astronomical Society
• /
• v.29 no.spc1
• /
• pp.399-400
• /
• 1996

LAMOST is a special reflecting Schmidt telescope. Both the refleting Schmidt plate $M_A$ and the spherical primary mitrror $M_B$ are segmened mirrors. These two cofocus but not co-phase. The diffraction of the optical system is decided by the shape overlapping of $M_A$ and $M_B$. This paper describes the diffraction caculating results with different declination and different field angle. The diffraction influence to the image quality is acceptable in the error buget of optical system. It also proves that the size seletion of the sub-mirror is reasonable.

• Applied Microscopy
• /
• v.21 no.1
• /
• pp.108-120
• /
• 1991

Principles of electron diffraction patterns in transmission electron microscope are described for beginners in terms of reciprocal lattices and Ewald sphere. Analysis of both ring patterns and spot patterns are illustrated with practical examples as well as basic calibrations of TEM. Especially convergent beam electron diffraction method is emphasized for the determination of lattice parameters, microstrains, and thickness of thin foil followed by a review of microcomputer programs for the electron diffraction analyses explained in this paper.

• 한국정보디스플레이학회:학술대회논문집
• /
• 2009.10a
• /
• pp.1357-1360
• /
• 2009

In this study, the 0-th order diffraction could be efficiently removed with the obtained data for one hologram using the numerical reconstruction method. This method has a reduced data acquisition and processing time compared with the existing method wherein the data for two or more phase holograms are obtained for regeneration, and efficiently eliminates the 0-th order diffraction.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 1988.10a
• /
• pp.91-94
• /
• 1988

This paper is investigated on the diffraction grating formation of the amorphous As-Se-S-Ge films. AS$\_$40/Se$\_$15/S$\_$36/Ge$\_$10/ film of thickness 0.76 $\mu\textrm{m}$ has achieved a high diffraction efficiency of 4.6%. In this film, high diffraction efficiency is increased to 18% by chemical etching.

• Journal of the Korean Vacuum Society
• /
• v.10 no.1
• /
• pp.22-26
• /
• 2001

Microstructures of AlN thin films on Si substrates grown by plasma assisted molecular beam epitaxy were analyzed with various growth temperatures and substrate orientations. Reflection high energy electron diffraction (RHEED) patterns were checked for the in-situ monitoring of the growth condition. X-ray diffraction(XRD), double crystal X-ray diffraction (DCXD), and transmission electron microscopy/diffraction (TEM/TED) techniques were employed to characterize the microstructure of the films after growth. On Si(100) sub-strates, AlN thin films were grown mostly along the hexagonal c-axis orientation at temperature higher than $850^{\circ}C$. On the other hand the AlN films on Si(111) were epitaxially grown with directional coherencies in AlN(0001)/Si(111), AlN(1100)/Si(110), and AlN(1120)/Si(112). The microstructure of AlN thin films on Si(111) substrates, with a full width at half maximum of almost 3000 arcsec at 2$\theta$=$36.2^{\circ}$, showed that the single crystal films were grown, even if they includ a lot of crystal defects such as dislocations and stacking faults.

• Proceedings of the Optical Society of Korea Conference
• /
• 1989.02a
• /
• pp.193-195
• /
• 1989

A simple fabrication technique of diffraction gratings with short periods is presented. We can see that the monitoring of diffracted light from photoresist gratings during the development process provides optimum conditions for exposure and development processes. With this technique reproducibility and high quality of diffraction gratings is expected.

• Korean Journal of Optics and Photonics
• /
• v.23 no.1
• /
• pp.1-5
• /
• 2012

According to the paraxial diffraction theory, diffractions of optical systems which have the same wavelength and numerical aperture are always the same, independent of lateral magnification. But the diffractions for optical systems with different magnifications are varied due to the non-paraxial diffraction effect on the imaging of high NA optics. In this study, the non-paraxial diffraction effect is interpreted as a phenomena caused by curved principal planes. Pupil functions and modulation transfer functions of aplanatic conic mirrors are examined as a function of lateral magnification.