• 제목/요약/키워드: Deposition time

검색결과 1,584건 처리시간 0.03초

WSix 증착에서 공정조건이 contact 저항에 미치는 영향 (Influence of Process Condition on Contact Resistance in WSix Deposition)

  • 정양희;강성준;강희순
    • 한국정보통신학회:학술대회논문집
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    • 한국해양정보통신학회 2002년도 춘계종합학술대회
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    • pp.279-282
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    • 2002
  • In this paper, we discuss influence of process condition on contact resistance in WSix deposition process. In the WSix deposition process, we confirmed that word line to bit line contact resistance(WBCR) due to temperature of word line WSix deposition among various process condition split experiment. RTP treatment, d-poly ion implantation dose and thickness was estimated a little bit influence on contact resistance. Also, life time of shower head in the process chamber for WSix deposition related to contact resistance. The results obtained in this study are applicable to process control and electrical characteristics for high reliability and high density DRAM's.

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Modeling of Mechanical Behavior of Microcantilever due to Intrinsic Strain during Deposition

  • Kim Sang-Hyun;Mani Sathyanarayanan;Boyd James G. IV
    • Journal of Mechanical Science and Technology
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    • 제20권10호
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    • pp.1646-1652
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    • 2006
  • A model of mechanical behavior of microcantilever due to intrinsic strain during deposition of MEMS structures is derived. A linear ordinary differential equation is derived for the beam deflection as a function of the thickness of the deposited layer. Closed-form solutions are not possible, but numerical solutions are plotted for various dimensionless ratios of the beam stiffness, the intrinsic strain, and the elastic moduli of the substrate and deposited layer. This model predicts the deflection of the cantilever as a function of the deposited layer thickness and the residual stress distribution during deposition. The usefulness of these equations is that they are indicative of the real time behavior of the structures, i.e. it predicts the deflection of the beam continuously during deposition process.

진공증착법에 의한 P(VDF-TrFE) 공중합체 박막의 제조 (Fabrication of P(VDF-TrFE) copolymers thin films by physical vapor deposition method)

  • 윤종현;정무영;이선우;박수홍;이상희;임응춘;유도현;이덕출
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2000년도 추계학술대회 논문집
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    • pp.367-370
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    • 2000
  • In this study, thin films of 70/30 and 80/20 mol% P(VDF-TrFE) copolymers were fabricated by physical vapor deposition method. In order to determine the optimum deposition condition, the copolymer thin films were fabricated in the heating temperature of 260$^{\circ}C$, 280$^{\circ}C$, and 300$^{\circ}C$. The deposition rate was measured in a real time by thickness monitor. The surface image of prepared thin films was analyzed by using AFM. From the results of TG-DTA,70/30 and 80/20 mol% P(VDF-TrFE) copolymers were observed the Curie transition point below the melting point. As the results of AFM and FT-IR analysis, we determined that the optimum deposition temperature was 300$^{\circ}C$.

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Conducting ZnO Thin Film Fabrication by UV-enhanced Atomic Layer Deposition

  • 김세준;김홍범;성명모
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제45회 하계 정기학술대회 초록집
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    • pp.211.1-211.1
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    • 2013
  • We fabricate the conductive zinc oxide(ZnO) thin film using UV-enhanced atomic layer deposition. ZnO is semiconductor with a wide band gap(3.37eV) and transparent in the visible region. ZnO can be deposited with various method, such as metal organic chemical vapour deposition, magnetron sputtering and pulsed laser ablation deposition. In this experiment, ZnO thin films was deposited by atomic layer deposition using diethylzinc (DEZ) and D.I water as precursors with UV irradiation during water dosing. As a function of UV exposure time, the resistivity of ZnO thin films decreased dramatically. We were able to confirm that UV irradiation is one of the effective way to improve conductivity of ZnO thin film. The resistivity was investigated by 4 point probe. Additionally, we confirm the thin film composition is ZnO by X-ray photoelectron spectroscopy. We anticipate that this UV-enhanced ZnO thin film can be applied to electronics or photonic devices as transparent electrode.

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Investigating the Au-Cu thick layers Electrodeposition Rate with Pulsed Current by Optimization of the Operation Condition

  • Babaei, Hamid;Khosravi, Morteza;Sovizi, Mohamad Reza;Khorramie, Saeid Abedini
    • Journal of Electrochemical Science and Technology
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    • 제11권2호
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    • pp.172-179
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    • 2020
  • The impact of effective parameters on the electrodeposition rate optimization of Au-Cu alloy at high thicknesses on the silver substrate was investigated in the present study. After ensuring the formation of gold alloy deposits with the desired and standard percentage of gold with the cartage of 18K and other standard karats that should be observed in the manufacturing of the gold and jewelry artifacts, comparing the rate of gold-copper deposition by direct and pulsed current was done. The rate of deposition with pulse current was significantly higher than direct current. In this process, the duty cycle parameter was effectively optimized by the "one factor at a time" method to achieve maximum deposition rate. Particular parameters in this work were direct and pulse current densities, bath temperature, concentration of gold and cyanide ions in electrolyte, pH, agitation and wetting agent additive. Scanning electron microscopy (SEM) and surface chemical analysis system (EDS) were used to study the effect of deposition on the cross-sections of the formed layers. The results revealed that the Au-Cu alloy layer formed with concentrations of 6gr·L-1 Au, 55gr·L-1 Cu, 24 gr·L-1 KCN and 1 ml·L-1 Lauryl dimethyl amine oxide (LDAO) in the 0.6 mA·cm-2 average current density and 30% duty cycle, had 0.841 ㎛·min-1 Which was the highest deposition rate. The use of electrodeposition of pure and alloy gold thick layers as a production method can reduce the use of gold metal in the production of hallow gold artifacts, create sophisticated and unique models, and diversify production by maintaining standard karats, hardness, thickness and mechanical strength. This will not only make the process economical, it will also provide significant added value to the gold artifacts. By pulsating of currents and increasing the duty cycle means reducing the pulse off-time, and if the pulse off-time becomes too short, the electric double layer would not have sufficient growth time, and its thickness decreases. These results show the effect of pulsed current on increasing the electrodeposition rate of Au-Cu alloy confirming the previous studies on the effect of pulsed current on increasing the deposition rate of Au-Cu alloy.

Wafer Surface Scanner를 이용한 반도체 웨이퍼상의 입자 침착속도의 측정 (Measurement of Particle Deposition Velocity toward a Horizontal Semiconductor Wafer Using a Wafer Surface Scanner)

  • 배귀남;박승오;이춘식;명현국;신흥태
    • 설비공학논문집
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    • 제5권2호
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    • pp.130-140
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    • 1993
  • Average particle deposition velocity toward a horizontal semiconductor wafer in vertical airflow is measured by a wafer surface scanner(PMS SAS-3600). Use of wafer surface scanner requires very short exposure time normally ranging from 10 to 30 minutes, and hence makes repetition of experiment much easier. Polystyrene latex (PSL) spheres of diameter between 0.2 and $1.0{\mu}m$ are used. The present range of particle sizes is very important in controlling particle deposition on a wafer surface in industrial applications. For the present experiment, convection, diffusion, and sedimentation comprise important agents for deposition mechanisms. To investigate confidence interval of experimental data, mean and standard deviation of average deposition velocities are obtained from more than ten data set for each PSL sphere size. It is found that the distribution of mean of average deposition velocities from the measurement agrees well with the predictions of Liu and Ahn(1987) and Emi et al.(1989).

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상변화 메모리 응용을 위한 MOCVD 방법을 통한 Ge-Sb-Te 계 박막의 증착 및 구조적인 특성분석 (Fabrication and Structural Properties of Ge-Sb-Te Thin Film by MOCVD for PRAM Application)

  • 김난영;김호기;윤순길
    • 한국전기전자재료학회논문지
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    • 제21권5호
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    • pp.411-414
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    • 2008
  • The germanium films were deposited by metal organic chemical vapor deposition using $Ge(allyl)_4$ precursors on TiAlN substrates. Deposition of germanium films was only possible with a presence of $Sb(iPr)_3$, which means that $Sb(iPr)_3$ takes a catalytic role by a thermal decomposition of $Sb(iPr)_3$ for Ge film deposition. Also, as Sb bubbler temperature increases, deposition rate of the Ge films increases at a substrate temperature of $370^{\circ}C$. The GeTe thin films were fabricated by MOCVD with $Te(tBu)_2$ on Ge thin film. The GeTe films were grown by the tellurium deposition at $230-250^{\circ}C$ on Ge films deposited on TiAlN electrode in the presence of Sb at $370^{\circ}C$. The GeTe film growth on Ge films depends on the both the tellurium deposition temperature and deposition time. Also, using $Sb(iPr)_3$ precursor, GeSbTe films with hexagonal structures were fabricated on GeTe thin films. GeSbTe films were deposited in trench structure with 200 nm*120 nm small size.

무전해 코발트계 석출막에 미치는 기판의 영향 (Effect of Substrate on Electroless Co-Base Deposited Films)

  • 한창석;천창환;한승오
    • 한국재료학회지
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    • 제19권6호
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    • pp.319-324
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    • 2009
  • The deposition behavior and structural and magnetic properties of electroless Co-B and Co-Fe-B deposits, as well as the amorphous ribbon substrates, were investigated. These Co-based alloy deposits exhibited characteristic polycrystalline structures and surface morphology and magnetic properties that were dependent on the type of amorphous substrates. The catalytic activity sequence of the amorphous ribbon electrodes for anodic oxidation of DMAB was estimated from the current density-potential curve in the anodic partial electrolytic bath that did not contain the metal ions. Both the deposition rate and potential in the initial region were obtained in order of the catalytic activity, depending on the alloy compositions of the substrates. The deposition rate linearly varied against the deposition time. The initial deposition potential may have also determined the structural and magnetic properties of the deposit based on the thickness of ${\mu}m$ order. Furthermore, a basic study of the electroless deposition processes on an amorphous ribbon substrate has been carried out in connection with the structural and magnetic properties of the deposits.

2005년 도시지역의 건성침적량 산정에 관한 연구 (Estimation of Dry Deposition in Urban Area, 2005)

  • 신선아;한진석;이상덕;최진수
    • 한국대기환경학회지
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    • 제22권4호
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    • pp.477-486
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    • 2006
  • Dry deposition fluxes for $SO_2$, particulate sulfate, nitrate, ammonium and $HNO_3$ were estimated in urban area for the time period January$\sim$ October 2005. Fluxes were generated using atmospheric concentration data collected both in Acid Deposition and Air Quality Monitoring Networks, and deposition velocities computed by combining land-use data with meteorological information. The resulting annually averaged $SO_2$, $NO_3$, and aerosol deposition velocities were found to be 0.4 cm/s, 4.3 cm/s and 0.1 cm/s, respectively, and thus deposition rates were 4.4 mg/$m^2$. day for $SO_2$, and 5.4 mg/$m^2$ . day for $NHO_3$, and particulate sulfate, ammonium and nitrate recorded 1.0 mg/$m^2$ . day, 0.4 mg/$m^2$ . day and 0.4 mg/$m^2$ day, respectively. Maximum for in seasonal variation of monthly averaged deposition velocities occurred in summer in contrast to $HNO_3$ showing peak in spring. There was no significant variation for aerosol. The dry to total (wet and dry) deposition contributed about 40% for sulfur and 28% for nitrogen species in this study.

$SiH_4$ 환원에 의한 Selective CVD-W막 특성에 대한 증착시간과 압력의 효과 (Effect of Deposition Time and Pressure on Properties of Selective CVD-W by $SiH_4$ Reduction)

  • 이종무;이강욱;박선후
    • 한국재료학회지
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    • 제1권4호
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    • pp.177-183
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    • 1991
  • $SiH_4$환원에 의한 선택성 CVD-W 공정에서 증착시간과 증착압력에 따른 W막 특성의 변화를 조사하였다. $300^{\circ}C$, 100mtorr이하에서 W막이 Si기판 전면에 증착되는 데에 약 30초의 시간이 걸렸고, 증착시간에 따라 막 두께는 초기에는 직선적으로, 나중에는 포물선적으로 증가하였으며, 면저항은 초기에는 급히, 나중에는 서서히 감소하는 경향을 나타내었다. 50-300mtorr의 압력범위에서 압력의 증가에 따라 결정립도(grain size)는 별로 변하지 않았으나 결정립계(grain boundary)의 윤곽이 불확실해지는 경향을 나타내었다. 또한 이 압력범위에서는 ${\alpha}-W$만 나타날 뿐 ${\beta}-W$의존재는 발견되지 않았다. 증차압력의 증가에 따라 W막의 증착속도가 증가하고, 비저항도 증가하는 경향을 보였다. AES 분석결과에 의하면, 증착압력온 Si/W의 조성비나 W/Si계면에서의 실리사이드화에는 큰 영향을 미치지 않는 것으로 나타났다.

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