• Laser Solutions
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• v.3 no.2
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• pp.53-61
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• 2000

On the laser weld production line, a slight alteration of the welding condition produces many defects. The defects are monitored in real time, in order to prevent continuous occurrence of defects, reduce the loss of material, and guarantee good quality. The measurement system is produced by using three photo-diodes for detection of the plasma and spatter signal in CO$_2$ laser welding. For high speed CO$_2$ laser welding, laser tailored welded blanks for example, on-line weld quality monitoring system was developed by using fuzzy multi-feature pattern recognition. Weld qualities were classified optimal heat input, a little low heat input, low heat input, and focus misalignment, and final weld quality were classified good and bad.

• Journal of the Korean Society for Precision Engineering
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• v.28 no.5
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• pp.606-613
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• 2011

In this paper, patterns of laser scattering and detection of micro defects have been investigated based on Rayleigh criterion for silicon wafer in solar cell. Also, a new laser scattering mechanism is designed using characteristics of light scattering against silicon wafer surfaces. Its parameters are to be optimally selected to obtain effective and featured patterns of laser scattering. The optimal parametric ranges of laser scattering are determined using the mean intensity of laser scattering. Scattering patterns of micro defects are investigated at the extracted parameter region. Among a lot of pattern features, both maximum connected area and number of connected component in patterns of laser scattering are regarded as the important information for detecting micro defects. Their usefulness is verified in the experiment.

• Proceedings of the KIEE Conference
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• 1987.11a
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• pp.311-315
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• 1987

This paper describes the automatic visual inspect ion system of fabric defects based on pattern recognition techniques. To extract features for detection of fabric defects, four different techniques such as SGLDM. GCM, decorrelation method, and Laws' texture measure were investigated. From results of computer simulation, it has been found that GCM and decorrelation techniques provide good features. By employing a simple statistical pattern recognition technique, theaccuracy of classification of defect and nondefect was more than 90%. Some experimental results arm also presented.

• Nuclear Engineering and Technology
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• v.36 no.3
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• pp.210-218
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• 2004

In the interest of nuclear power plant safety, a self-diagnostic monitoring system (SDMS) is needed to monitor defects in safety-related components. An air-operated valve (AOV) is one of the components to be monitored since the failure of its operation could potentially have catastrophic consequences. In this paper, a model of the AOV is developed with the parameters that affect the operational characteristics. The model is useful for both understanding the operation and correlating parameters and defects. Various defects are introduced in the experiments to construct a fault library, which will be used in a pattern recognition approach. Finally, the validity of the fault library is examined.

• Proceedings of the KIEE Conference
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• 2007.10a
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• pp.149-150
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• 2007

In this paper, we propose a novel defects inspection algorithm for TFT-LCD panels. We first compensate the distorted image caused by the camera distortion and the uneven illumination environment using the least squares method and the bezier surface. We find a starting point of each pattern. The reference frame, made by subtract method using several clean patterns, is compared to each pattern to find defects. The simulation example shows that our algorithm not only inspects the defects well, but also is robust to the 1-pixel error.

• Proceedings of the Optical Society of Korea Conference
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• 2006.07a
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• pp.469-471
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• 2006

This paper describes a efficient insepction method of PCB PADs for AFVI. The methods for PCB inspection have been tried to detect the defects in PCB PADs, but their low detection rate results from pattern variations that are originating from etching, printing and handling processes. The adaptive inspection method has been newly proposed to extract minute defects based on dynamic segments and filters. The vertexes are extracted from CAM master images of PCB and then a lot of segments are constructed in master data. The proposed method moves these segments to optimal directions of a PAD contour and so adaptively matches segments to PAD contours of inspected images, irrespectively of various pattern variations. It makes a fast, accurate and reliable inspection of PCB patterns. Experimental results show that proposed methods are found to be effective for flexible defects detection.

• Journal of Welding and Joining
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• v.16 no.5
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• pp.108-118
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• 1998

This study proposes th analysis and evaluation method of time series ultrasonic signal using the chaos feature extraction for ultrasonic pattern recognition. Features extracted from time series data using the chaos time series signal analyze quantitatively weld defects. For this purpose, analysis objective in this study is fractal dimension and Lyapunov exponent. Trajectory changes in the strange attractor indicated that even same type of defects carried substantial difference in chaosity resulting from distance shifts such as 0.5 and 1.0 skip distance. Such differences in chaosity enables the evaluation of unique features of defects in the weld zone. In quantitative chaos feature extraction, feature values of 4.511 and 0.091 in the case of side hole and 4.539 and 0.115 in the case of vertical hole were proposed on the basis of fractal dimension and Lyapunov exponent. Proposed chaos feature extraction in this study can enhances ultrasonic pattern recognition results from defect signals of weld zone such as side hole and vertical hole.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.8 no.4
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• pp.539-543
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• 1998

The relationship of growth-in defects such as crystal originated particles (COP), flow pattern defects(FPD), laser scattering tomography defects (LSTD) was investigated in Cz-Si single crystals which had different pulling speed during crystal growing. It is concluded that the density and radial distribution of grown-in defects is strongly dependent on the pulling speed. And as the generation areas of these grown-in defects in a wafer are identical in radial position, they can be generated from same origin during crystal growing.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.24 no.12A
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• pp.2008-2014
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• 1999

IDDQ testing is an effective testing method to detect various physical defects occurred in CMOS circuits. In this paper, we consider intra-gate shorts within circuit under test and implement IDDQ test pattern generator to find test patterns which detect considered defects. In order to generate test patterns, gate test vectors which detect all intra-gate shorts have to be found by type of gates. Random test sets of 10,000 patterns are applied to circuit under test. If an applied pattern generates a required test vector of any gate, the pattern is saved as an available test pattern. When applied patterns generate all test vectors of all gats or 10,000 patterns are applied to circuit under test, procedure of test pattern generation is terminated. Experimental results for ISCAS'85 bench mark circuits show that its efficiency is more enhanced than that obtained by previously proposed methods.

• Journal of the Semiconductor & Display Technology
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• v.2 no.4
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• pp.1-7
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• 2003

In this paper, we design the pattern generator circuits using PLDs(Programmable Logic Devices). The pattern generator is the circuit which generates the test pattern signal for the inspection of logical defects of semiconductor products. The proposed circuits are designed by the PLD design tool(MAX+ II of ALTERA). Also the designed circuits are simulated for the verification of the designed ones. The simulation results have a good performance.