• The Korean Journal of Ceramics
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• 제5권3호
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• pp.288-295
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• 1999

Partial conductivities contributed by electron holes, oxygen ions, and protons were caluclated in $SrZr_{0.95}Y_{0.05}O_{2.975}$, using the reported formulae derived from the defect chemistry of HTPCs. Required parameters were obtained from the graphical analysis of total conductivity variation against partial pressure of water vapor and oxygen. Predicted overall conductivities showed a reasonable agreement with experimental measurements. The conductivity of the material showed a linear increase with square root of the water vapor pressure. This increase was due to proton conduction in an almost pure ionic conductivity. The calculation of partial conductivities at $800^{\circ}C$ resulted in an almost pure ionic conductivity at $P_{02}=10^{-10}$ atm and a predominant hole conductivity at $P_{02}=10^{-10}$ atm. Pure proton conduction was not expected at this temperature, contrary to the earlier reports. Discussions were made in relation with reported thermodynamic data and defect structure of the material. It was shown that from the total conductivity dependence on water vapor pressure, the pure ionic conductivity at low oxygen partial pressures could be separated into protonic and oxygen ionic conductivity in $ZrO_2$-based HTPCs.

• 대한전자공학회논문지
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• 제27권1호
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• pp.68-73
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• 1990

GaAs epilayer was grown on Si(100) substrate using the two-step growth method by MBE. The crystal growth mode have been investigated by RHEED. The hydrogenation effects of GaAs epilayer were studied by DLTS and Raman spectroscopy. The four electron traps in GaAs/Si layer were observed and their activation energy ranged from 0.47 eV to 0.81 eV below the conduction band. After hydrogenation at 250\ulcorner for 3 hours, new trap not observed and electron traps at Ec-0.68, 0.54 and 0.47 eV were almost passivated. Whereas the Ec-0.81 eV level showed no significant change in concentration. From Raman measurement, GaAs epilayer is found to be influenced by the tensile stress.

• 한국표면공학회:학술대회논문집
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• 한국표면공학회 1999년도 춘계학술발표회 초록집
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• pp.97-97
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• 1999

Dross formation in the zinc bath is inevitable under any condition as long as coating process on steel strip continues. Thus, bath aluminum and temperature are precisely managed to suppress the increase of dross. Also, excessive dross for normal coating process is generally eliminated physically by bubbling and skimming. Total amount of dross in the bath can be sometimes high enough to cause coating defect. On the other hand, local concentration of dross can make coating defect even with satisfactory level of total amount of dross. Reduction of dross in the bath was attempted by using ceramic foam filter made of mainly alumina. Dross in molten zinc was almost reduced to the levels of solubility of iron and aluminum in molten zinc at $450~460^{\circ}C$. Their solubility levels were confirmed by thermodynamic calculations or DEAL program. Two kinds of filters were tested for dross reduction. One was #20 ppi, porous per inch, and the other #30 ppi filter. Both were effective in reducing the bath dross to the solubility levels at the static state. Bath iron was reduced by 24 wt% and 19 wt% with #20 filter, and by 35 wt% and 29 wt% with #30 filter for GI and GA pot, respectively. Also, ceramic foam filter did not make any harm to the zinc bath composition after filtering test.

• 한국표면공학회지
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• 제54권6호
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• pp.348-356
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• 2021

In this study, optical diagnosis of plasma was performed for nitrogen doping in graphene using a horizontal inductively coupled plasma (ICP) system. Graphene was prepared by mechanical exfoliation and the ICP system using nitrogen gas was ignited for plasma-induced and defect-suppressed nitrogen doping. In order to derive the optimum condition for the doping, plasma power, working pressure, and treatment time were changed. Optical emission spectroscopy (OES) was used as plasma diagnosis method. The Boltzmann plot method was adopted to estimate the electron excitation temperature using obtained OES spectra. Ar ion peaks were interpreted as a reference peak. As a result, the change in the concentration of nitrogen active species and electron excitation temperature depending on process parameters were confirmed. Doping characteristics of graphene were quantitatively evaluated by comparison of intensity ratio of graphite (G)-band to 2-D band, peak position, and shape of G-band in Raman profiles. X-ray photoelectron spectroscopy also revealed the nitrogen doping in graphene.

• 한국태양에너지학회 논문집
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• 제39권1호
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• pp.1-9
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• 2019

Light induced degradation is one of the major research challenges of hydrogenated amorphous silicon related thin film silicon solar cells. Amorphous silicon shows creation of metastable defect states, originating from elevated concentration of dangling bonds during light exposure. The metastable defect states work as recombination centers, and mostly affects quality of intrinsic layer in solar cells. In this paper we present results of light induced degradation in thin film silicon solar cells and discussion on physical origin, mechanism and practical solutions of light induced degradation in thin film silicon solar cells. In-situ light-soaking IV measurement techniques are presented. We also present thin film silicon material with silicon nano-quantum dots embedded within amorphous matrix, which shows superior stability during light-soaking. Our results suggest that solar cell using silicon nano-quantum dots in abosrber layer shows superior stability under light soaking, compared to the conventional amorphous silicon solar cell.

• 한국정밀공학회지
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• 제12권10호
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• pp.78-88
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• 1995

For producing iron or steel products with good quality, the concentration of the material components should be analyzed quickly with high relability using XRF(Fluorescent X-Ray Spectrometer). Since the analysis results are much dependent upon the surface con- dition, the samples have to be prepared to have good test condition. This study presents an image processing system for inspecting the surface condition of the iron test sample. In order to use thd computer vision system, we need to develop a lighting device and image processing algorithm. For the adequate lighting device of inspection system, the indirect lighting device is contrived to cut the external light and provide uniform, stable and cold light. The image processing algorithm is aimed to reduce inspection time and to get similar analyzing results to those of the experienced operators. At first, the image processing algorithm checks whether the surface of the iron sample is ground well or not. Then, the defects; hole or dig are conted and surface condition is evaluated. In addition, the algorithm gives the reliability of the analyzing results in order to help operator's decision.

• 한국결정성장학회지
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• 제7권3호
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• pp.393-399
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• 1997

승화법에 의한 6H-SiC 단결정의 최적 성장조건을 설정하여 고품질의 6H-Sic 단결정을 성장하였다. 성장된 결정의 직경은 약 33 mm, 길이는 약 11 mm였다. 성장된 결정을 절단하여 연마한 후 광학현미경을 이용하여 연마된 SiC wafer의 micropipe density와 planar defect density를 측정한 결과, micropipe density는 400개/$ \textrm{cm}^2$이었고 planar defect density는 50개/$\textrm{cm}^2$이었다. 이 6H-SiC wafer와 기판으로 사용된 Acheson 결정의 결정성을 비교하기 위하여 Raman 분광법과 double crystal X-ray diffraction 분석법이 사용되었다. 이 분석에 의해 승화법에 의해 성장된 6H-SiC wafer가 Acheson seed보다 결정성이 우수하였다. Hall effect 측정법에 의해 불순물이 첨가되지 않은 6H-SiC wafer의 전기적인 특성을 측정하였으며 그 결과 캐리어 농도는 $3.91{\times}10^{15}/\textrm {cm}^3$이었고, n-type이었다.

• 한국입자에어로졸학회지
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• 제6권2호
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• pp.51-59
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• 2010

ZnO quantum dots embedded in a silica matrix without agglomeration were synthesized from $TEOS:Zn(NO_3)_2$ solutions in one-step process by aerosol-gel method. It was successfully demonstrated that the size of ZnO Q-dots could be controlled from 2 to 7 mm verified by a high resolution transmission electron microscope observation. The line scanning energy dispersive X-ray spectroscopy(EDS) revealed that the Q-dots existed preferentially inside SiO2 sphere when Zn/Si < 0.5. However, the Q-dots distributed homogeneously all over the sphere when Zn/Si > 1.0. Blue-shifted UV/Vis absorption peak observation confirmed the quantum size effect on the optical properties. The photoluminescence(PL) emission peaks of the powders at room temperature were consistent with previous reports in the following aspects: 1) PL characteristics are dominated by two peaks of deep-level defect-related emissions at 2.4 - 2.8 eV, 2) the first defect-related peak at 2.4 eV was blue shifted due to the quantum size effect with decreasing the concentration of $Zn(NO_3)_2$(decreasing the size of ZnO q dots). More interestingly, the existence of surface-exposed ZnO q dots affects greatly the second defect PL peak at 2.8 eV.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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• pp.81-81
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• 2008

Applications of CdS films in this study are to exhibit a high conductivity when they are exposed at light with visible wavelength and sequentially to show a low conductivity in dark state. For this purpose, CdS films should have a high photosensitivity, still maintaining a high conductivity at a visible light. In this study, CdS films were prepared at room temperature on glass substrates by rf magnetron sputtering. In order to increase the photo-conductivity in visible light, various defect levels should be located within the CdS band gap. In order to nucleate the defect sites within the CdS band gap, CdS films were deposited on glass substrates at room temperature using various $H_2$/(Ar+$H_2$) flow ratios by an rf magnetron sputtering. Through the investigation of the structural and photoconductive properties of CdS films by an addition of hydrogen, the relationship between photo- and dark-resistance in CdS films was investigated in detail. 200-nm-thick CdS films for photoconductive sensor applications were prepared at various $H_2$/(Ar+$H_2$) flow ratios on glass substrates at room temperature by rf magnetron sputtering. Sulfur concentration in CdS films crystallized at room temperature with (002) preferred orientation depends directly on the hydrogen atmosphere and the surface roughness of the films gradually increases with increasing hydrogen atmosphere. Films deposited at 8% of $H_2$/(Ar+$H_2$) exhibit an abrupt decrease of dark- and photo-resistance, showing a low photo-sensitivity ($R_{dark}/R_{photo}$). Onthe other hand, films deposited at a hydrogen atmosphere of 42% exhibit a photo-sensitivity of $5\times10^3$, maintaining a photo-resistance of an approximately $2\times10^4\Omega$/square. The dark- and photo-resistance values of CdS films were related with a composition, surface roughness, and defect sites within the band gap.

• Journal of Information Display
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• 제6권2호
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• pp.25-29
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• 2005

The luminescent properties of $Eu^{3+}$ and $Sm^{3+}$ doped potassium tungstate phosphor are investigated. The $K_{4-3x}(WO_4)_2:Eu^{3+}\;_x,Sm^{3+}\;_y$ phosphor is produced by firing the mixed precursors, followed by re-firing with a flux. The re-firing process results in the defect-free surface and uniform growth of the particles. The strong absorption in the region of ultra violet light is observed due to the 4f-4f electron transitions of the $Eu^{3+}$ and $Sm^{3+}$ ions. The doping concentration of europium into potassium tungstate is relatively high, compared to other host materials. It is revealed that the crystal structure is a monoclinic with space group, C2/c. This crystal structure facilitated the $Eu^{3+}$ ions to be located with the Eu-Eu distance larger than 5 ${\AA}$ so that concentration quenching does not occur even at high doping concentration. The excitation spectrum could be adjusted by the introduction of the samarium. A small amount of the $Sm^{3+}$ ions that acts as a sensitizer increases the energy absorption peak around 405 nm.