• 대한산업공학회지
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• 제21권3호
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• pp.371-385
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• 1995

The yield of semiconductor chips is dependent not only on the average defect density but also on the distribution of defects over a wafer. The distribution of defects leads to consider a cluster index. This paper briefly reviews the existing yield prediction models ad proposes a new cluster index, which utilizes the information about the defect location on a wafer in terms of the coefficient of variation. An extensive simulation is performed under a variety of defect distributions and a yield prediction model is derived through the regression analysis to relate the yield with the proposed cluster index and the average number of defects per chip. The performance of the proposed simulation-based yield prediction model is compared with that of the well-known negative binomial model.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2007년도 추계학술대회 논문집
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• pp.203-204
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• 2007

This paper investigated the influence on partial discharge distribution of various defects at the model power cable joints interface using K-means clustering. As the result of analyzing discharge number distribution of ${\Phi}-n$ cluster, clusters shifted to $0^{\circ}\;and\;180^{\circ}$ with increasing applying voltage. It was confirmed that discharge quantity and euclidean distance between centroids were increased with applying voltage from the analyzing centroid distribution of ${\Phi}-q$ cluster. The degree of dispersion was increased with calculating standard deviation of ${\Phi}-q$ cluster centroid. The tendency both number of discharge and mean value of ${\Phi}-q$ cluster centroid were some different with defect types.

• Steel and Composite Structures
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• 제19권1호
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• pp.131-152
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• 2015

Easy detection and evaluation of defect in the tube structure is a continuous problem and remains a significant demand in tube inspection technologies. This study is aimed to automate defect detection using the pattern recognition approach based on the classification of high frequency stress wave signals. The stress wave signals from vibrational impact excitation on several tube conditions were captured to identify the defect in ASTM A179 seamless steel tubes. The variation in stress wave propagation was captured by a high frequency sensor. Stress wave signals from four tubes with artificial defects of different depths and one reference tube were classified using the autoregressive (AR) algorithm. The results were demonstrated using a dendrogram. The preliminary research revealed the natural arrangement of stress wave signals were grouped into two clusters. The stress wave signals from the healthy tube were grouped together in one cluster and the signals from the defective tubes were classified in another cluster. This approach was effective in separating different stress wave signals and allowed quicker and easier defect identification and interpretation in steel tubes.

• 산업경영시스템학회지
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• 제45권4호
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• pp.157-166
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• 2022

In the case of a die-casting process, defects that are difficult to confirm by visual inspection, such as shrinkage bubbles, may occur due to an error in maintaining a vacuum state. Since these casting defects are discovered during post-processing operations such as heat treatment or finishing work, they cannot be taken in advance at the casting time, which can cause a large number of defects. In this study, we propose an approach that can predict the occurrence of casting defects by defect type using machine learning technology based on casting parameter data collected from equipment in the die casting process in real time. Die-casting parameter data can basically be collected through the casting equipment controller. In order to perform classification analysis for predicting defects by defect type, labeling of casting parameters must be performed. In this study, first, the defective data set is separated by performing the primary clustering based on the total defect rate obtained during the post-processing. Second, the secondary cluster analysis is performed using the defect rate by type for the separated defect data set, and the labeling task is performed by defect type using the cluster analysis result. Finally, a classification learning model is created by collecting the entire labeled data set, and a real-time monitoring system for defect prediction using LabView and Python was implemented. When a defect is predicted, notification is performed so that the operator can cope with it, such as displaying on the monitoring screen and alarm notification.

• 전기학회논문지
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• 제56권5호
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• pp.876-883
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• 2007

The magnetic flux leakage(MFL) type nondestructive testing(NDT) method is widely used to detect corrosion, defects and mechanical deformation of the underground gas pipelines. The object pipeline is magnetically saturated by the magnetic system with permanent magnet and yokes. Hall sensors detect the leakage fields in the region of the defect. The defects are sometimes occurred in group. The accuracy of the detecting signals in this defect cluster become lowered because of the complexity of the defect cluster. In this paper, the effects of the multi -defects are analyzed. The detecting signals are computed by 3-dimensional finite element method and compared with real measurement. The results say that, rather than the size of the defects, the effects of the relative position of the multi-defects are very important on the detecting signals.

• 정보저장시스템학회논문집
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• 제5권2호
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• pp.89-95
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• 2009

We setup the system to measure the noise characteristics of the 5M complementary metal-oxide semiconductor (CMOS) image sensor by generic measurement indicator of Standard mobile imaging architecture (SMIA) which is one of internal standard of mobile imaging architecture. To evaluate the effect of environment and setting parameters, such as temperature and integration time, we measure the variation of the dark signal, dynamic range and fixed pattern noise of image sensor. We also detect the number of defective pixels and cluster defects defined as adjacent single defect pixels at 5M CMOS image sensor. Then, we find the existence of some cluster defects in experiment, which are not expected in calculation.

• 한국멀티미디어학회논문지
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• 제19권3호
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• pp.633-641
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• 2016

Automatic defect inspection system is composed of the step in the pre-processing, defect candidate detection, and classification. Polarizing films containing various defects should be minimized over-detection for classifying defect blobs. In this paper, we propose a defect detection algorithm using a skewness of histogram for minimizing over-detection. In order to detect up defects with similar to background pixel, we are used the characteristics of the local region. And the real defect pixels are distinguished from the noise using the probability density function. Experimental results demonstrated the minimized over-detection by utilizing the artificial images and real polarizing film images.

• 한국진공학회지
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• 제4권S2호
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• pp.139-147
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• 1995

The mechanism of the ionized cluster beam deposition has been studied using Molecular Dynamics Simulation. The Embedded Atom Method(EAM) potential were used in the simulation. The impact of a Au95-cluster on Au(100) substrate was studied for the impact energies 0.15-10eV/atom. The dependency of the impact energy of cluster beam was observed. For the cluster energy impact of 10eV per atom, the defects on surface were created and the cluster embedded into substrate as an amorphous state. For the energy of 0.5eV per atom, the defect free homoepitaxial growth was observed and atomic scale nucleation was formated, which are in good agreement with experiment. Thus molecular dynamics simulation is very useful to study the mechanism of the ionized cluster beam deposition.

• 한국멀티미디어학회논문지
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• 제15권9호
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• pp.1149-1155
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• 2012

본 논문에서는 반도체 산업 영상에서 반도체의 결함 원인 진단 기법을 제안한다. 제안 기법은 먼저 결함 영상에 대한 특징 데이터베이스를 구축한다. 다음으로 결함 영상과 입력 영상을 블록 단위로 영역 분할을 수행한 후 컬러 히스토그램을 계산하여 블록들 사이의 히스토그램 카이 제곱 거리를 이용한 블록 유사성을 측정한다. 다음으로 각 영상에서 탐색된 블록들에 대하여 클러스터링을 수행하여 영역을 연결된 객체 단위로 군집한다. 마지막으로 각 클러스터들의 특징을 추출하여 클러스터 간 유사성 측정으로 가장 유사성이 높은 결함 영상을 특징 DB에서 탐색하여 결함 원인 정보와 함께 제시한다. 검색 결과 유사도 상위 n개의 영상 중에서 입력 영상과 동일한 범주의 결함을 갖는 영상이 검색되는 비율을 구하여 제안 기법의 정확성을 검증하였다. n = 1, 2, 3에 대해서 결함 범주에 상관없이 검색 정확도는 모두 100%로 제안 기법은 실제 산업 응용이 가능한 정확한 검색 결과를 보여주었다.

• Journal of Magnetics
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• 제18권2호
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• pp.202-206
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• 2013

In this paper, the MFL (magnetic flux leakage) signals of complex defects on the underground gas pipeline are analyzed and their depths are estimated. Since closely-located defects (complex defects) affect each other, accelerate the progress of defection, and are finally combined to one (cluster), it's meaningful to differentiate complex defects from single defects by analyzing their characteristics. Various types of complex defects are characterized and analyzed by defining the safety distance for interference. 26 artificial defects are carved on the pipeline simulation facility (PSF) to analyze the characteristics of complex defect and demonstrate the accuracy of the proposed complex defect estimation. The proposed method shows average length error of 5.8 mm, average width error of 15.55 mm, and average depth error of 8.59%, respectively.