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http://dx.doi.org/10.9717/kmms.2016.19.3.633

Defect Detection algorithm of TFT-LCD Polarizing Film using the Probability Density Function based on Cluster Characteristic  

Gu, Eunhye (School of Electronics Eng., Kyungpook National University)
Park, Kil-Houm (School of Electronics Eng., Kyungpook National University)
Publication Information
Journal of Korea Multimedia Society / v.19, no.3, 2016 , pp. 633-641 More about this Journal
Abstract
Automatic defect inspection system is composed of the step in the pre-processing, defect candidate detection, and classification. Polarizing films containing various defects should be minimized over-detection for classifying defect blobs. In this paper, we propose a defect detection algorithm using a skewness of histogram for minimizing over-detection. In order to detect up defects with similar to background pixel, we are used the characteristics of the local region. And the real defect pixels are distinguished from the noise using the probability density function. Experimental results demonstrated the minimized over-detection by utilizing the artificial images and real polarizing film images.
Keywords
Film Defect Detection; Distribution Estimation; Gaussian Kernel; Probability Density Function;
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