Transactions of the Society of Information Storage Systems (정보저장시스템학회논문집)

The Society of Information Storage Systems (정보저장시스템학회)
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Measurement of noise characteristics of an image sensor

화상센서의 잡음 특성 측정

  • Published : 2009.09.25
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Abstract

We setup the system to measure the noise characteristics of the 5M complementary metal-oxide semiconductor (CMOS) image sensor by generic measurement indicator of Standard mobile imaging architecture (SMIA) which is one of internal standard of mobile imaging architecture. To evaluate the effect of environment and setting parameters, such as temperature and integration time, we measure the variation of the dark signal, dynamic range and fixed pattern noise of image sensor. We also detect the number of defective pixels and cluster defects defined as adjacent single defect pixels at 5M CMOS image sensor. Then, we find the existence of some cluster defects in experiment, which are not expected in calculation.

Keywords

References

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