• Title/Summary/Keyword: Dark-field image

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Dark Field Digital Holographic Microscopy Based on Two-lens 360-degree Oblique Illumination

  • Zhang, Xiuying;Zhao, Yingchun;Yuan, Caojin;Feng, Shaotong;Wang, Lin
    • Current Optics and Photonics
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    • v.4 no.3
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    • pp.193-199
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    • 2020
  • In this paper we propose a dark-field digital holographic microscopy system based on 360-degree oblique illumination. This setup is constructed without using a dark-field objective. The principle of 360-degree oblique illumination of vortex beam and dark-field digital holographic microscopy are introduced theoretically and experimentally. By analyzing the reconstructed image of a dark-field digital hologram of a USAF 1951 target, it is proved that the imaging resolution can be improved by this method. And also, comparison and analysis are made on the reconstructed image of a bright-dark field digital hologram of a pumpkin stem slice, the result shows that the imaging contrast is also enhanced with this method, and it is effective for dark-field digital holographic microscopy imaging of large transparent biological samples.

Investigation of dark spots in OLEDs by using a near-field scanning microwave microscope (유기 발광소자내 dark spot의 마이크로파 근접장 현미경(near-field scanning microwave microscope)을 이용한 연구)

  • Yun, Soon-Il;Park, Mi-Hwa;Yoo, Hyeon-Jun;Lim, Eun-Ju;Kim, Joo-Young;Lee, Kie-Jin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.07b
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    • pp.984-987
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    • 2003
  • 유기발광소자 안에 존재하는 비발광영역(dark spot)의 전압에 대한 영향을 근접장 마이크로파 현미경(near-field scanning microwave microscope)을 이용하여 관찰하였다. 유기발광소자는 glass/indiumtin oxide(ITO)/Cu-Pc/tris-(8-hydroquinoline)aluminum(Alq3)/aluminum(Al) 의 기본구조로 제작하였다. Dark spot은 ITO 기판을 부분적으로 에칭하여서 형성시켰다. Dark spot에 $0{\sim}l5 V$ 까지 전압을 인가시키면서 인가 전압에 따른 전기적 특성을 근접장 마이크로파 현미경 image의 변화와 반사계수인 $S_{11}$ 측정을 통하여 연구하였다.

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Investigation of dark spots in OLEDs by using a near-field scanning microwave microscope (유기 발광소자내 dark spot의 마이크로파 근접장 현미경(near-field scanning microwave microscope)을 이용한 연구)

  • Yun, Soon-Il;Park, Mi-Hwa;Yoo, Hyeon-Jun;Lim, Eun-Ju;Kim, Joo-Young;Lee, Kie-Jin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.04a
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    • pp.147-150
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    • 2003
  • 유기발광소자 안에 존재하는 비발광영역(dark spot)의 전압에 대한 영향을 근접장 마이크로파 현미경(near-field scanning microwave microscope)을 이용하여 관찰하였다. 유기발광소자는 glass/indiumtin oxide(ITO)/Cu-Pc/tris-(8-hydroquinoline)aluminum(Alp3)/aluminum(Al)의 기본구조로 제작하였다. 비발광영역은 ITO 기판을 부분적으로 에칭하여서 형성시켰다. Dark spot에 0~15V 전압을 인가시키면서 인가 전압에 따른 dark spot 구조적 및 전기적 특성을 근접장 마이크로파 현미경 Image의 변화와 반사계수인 $S_11$측정을 통하여 연구하였다.

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Image Dehazing using Transmission Map Based on Hidden Markov Random Field Model (은닉 마코프 랜덤 모델 기반의 전달 맵을 이용한 안개 제거)

  • Lee, Min-Hyuk;Kwon, Oh-Seol
    • Journal of the Institute of Electronics and Information Engineers
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    • v.51 no.1
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    • pp.145-151
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    • 2014
  • This paper proposes an image haze removal algorithm for a single image. The conventional Dark Channel Prior(DCP) algorithm estimates a transmission map using the dark information in an image, and the haze regions are then detected using a matting algorithm. However, since the DCP algorithm uses block-based processing, block artifacts are invariably formed in the transmission map. To solve this problem, the proposed algorithm generates a modified transmission map using a Hidden Markov Random Field(HMRF) and Expectation-Maximization(EM) algorithm. Experimental results confirm that the proposed algorithm is superior to conventional algorithms in image haze removal.

Dark-field Transmission Electron Microscopy Imaging Technique to Visualize the Local Structure of Two-dimensional Material; Graphene

  • Na, Min Young;Lee, Seung-Mo;Kim, Do Hyang;Chang, Hye Jung
    • Applied Microscopy
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    • v.45 no.1
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    • pp.23-31
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    • 2015
  • Dark field (DF) transmission electron microscopy image has become a popular characterization method for two-dimensional material, graphene, since it can visualize grain structure and multilayer islands, and further provide structural information such as crystal orientation relations, defects, etc. unlike other imaging tools. Here we present microstructure of graphene, particularly, using DF imaging. High-angle grain boundary formation wass observed in heat-treated chemical vapor deposition-grown graphene on the Si substrate using patch-quilted DF imaging processing, which is supposed to occur by strain around multilayer islands. Upon the crystal orientation between layers the multilayer islands were categorized into the oriented one and the twisted one, and their local structure were compared. In addition information from each diffraction spot in selected area diffraction pattern was summarized.

Image Processing of Defocus Series TEM Images for Extracting Reliable Phase Information (정확한 위상정보를 얻기 위한 탈초점 영상들의 이미지 처리기법)

  • Song, Kyung;Shin, Ga-Young;Kim, Jong-Kyu;Oh, Sang-Ho
    • Applied Microscopy
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    • v.41 no.3
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    • pp.215-222
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    • 2011
  • We discuss the experimental procedure for extracting reliable phase information from a defocus series of transmission electron microscopy (TEM) dark-field images using the transport of intensity equation (TIE). Taking InGaN/GaN multi-quantum well light-emitting diode as a model system, various factors affecting the final result of reconstructed phase such as TEM sample preparation, TEM imaging condition, image alignment, the correction of defocus values and the use of high frequency pass filter are evaluated. The obtained phase of wave function was converted to the geometric phase of the corresponding lattice planes, which was then used for the two-dimensional mapping of lattice strain following the dark-field inline holography (DIH) routine. The strain map obtained by DIH after optimized image processing is compared with that obtained by the geometric phase analysis of high resolution TEM (HRTEM) image, manifesting that DIH yields more accurate and reliable strain information than HRTEM-based GPA.

Development of Dark Field image Processing Technique for the Investigation of Nanostructures

  • Jeon, Jongchul;Kim, Kyou-Hyun
    • Journal of Powder Materials
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    • v.24 no.4
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    • pp.285-291
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    • 2017
  • We propose a custom analysis technique for the dark field (DF) image based on transmission electron microscopy (TEM). The custom analysis technique is developed based on the $DigitalMicrograph^{(R)}$ (DM) script language embedded in the Gatan digital microscopy software, which is used as the operational software for most TEM instruments. The developed software automatically scans an electron beam across a TEM sample and records a series of electron diffraction patterns. The recorded electron diffraction patterns provide DF and ADF images based on digital image processing. An experimental electron diffraction pattern is recorded from a IrMn polycrystal consisting of fine nanograins in order to test the proposed software. We demonstrate that the developed image processing technique well resolves nanograins of ~ 5 nm in diameter.

A Study on the Detecting Method of Intercept Violation Vehicles Using an Image Detection Techniques (영상검지기법을 활용한 끼어들기 위반차량 검지 방법에 관한 연구)

  • Kim, Wan-Ki;Ryu, Boo-Hyung
    • Journal of the Korean Society of Safety
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    • v.23 no.6
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    • pp.164-170
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    • 2008
  • This research was verified detection way of intercept vehicles and performance evaluation after system installation using image detector as detection way of ground installation. By image recognition algorithm was on the trace of moving orbit of violation vehicles for detection way of intercept vehicles. When moving orbit is located special site, utilized geometric image calibration and DC-notch filter. These are cognitive system of license plate by making signal. Then, Bright Evidence Detection and Dark Evidence Detection were applied to after mixing. It is applied to way of Backward tracking for detection way of intercept vehicles. After the field evaluation of developed system, it should be analyzed the more high than recognition rate of minimum standards 80%. It should rise in the estimation of the site applicability is highly from now.

Detail analysis of the peak disappearance of minor phase in mechanically alloyed samples(II) (기계적 합금화 시료에서 미소상 피이크의 소멸현상 해석(II))

  • Kim, Hye-Sung
    • Journal of the Korean Society of Industry Convergence
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    • v.4 no.1
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    • pp.27-34
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    • 2001
  • Refining of powder particles and their dissolution into the Al matrix during mechanical alloying(MA) were investigated by using X-ray diffraction(XRD) transmission electron microscopy (TEM) functions of alloy composition, milling time and ball to powder ratio(BPR). It is found that Ti particles less than 20nm are observed in a dark field image of mechanically alloyed Al-10wt%Ti whose XHD pattern exhibits no Ti peak. The observed change of lattice constant of AI indicates that about 1 wt%Ti can he solved in Al after MA for a long time, independent of alloy composition, milling time and BPR, suggesting that most of Ti particles arc retained in the Al matrix. It is concluded that the disappearance of XRD peaks in mechanically alloyed Al-10wt%Ti is not simply attributable to the dissolution of Ti into Al, but associated mainly with extreme refining and/or heavy straining of Ti Particles.

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Single Image Dehazing Using Dark Channel Prior and Minimal Atmospheric Veil

  • Zhou, Xiao;Wang, Chengyou;Wang, Liping;Wang, Nan;Fu, Qiming
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.10 no.1
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    • pp.341-363
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    • 2016
  • Haze or fog is a common natural phenomenon. In foggy weather, the captured pictures are difficult to be applied to computer vision system, such as road traffic detection, target tracking, etc. Therefore, the image dehazing technique has become a hotspot in the field of image processing. This paper presents an overview of the existing achievements on the image dehazing technique. The intent of this paper is not to review all the relevant works that have appeared in the literature, but rather to focus on two main works, that is, image dehazing scheme based on atmospheric veil and image dehazing scheme based on dark channel prior. After the overview and a comparative study, we propose an improved image dehazing method, which is based on two image dehazing schemes mentioned above. Our image dehazing method can obtain the fog-free images by proposing a more desirable atmospheric veil and estimating atmospheric light more accurately. In addition, we adjust the transmission of the sky regions and conduct tone mapping for the obtained images. Compared with other state of the art algorithms, experiment results show that images recovered by our algorithm are clearer and more natural, especially at distant scene and places where scene depth jumps abruptly.