• The Journal of the Society of Korean Medicine Diagnostics
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• v.9 no.1
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• pp.131-135
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• 2005

Background and purpose: The measurement of direct current (DC) potential on skin area of meridian has recently been adopted to explore the electrophysiological characteristics of meridian system, But there exists two problems to be explained; the entity of the DC potential to be measured and the characteristics of electrode gel interface of measurement system, It is not clear whether the DC potential reflect, at least hypothetically, the entity of meridian, and if there exist any unstable factor in the DC potential measurement system. Methods: In this study, we designed an electronic circuit model of skin and applied known DC potential sources $({\pm}10.75mV,\;0mV)$ to the electrode interface of the skin model. Results: The result showed that the measured DC potential changed according to the time, and the same phenomenon was observed when the electrode gel was replaced with an electric condenser. It is suggested that the measurement of DC potential on electrode gel interface is very difficult and produces unstable values due to the capacity effect of electrode gel. Conclusion: Further studies on the DC potential evaluation in the context of meridian study should consider and bypass this problem.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.11b
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• pp.354-357
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• 2001

The residual DC properties in the in-plane switching (IFS) liquid crystal displays(LCDs) which have different concentrations of cynao NLCs and different resistivities of fluorine NLCs were studied. We also propose a new residual DC measurement method, named 'light minimum/maximum method'. We confirmed the precision of residual DC measurement by light minimum/maximum method compared with the flicker minimizing method and found that new measurement method of residual DC is better than that of the conventional flicker minimizing method since the resolution level of measurements is in 0.1V

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.11a
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• pp.354-357
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• 2001

The residual DC properties in the in-plane switching (IPS) liquid crystal displays(LCDs) which have different concentrations of cynao NLCs and different resistivities of fluorine NLCs were studied. We also propose a new residual DC measurement method, named 'light minimum/maximum method'. We confirmed the precision of residual DC measurement by light minimum/maximum method compared with the flicker minimizing method and found that new measurement method of residual DC is better than that of the conventional flicker minimizing method since the resolution level of measurements is in 0.1 V

• Journal of Power Electronics
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• v.14 no.2
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• pp.383-391
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• 2014

For the digital control of systems such as grid-connected inverters, measuring inverter output currents accurately is essential. However, current measurement offsets are inevitably generated by current measurement paths and cause DC current components in real inverter output currents. Real inverter output currents with DC components cause the DC-link capacitor voltage to oscillate at the frequency of a utility voltage. For these reasons, current measurement offsets deteriorate the overall system performance. A compensation strategy to eliminate the effect of current measurement offsets in grid-connected inverters is proposed in this study. The validity of the proposed compensation strategy is verified through simulations and experiments. Results show that the proposed compensation strategy improves the performance of grid-connected inverters.

• Journal of Sensor Science and Technology
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• v.14 no.5
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• pp.350-356
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• 2005

We have developed a dual-channel type automatic measurement system to evaluate AC-DC current transfer difference of the thermal current converter(TCC) which is primary standard of AC current. The output drift effect of the TCC is minimized by measuring simultaneously the output voltages of two TCCs using voltmeter. Furthermore, the offset voltage of the voltmeter is cancelled nearly out by taking the average values of two outputs of TCCs measured with the forward-reverse directions using dual channel scanner. The uncertainties of the automatic system were 7 to $86{\mu}A/A$ for 3 mA to 10 A at 40 Hz to 20 kHz, which were evaluated by the comparisons between adjacent range of TCCs and inter-comparison with national measurement institute of Germany(PTB). The capability for ac-dc transfer difference measurement was improved by one order compared with that for the manual ac-dc measurement system.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.14 no.7
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• pp.590-594
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• 2001

The residual DC properties in the in-plane switching (IPS) liquid crystal displays(LCDs) which have different concentrations of cynao NLCs and different resistivities of fluorine NLCs were studied. We also propose a new residual DC measurement method, named 'light minimum/maximum method'. We confirmed the precision of residual DC measurement by light minimum/maximum method compared with the flicker minimizing method and found that new measurement method of residual DC is more accurate than that of the conventional flicker minimizing method since the resolution level of measurements is in 0.1V.

• Proceedings of the KIEE Conference
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• 2001.11c
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• pp.352-355
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• 2001

In this paper, we proposed measurement error reduction technique for the semiconductor device DC characteristic measurement system. Implemented system is composed of 4 SMUs, 2 VSUs, and 2 VMUs. Various efforts in hardware and software have been made to reduce the measurement errors due to the leakage current in measurement circuits. Internal and external sources of errors in measurement system especially in pA range measurement have been identified and removed. Experimental results show that the implemented system can be measure the DC characteristic of semiconductor devices in pA level.

• Journal of Institute of Control, Robotics and Systems
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• v.7 no.10
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• pp.837-842
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• 2001

In this paper, we design and implement the DC characteristic measurement system for semiconductor devices. The proposed system is composed of 4 SMU(Source and Measure Unit) channels. Various efforts in hardware and software have been made to reduce the measurement errors. Internal and external sources of errors in measurement system especially in pA range measurement have been identified and removed. Also, various digital signal processing techniques are developed. Calibration is executed under the control of microprocessor periodically. Experimental results show that the implemented system can measure the DC characteristic of semiconductor devices with less than 0.2% error in various voltage and current source/measurement range.

• Proceedings of the KIEE Conference
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• 2003.07b
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• pp.1196-1198
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• 2003

In this Paper, a PC-based virtual measuring program for efficiency measurement of DC-DC converter is developed. Furthermore, a newly developed highly accurate and reliable data acquisition system for DC-DC converter is presented. The virtual measuring system consists of two different types of monitoring and measuring system. Also, this paper give a full explanation for a LabVIEW realization of the measuring system for DC-DC converter.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.33 no.3
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• pp.201-207
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• 2020

With the expansion in the use of DC power systems and increased need for system maintenance, the development of measurement devices for maintenance requires high stability. Of the different kinds of DC current measurement devices, the single-shot measurement device causes the input signal of the current measuring unit to initially generate a high inrush current. The high inrush current flows into the signal processor of the meter, shortening the life of the internal fuses and causing failure. Therefore, in this study, the I²t value for increasing the durability of the fuse is designed using the available wire diameter. Operating characteristics for 210~400% over-current of the rated current, which is relatively low over-current, are realized by the plating of low melting tin metal. As a result, a method of designing a fuse element for a DC power supply, which improves the safety of the DC current measurement device by blocking the failure caused by the inrush current, is presented.