• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.2
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• pp.1254-1257
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• 2004

This paper presents a built-in current sensor(BICS) that can detect defects in CMOS integrated circuits through current testing technique - Iddq test. Current test has recently been known to a complementary testing method because traditional voltage test cannot cover all kinds of bridging defects. So BICS is widely used for current testing. but there are some critical issues - a performance degradation, low speed test, area overhead, etc. The proposed BICS has a two operating mode- normal mode and test mode. Those methods minimize the performance degradation in normal mode. We also used a current-mode differential amplifier that has a input as a current, so we can realize higher speed current testing. Furthermore, only using 10 MOSFETS and 3 inverters, area overhead can be reduced by 6.9%. The circuit is verified by HSPICE simulation with 0.25 urn CMOS process parameter.

• Progress in Superconductivity
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• 제11권1호
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• pp.19-24
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• 2009

Among the various types of fault current limiters, superconducting fault current limiters could be the most preferable choice for high voltage electric power systems owing to the remarkable current limiting characteristics of superconductors. But, there have been no commercial superconducting fault current limiters which were installed into actual electric power systems until these days due to some remained technical and economical problems. Thus, in order to promote the development and application of the superconducting fault current limiters into real field, it is essential to understand the power utilities’ requirements for their networks and also suitable test method and some specifications should be prepared. This paper focuses on the matters of test requirements and standardization issues that should be prepared for commercialization of superconducting fault current limiters. The unique current limiting characteristics of superconducting fault current limiters were investigated and related other standards including circuit breakers, transformers, reactors, power fuse, and fused circuit breakers were compared to setup the basis of novel specification of superconducting fault current limiters. Furthermore, required essential test procedures for superconducting fault current limiters were suggested.

• 전기학회논문지P
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• 제58권2호
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• pp.202-206
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• 2009

Evaluation system for calibrating Rogowski coiI(RC) up to primary current of 40,000 A have been established. The system consists of 40,000 A AC high current source, current transformer(CT) comparator, standard CT, RC under test, voltage to current convertor(VCC), buffer and CT burden. An AC high current is applied to the primary windings of both the standard CT and the RC under test, and then the CT comparator measures the ratio error and the phase displacement by comparing the secondary current of the standard CT with output current of VCC. For testing of RC, we have evaluated two RCs under test of primary current ranges of 0 A ${\sim}$ 2,000 A and 0 A ${\sim}$ 40,000 A with the accuracy class of 1 %. The extended uncertainty is 0.02 % ${\sim}$ 0.23 % for ratio error and 0.29 min ${\sim}$ 1.93 min for phase displacement in the primary current ranges of 10 ${\sim}$ 40,000 A.

• 전기학회논문지
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• 제60권10호
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• pp.1875-1880
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• 2011

This paper proposes a battery model applicable to Autonomie environment. Also, a various of experiment is implemented for validation. The proposed battery model modifies Randles equivalent circuit and battery parameters are extracted from pulsed current tests. The parameters are two-dimensional function of current and SOC(State of Charge). The battery model is developed in the Matlab/Simulink and is implemented for NiMH Panasonic HHR650D and compared with pulsed current discharge curves. The simulation results validate the accuracy of the proposed model and the model is also tested by adding it on Autonomie for HEV application. Constant current charge/discharge, pulsed current test that can be used to extract battery parameter are performed and test results are used to build up the proposed battery model for Autonomie.

• 전기학회논문지P
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• 제57권4호
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• pp.431-436
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• 2008

We have extended an absolute evaluation method to obtain the ratio error and phase displacement of a current transformer (CT) up to primary current of 40,000 A by measuring four parameters of equivalent circuit in CT. The method was applied to CTs under test with the current ratios in the range of 5,000 A / 5 A - 40,000 A / 5 A. The ratio error and phase displacement of the CTs under test obtained in this study are consistent with those measured at the national institutes in Canada and Germany using the same CTs under test within an expanded uncertainty (k = 2) in the overall current ratios.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2002년도 ITC-CSCC -3
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• pp.1972-1975
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• 2002

A new test approach based on a supply current test method is proposed for testing open faults in bipolar logic circuits. In the approach, only the open faults are detected by the supply current test method, which are difficult to be detected by functional test methods. The effectiveness of the approach is examined experimentally on open fault detection in TTL combinational circuits. The results shows that higher fault coverage can be established by applying a small number of test input vectors of the supply current test method after test vectors of functional test methods based on stuck-at models.

• 전기학회논문지
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• 제67권1호
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• pp.142-147
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• 2018

Private electrical facilities are judged whether it is suitable for the insulation aging condition of their incoming underground cables using DC leakage current test method. In the case where the service point of utility is the secondary side of cut out switch installed in the electric pole, there is a problem that it is difficult to separate the lightning arresters(LA) because of their high position of the pole. Therefore, the field test voltage is applied at value lower than DC 30 kV, which are stated in the inspection guideline. However, this test could reduced the insulation performance of the LA by accelerating the electrical stress of the metal oxide varistor element in the pre-breakdown region. In this study, we analyzed the relationship between the DC test voltage and the leakage current using the non-destructive DC high voltage equipment with leakage current measurement function. The results show that the leakage current increases sharply above the specified test voltage. As a consequence, it could be contributed to improve insulation aging inspection method by selecting the possible test area on the VI characteristic curve of the pre-breakdown area of the LA.

• 한국멀티미디어학회논문지
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• 제10권10호
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• pp.1260-1270
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• 2007

테스트 기술자들에게 아날로그 회로(또는 혼합신호 회로)의 테스트와 진단은 여전히 어려운 문제여서 이를 해결할 수 있는 효과적인 테스트 방법이 크게 요구된다. 본 논문에서는 time slot specification(TSS) 기반의 내장 전류감지기(Built-in Current Sensor)를 이용한 새로운 아날로그 회로의 테스트 기법을 제안한다. 또한 TSS에 기반 하여 고장 위치를 찾아내고 고장의 종류를 구별해 내는 방법을 제시한다. TSS 기법과 함께 제안하는 내장 전류감지기는 높은 고장 용이도와 높은 고장 검출을 그리고 아날로그 회로내 강고장과 약고장에 대한 높은 진단율을 갖는다. 제안하는 방법에서는 주출력과 전원단자등을 테스트 포인트로 사용하고 전류감지기를 자동 테스트 장치(Automatic Test Equipment)에 구성하므로써 테스트 포인트 선택과정의 복잡도를 줄일 수 있다. 내장 전류 감지기의 디지털 출력은 아날로그 IC 테스트를 위한 내장 디지털 테스트 모듈과 쉽게 연결된다.

• 전기학회논문지P
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• 제58권4호
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• pp.490-494
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• 2009

In this paper, how the temperature of a varistor changes when $10/350{\mu}s$ surge currents and/or DC leakage currents are applied on it, respectively, are investigated. The temperature change in varistor is related with injection energy and leakage current. which is the integration of power in time. By the surge current test, we found that the temperature jump is proportional to the level of surge current with slant 52.535 and has no relation with the ambient temperature. And by the DC leakage current test, the difference in temperatures between varistor and ambient is proportional to the magnitude of leakage current. The slope of measured line(the temperature difference vs. the leakage current) shows alteration around $100{\mu}A$. The varistors can not be used more than $100{\mu}A$ region any more. From the above experimental results, we can conclude that data of the surge current test and also those of DC leakage current test can predict the performance of varistors of which the surge protective devices are made.

• Journal of Electrical Engineering and Technology
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• 제7권5호
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• pp.778-783
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• 2012

The synthetic short-circuit making test to adequately stress the circuit breaker has been specified as the mandatory test duty in the IEC 62271-100. The purpose of this test is to give the maximum pre-arcing energy during making operation. And this requires the making operation with symmetrical short-circuit current that is established when the breakdown between contact gap occurs near the crest of the applied voltage. Also, if the interrupting chamber of circuit breakers is designed as the type of common enclosure or the operation is made by the gang operated mechanism that three-phase contacts are operated by one common mechanism, three-phase synthetic making test is basically required. Therefore, several testing laboratories have developed and proposed their own test circuits to properly evaluate the breaker performance. With these technical backgrounds, we have developed the new alternative three-phase making circuit.