• Title/Summary/Keyword: CuSn

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Effects of substrate temperature on the performance of $Cu_2ZnSnSe_4$ thin film solar cells fabricated by co-evaporation technique (동시진공 증발법을 이용한 $Cu_2ZnSnSe_4$ 박막 태양전지의 제조와 기판온도가 광전압 특성에 미치는 영향)

  • Jung, Sung-Hun;Ahn, Se-Jin;Yun, Jae-Ho;Gwak, Ji-Hye;Kim, Dong-Hwan;Yoon, Kyung-Hoon
    • 한국신재생에너지학회:학술대회논문집
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    • 2009.06a
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    • pp.85-87
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    • 2009
  • Despite the success of $Cu(In,Ga)Se_2$ (CIGS) based PV technology now emerging in several industrial initiatives, concerns about the cost of In and Ga are often expressed. It is believed that the cost of those elements will eventually limit the cost reduction of this technology. one candidate to replace CIGS is $Cu_2ZnSnSe_4$ (CZTSe), fabricated by co-evaporation technique. Effects of substrate temperature of $Cu_2ZnSnSe_4$ absorber layer on the performance of thin films solar cells were investigated. As substrate temperature increased, the grain size of $Cu_2ZnSnSe_4$ films increased presumably. At a optimal condition of substrate temperature is $320^{\circ}C$, the solar cell shows a conversion efficiency of 1.79% with $V_{OC}$ of 0.213V, JSC of $16.91mA/cm^2$ and FF of 49.7%.

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A Basic Study on the Fabrication of W-M(M=Cu, Sn, Ni) System High Density Composite (I) (W-M(M=Cu, Sn, Ni)계 고밀도 복합재료 제조에 관한 기초연구(I))

  • Jang, Tak-Soon;Hong, Jun-Hee;Lee, Tae-Haeng;Koo, Jar-Myung;Song, Chang-Bin
    • Journal of Powder Materials
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    • v.16 no.4
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    • pp.268-274
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    • 2009
  • For the purpose of obtaining basic information on the development of lead-free materials, a high density composites (a) W-Cu, (b) W-Sn (c)W-Cu-Sn and (d) W-Cu-Ni were fabricated by the P/M method. The particle size of used metal powders were under 325 mesh, inner size of compaction mould was $\phi8$ mm, and compaction pressure was 400 MPa. A High density composite samples were sintered at a temperature between $140^{\circ}C$ and $1050^{\circ}C$ for 1 hour under Ar atmosphere. The microstructure, phase transformation and physical properties of the sintered samples were investigated. As the results, the highest relative density of 95.86% (10.87 g/$cm^3$) was obtained particularly in the sintered W-Cu-Sn ternary system sample sintered at 450 for 1hr. And, Rockwell hardness (HRB) of 70.0 was obtained in this system.

The effects of Zr on the mechanical workability in Cu-Ni-Mn-Sn connector alloys (커넥터용 Cu-Ni-Mn-Sn계 합금의 가공성에 미치는 Zr 첨가효과)

  • Han, Seung-Zeon;Kong, Man-Shik;Kim, Sang-Shik;Kim, Chang-Joo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.05b
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    • pp.246-249
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    • 2000
  • The effects of Zr on the mechanical workability and tensile strength of Cu-Ni-Mn-Sn-Al alloys have been investigated and the following results were obtained. The mechanical workability of Cu-Ni-Mn-Sn-Al alloys are increased with addition of Zr. And the surface cracks of specimen were not produced in Zr added Alloys. Especially in condition of hot-worked beyond the 90% working ratio, Zr contained specimen showed intra-granule crack propagation but Zr-free specimen showed inter-granule mode. The tensile strength have maximum value in 0.05% Zr contained alloy. The aging mechanism of Cu-Ni-Mn-Sn-Al alloys were varied by Zr addition.

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A Study on the Eutectic Pb/Sn Solder Filip Chip Bump and Its Under Bump metallurgy(UBM)

  • Paik, Kyung-Wook
    • Journal of the Microelectronics and Packaging Society
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    • v.5 no.1
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    • pp.7-18
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    • 1998
  • In the flip chip interconnection on organic substrates using eutectic Pb/Sn solder bumps highly reliable Under Bump Metallurgy (UBM) is required to maintain adhesion and solder wettability. Various UBM systems such as 1$\mu$m Al/0.2$\mu$m Pd/1$\mu$m Cu, laid under eutectic Pb/Sn solder were investigated with regard to their interfacial reactions and adhesion proper-ties. The effects of numbers of solder reflow and aging time on the growth of intermetallic compounds (IMCs) and on the solder ball shear strength were investigated. Good ball shear strength was obtained with 1$\mu$m Al/0.2$\mu$m Ti/5$\mu$m Cu and 1$\mu$m Al/0.2$\mu$m ni/1$\mu$m Cu even after 4 solder reflows or 7 day aging at 15$0^{\circ}C$. In contrast 1$\mu$m Al/0.2$\mu$m Ti/1$\mu$m Cu and 1$\mu$mAl/0.2$\mu$m Pd/1$\mu$m 쳐 show poor ball shear strength. The decrease of the shear strength was mainly due to the direct contact between solder and nonwettable metal such as Ti and Al resulting in a delamination. In this case thin 1$\mu$m Cu and 0.2$\mu$m Pd diffusion barrier layer were completely consumed by Cu-Sn and pd-Sn reaction.

Surface Tension of Molten Ag-Sn and Au-Cu Alloys at Different Oxygen Partial Pressures (다양한 산소분압에 따른 용융 Ag-Sn 및 Ag-Cu 합금의 표면장력)

  • Min, Soon-Ki;Lee, Joon-Ho
    • Korean Journal of Materials Research
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    • v.19 no.1
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    • pp.13-17
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    • 2009
  • A semi-empirical method to estimate the surface tension of molten alloys at different oxygen partial pressures is suggested in this study. The surface tension of molten Ag-Sn and Ag-Cu alloys were calculated using the Butler equation with the surface tension value of pure substance at a given oxygen partial pressure. The oxygen partial pressure ranges were $2.86{\times}10^{-12}$$1.24{\times}10^{-9}$ Pa for the Ag-Sn system and $2.27{\times}10^{-11}$$5.68{\times}10^{-4}$ Pa for the Ag-Cu system. In this calculation, the interactions of the adsorbed oxygen with other metallic constituents were ignored. The calculated results of the Ag-Sn alloys were in reasonable accordance with the experimental data within a difference of 8%. For the Ag-Cu alloy system at a higher oxygen partial pressure, the surface tension initially decreased but showed a minimum at $X_{Ag}$ = 0.05 to increase as the silver content increased. This behavior appears to be related to the oxygen adsorption and the corresponding surface segregation of the constituent with a lower surface tension. Nevertheless, the calculated results of the Ag-Cu alloys with the present model were in good agreement with the experimental data within a difference of 10%.

The Effects of Thermal Degradation and Creep Damage on the Microstructure and Composition of the Carbides in the CrMo Steels for Power Plant (발전 설비용 CrMo강의 탄화물 구조와 조성 변화에 미치는 열화 및 크리프 손상의 영향)

  • Ju, Yeon-Jun;Hong, Gyeong-Tae;Lee, Hyeon-Ung;Sin, Dong-Hyeok;Kim, Je-Won
    • Korean Journal of Materials Research
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    • v.9 no.10
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    • pp.1018-1024
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    • 1999
  • The effects of operating temperature and stress on degradation of components in high temperature steam generator were investigated. Several 2.25CrlMo tubes which had operated over 20 years and an unused 9CrlMoVNb tube were tested. For the former samples, the amount of $\textrm{M}_{6}\textrm{C}$ carbide and its size are increased with the aging or operating time. The precipitation behavior of carbides ($\textrm{M}_{2}\textrm{O}$, $\textrm{M}_{6}\textrm{C}$) is changed with the operating temperature of the tubes. However, unused 9CrlMoVNb samples show a different carbide precipitation process due to high chromium, vanadium, and niobium contents. The amount of Cr-rich $\textrm{M}_{23}\textrm{C}_{6}$ carbide is significantly increased with aging time, but that of $\textrm{M}_{6}\textrm{C}$ type carbide is rarely changed with aging time at elevated temperatures.

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Effects of Temperature and Mechanical Deformation on the Microhardness of Lead free and Composite Solders (무연 복합 솔더의 미소경도에 미치는 기계적 변형과 온도의 영향)

  • Lee Joo Won;Kang Sung K.;Lee Hyuck Mo
    • Journal of the Microelectronics and Packaging Society
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    • v.12 no.2 s.35
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    • pp.121-128
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    • 2005
  • Solder joints in microelectronic devices are frequently operated at an elevated temperature in service. They also experience plastic deformation caused by temperature excursion and difference in thermal expansion coefficients. Deformed solders can go through a recovery and recrystallization process at an elevated temperature, which would alter their microstructure and mechanical properties. In this study, to predict the changes in mechanical properties of Pb-free solder joints at high temperatures, the high temperature microhardness of several Pb-free and composite solders was measured as a function of temperature, deformation, and annealing condition. Solder alleys investigated include pure Sn, Sn-0.7Cu, Sn-3.5Ag, Sn-3.8Ag-0.7Cu, Sn-2.8Ag-7.0Cu (composite), and Sn-2.7Ag-4.9Cu-2.9Ni (composite). Numbers are all in wt.$\%$ unless specified otherwise. Solder pellets were cast at two cooling rates (0.4 and $7^{\circ}C$/s). The pellets were compressively deformed by $30\%$ and $50\%$ and annealed at $150^{\circ}C$ for 2 days. The microhardness was measured as a function of indentation temperature from 25 to $130^{\circ}C$. Their microstructure was also evaluated to correlate with the changes in microhardness.

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Biological Leaching of Cu, Al, Zn, Ni, Co, Sn and Pb from Waste Electronic Scrap using Thiobacillus Ferrooxidans (廢電子스크랩에서 Thiobacillus ferrooxidans를 이용한 Cu, Al, Zn, Ni, Co, Sn 및 Pb의 浸出)

  • Ahn, Jae-Woo;Kim, Myeong-Woon;Jeong, Jin-Ki;Lee, Jae-Chun;Kim, Dong-Gin;Ahn, Jong-Gwan
    • Resources Recycling
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    • v.14 no.1
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    • pp.17-25
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    • 2005
  • In order to recover valuable metals from the waste electronic scrap, bioleaching of Cu, Zn, Al, Co, Ni, Sn and Pb was carried out using Thiobacillus ferrooxidans as a leaching microorganism in a shaking flask. In a preliminary study, to obtain the data on the leaching of Cu, Zn, Al, Co and Ni, the metal leaching was accomplished using metal powers instead of electronic scrap. The leaching percentaga of Cu, Zn, Co, Al and Ni powers was reduced with the increase of metal power concentration in solution. Below the metal concentration of 0.5 g/L, more than 85% of Cu, Co and Zn powers was leached out. At the electronic scrap concentration of 100 g/L, Thiobacillus ferrooxidans were able to leach more than 90% of the available Cu and Co while Al, Zn and Ni were able to leach less than 40%. Pb and Sn were not detected in the leachate. Pb was precipitated as PbSO$_4$, whereas Sn precipitated probably as SnO.

Thermo-mechanical reliability evaluation of flip chip package using a accelerated test (가속화 시험을 통한 플립칩 패키지의 열적 기계적 특성 평가)

  • Kim Dae-Gon;Ha Sang-Su;Kim Jong-Ung;Sin Yeong-Ui;Jeong Seung-Bu
    • Proceedings of the KWS Conference
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    • 2006.05a
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    • pp.21-23
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    • 2006
  • The microstructural investigation and thermo-mechanical reliability evaluation of the Sn-3.0Ag-0.5Cu solder bumped flip chip package were carried out during the thermal shock test of the package. In the initial reaction, the reaction product between the solder and Cu mini bump of chip side was Cu6Sn5 layer, while the two phases which were (Cu,Ni)6Sn5 and (Ni,Cu)3Sn4 were formed between the solder and Ni-P layer of the package side. The cracks were occurred at the corner solder joints after the thermal shocks of 400 cycles. The primary failure mechanism of the solder joints in this type of package was confirmed to be thermally activated solder fatigue failure.

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