• Title/Summary/Keyword: Control Chart

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An economic design of CUSCORE control chart for quality characteristics with exponential distribution (제품의 수명특성 관리를 위한 누적점수 관리도의 경제적 설계)

  • Kim, Jong-Gurl;Jeong, Young-Min
    • Proceedings of the Korean Operations and Management Science Society Conference
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    • 1993.10a
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    • pp.31-39
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    • 1993
  • This paper considers a procedure for the economic design of a cumulative score(CUSCORE) control chart and more sensitive than X-type control chart for small shift to control the mean of a process with a exponentially distributed quality characteristic. An expected loss - cost model as a function of design variables(sample size, sampling interval, scoring limit and decision limit) is derived. Direct search techniques are used to optimize the model subject to ARL in control. Numerical examples and sensitivity analysis of the model are presented. For selected values of situation parameters a comparison study with CUSUM charts is given. CUSCORE control charts compare favourably with CUSUM charts in cost for speedy production process. The proposed control chart can be directly applied for controlling the lifetime characteristics.

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Optimal Design of c Control Chart using Variable Sampling Interval (가변추출간격을 이용한 c 관리도의 최적설계)

  • Park, Joo-Young
    • Journal of the Korea Safety Management & Science
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    • v.9 no.2
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    • pp.215-233
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    • 2007
  • Even though the ad hoc Shewhart methods remain controversial due to various mathematical flaws, there is little disagreement among researchers and practitioners when a set of process data has a skewness distribution. In the context and language of process control, the error related to the process data shows that time to signal increases when a control parameter shifts to a skewness direction. In real-world industrial settings, however, quality practitioners often need to consider a skewness distribution. To address this situation, we developed an enhanced design method to utilize advantages of the traditional attribute control chart and to overcome its associated shortcomings. The proposed design method minimizes bias, i.e., an average time to signal for the shift of process from the target value (ATS) curve, as well as it applies a variable sampling interval (VSI) method to an attribute control chart for detecting a process shift efficiently. The results of the factorial experiment obtained by various parameter circumstances show that the VSI c control chart using nearly unbiased ATS design provides the smallest decreasing rate in ATS among other charts for all experimental cases.

Statistical Efficiency of VSSI $\bar{X}$ Control Charts for the Process with Two Assignable Causes (두 개의 이상원인이 존재하는 공정에 대한 VSSI $\bar{X}$ 관리도의 통계적 효율성)

  • Lee Ho-Jung;Lim Tae-Jin
    • Journal of Korean Society for Quality Management
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    • v.32 no.4
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    • pp.156-168
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    • 2004
  • This research investigates the statistical efficiency of variable sampling size & sampling interval(VSSI) $\bar{X}$ charts under two assignable causes. Algorithms for calculating the average run length(ARL) and average time to signal(ATS) of the VSSI $\bar{X}$ chart are proposed by employing Markov chain method. States of the process are defined according to the process characteristics after the occurrence of an assignable cause. Transition probabilities are carefully derived from the state definition. Statistical properties of the proposed chart are also investigated. A simple procedure for designing the proposed chart is presented based on the properties. Extensive sensitivity analyses show that the VSSI $\bar{X}$ chart is superior to the VSS or VSI $\bar{X}$ chart as well as to the Shewhart $\bar{X}$ chart in statistical sense, even tinder two assignable causes.

Application of Dynamic $\bar{x}$-R Control Chart for Advanced Phase Isolation Ditch (APID) Process (APID공정 내 공정진단을 위한 dynamic $\bar{x}$-R 관리도의 적용)

  • An, Sang-Woo;Kwak, Sung-Keun;Jung, Young-Wook;Chung, Mu-Keun;Park, Jae-Woo
    • Journal of Korean Society on Water Environment
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    • v.25 no.5
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    • pp.704-712
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    • 2009
  • Advanced Phase Isolation Ditch (APID) process was studied to develop economic retrofitting technology, for the plants where retrofitting of common activated sludge process is required. In this study, to evaluate and monitor the effluent water quality ($BOD_5$, SS, T-N, and T-P) and operating conditions (Influent, SVI, SRT, and HRT) as process capable and stable parameters for treating municipal wastewater, a demonstration plant was installed and operated in the existing sewage treatment plant of P city. During this study, the average effluent $BOD_5$, SS, T-N, and T-P concentrations were 7.7, 5.6, 10.8, and 1.6 mg/L. Trend analysis of influent $BOD_5$, SS, T-N, and T-P in APID process were illustrated that APID process need for more strong APID process management on the winter session, such as developing new intermediated aeration mode, operating methods, and managements strategy. At the application of control chart, the signal of uncommon effects at APID process was determined much higher existing control chart tntr conventional control chart in this study. These results indicate that conventional control chart has been collected and determined cleary signal at only stable situation. Therefore, newly developed APID process of dynamic control chart can be one of the useful tool for monitoring and management process.

A VSR $\bar{X}$ Chart with Multi-state VSS and 2-state VSI Scheme

  • Lee, Jae-Heon;Park, Chang-Soon
    • Journal of Korean Society for Quality Management
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    • v.32 no.4
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    • pp.252-264
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    • 2004
  • Variable sampling Interval (VSI) control charts vary the sampling interval according to value of the control statistic while the sample size is fixed. It is known that control charts with 2-state VSI scheme, which uses only two sampling intervals, give good statistical properties. Variable sample size (VSS) control charts vary the sample size according to value of the control statistic while the sampling interval is fixed. In the VSS scheme no optimal results are known for the number of sample sizes. It is also known that the variable sampling rate (VSR) $\bar{X}$ control chart with 2-state VSS and 2-state VSI scheme leads to large improvements In performance over the fixed sampling rate (FSR) $\bar{X}$ chart, but the optimal number of states for sample size Is not known. In this paper, the VSR Χ charts with multi-state VSS and 2-state VSI scheme are designed and compared to 2-state VSS and 2-state VSI scheme. The multi-state VSS scheme is considered to, achieve an additional improvement by switching from the 2-state VSS scheme. On the other hand, the multi-state VSI scheme is not considered because the 2-state scheme is known to be optimal. The 3-state VSS scheme improves substantially the sensitivity of the $\bar{X}$ chart especially for small and moderate mean shifts.

The in-control performance of the CCC-r chart with estimated parameters (추정된 모수를 사용한 CCC-r 관리도에서 관리상태의 성능)

  • Kim, Jaeyeon;Kim, Minji;Lee, Jaeheon
    • The Korean Journal of Applied Statistics
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    • v.31 no.4
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    • pp.485-495
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    • 2018
  • The CCC-r chart is more effective than traditional attribute control charts for monitoring high-quality processes. In-control process parameters are typically unknown and should be estimated when implementing a CCC-r chart. Phase II control chart performance can deteriorate due to the effect of the estimation error. In this paper, we used the standard deviation of average run length (ARL) as well as the average of ARL to quantify the between-practitioner variability in the CCC-r chart performance. The results indicate that the CCC-r chart requires larger Phase I data than previously recommended in the literature in order to have consistent chart in-control performance among practitioners.

The CV Control Chart

  • Kang, Chang-W;Lee, Man-S;Hawkins, Douglas M.
    • Proceedings of the Korean Society for Quality Management Conference
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    • 2006.11a
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    • pp.211-216
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    • 2006
  • Monitoring variability is a vital part of modem statistical process control. The conventional Shewhart Rand S charts address the setting where the in-control process readings have a constant variance. In some settings, however, it is the coefficient of variation, rather than the variance, that should be constant. This paper develops a chart, equivalent to the S chart, for monitoring the coefficient of variation using rational groups of observations.

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A study on the (equation omitted)x-R control chart with variable sampling interval scheme (변량표본추출간격을 이용한 (equation omitted)x-R 관리도의 연구)

  • 이희춘
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.18 no.33
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    • pp.143-151
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    • 1995
  • In this design the sampling interval that each sampling time changes according to the valuse of the previous to sample statistics, sample mean and ranges. The VSI scheme uses large sample if the sample statistics appear near in side the control limits and smaller sample otherwise. The efficiency of the VSI scheme is compare to the FSI. It is shown that VSI control chart improves the confidence of the procedure and performens better than FSI control chart.

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A Study on the QC Process Chart (QC 공정도에 관한 연구)

  • 엄태원;정수일
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.15 no.26
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    • pp.137-150
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    • 1992
  • As a part of quality control activities for developing competitive products, the significant method of process quality assurance for solving initial production quality problems is just quality control process chart(QC process chart). However, the QC process chart which is used for domestic enterprises at present had obscured in basement and not itemized by industry and formally used. So. in this study, the improved QC process charts which classified by industry we suggested so that each enterprise may utilize them according to the each enterprise characteristics.

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A Study on the Monitoring of Reject Rate in High Yield Process

  • Nam, Ho-Soo
    • Journal of the Korean Data and Information Science Society
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    • v.18 no.3
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    • pp.773-782
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    • 2007
  • The statistical process control charts are very extensively used for monitoring of process mean, deviation, defect rate or reject rate. In this paper we consider a control chart to monitor the process reject rate in the high yield process, which is based on the observed cumulative probability of the number of items inspected until r defective items are observed. We first propose selection of the optimal value of r in the CPC-r charts, and also consider the usefulness of the chart in high yield process such as semiconductor or TFT-LCD manufacturing process.

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