• Progress in Superconductivity
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• v.7 no.2
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• pp.109-113
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• 2006

The Arithmetic Logic Unit (ALU) is a core element of a computer processor that performs arithmetic and logic operations on the operands in computer instruction words. We have developed and tested an RSFQ multi-bit ALU constructed with half adder unit cells. To reduce the complexity of the ALU, We used half adder unit cells. The unit cells were constructed of one half adder and three de switches. The timing problem in the complex circuits has been a very important issue. We have calculated the delay time of all components in the circuit by using Josephson circuit simulation tools of XIC, $WRspice^{TM}$, and Julia. To make the circuit work faster, we used a forward clocking scheme. This required a careful design of timing between clock and data pulses in ALU. The designed ALU had limited operation functions of OR, AND, XOR, and ADD. It had a pipeline structure. The fabricated 1-bit, 2-bit, and 4-bit ALU circuits were tested at a few kilo-hertz clock frequency as well as a few tens giga-hertz clock frequency, respectively. For high-speed tests, we used an eye-diagram technique. Our 4-bit ALU operated correctly at up to 5 GHz clock frequency.

• The Journal of the Korea Contents Association
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• v.8 no.3
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• pp.25-31
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• 2008

We propose a low power level-up/down shifter with single supply that can be used at SoC with multiple supply. The proposed circuit interfaces IPs which are operated on the different supply voltages. The circuit is designed with a single supply that decreases the low power consumption and the complexity of supply routing and layout. The proposed circuit operated at 500MHz for level-up and at 1GHz for level-down. The level-up/down shifter improves noise immunity of the system at I/O circuit. The circuit is evaluated for 1.8V, 2.5V, 3.3V supply with 0.18um CMOS technology, respectively.

• Proceedings of the KIEE Conference
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• 2002.11d
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• pp.197-199
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• 2002

The invention of VHDL(Very High Speed Integrated Circuit Hardware Description Language), Technical language of Hardware, is a kind of turning point in digital circuit designing, which is being more and more complicated and integrated. Because of its excellency in expression ability of hardware, VHDL is not only used in designing Hardware but also in simulation for verification, and in exchange and conservation, composition of the data of designs, and in many other ways. Especially, It is very important that VHDL is a Technical language of Hardware standardized by IEEE, intenational body with an authority. The biggest problem in modern circuit designing can be pointed out in two way. One is a problem how to process the rapidly being complicated circuit complexity. The other is minimizing the period of designing and manufacturing to survive in a cutthroat competition. To promote the use of VHDL, more than a simple use of simulation by VHDL, it is requested to use VHDL in composing logical circuit with chip manufacturing. And, by developing the quality of designing technique, it can contribute for development in domestic industry related to ASIC designing. In this paper in designing SMPS(Switching mode power supply), programming PWM by VHDL, it can print static voltage by the variable load, connect computer to chip with byteblaster, and download in Max(EPM7064SLCS4 - 5)chip of ALTER. To achieve this, it is supposed to use VHDL in modeling, simulating, compositing logic and product of the FPGA chip. Despite its limit in size and operating speed caused by the specific property of FPGA chip, it can be said that this method should be introduced more aggressively because of its prompt realization after designing.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2010.05a
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• pp.788-791
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• 2010

We design 64-bit ROM IP for RFID tag chips using printed CMOS non-volatile memory IP design technology for a printed CMOS process. The proposed 64-bit ROM circuit is using ETRI's $0.8{\mu}m$ CMOS porocess, and is expected to reduce process complexity and cost of RFID tag chips compared to that using a conventional silicon fabrication based on a complex lithography process because the poly layer in a gate terminal is using printing technology of imprint process. And a BL precharge circuit and a BL sense amplifier is not required for the designed cell circuit since it is composed of a transmission gate instead of an NMOS transistor of the conventional ROM circuit. Therefore an output datum is only driven by a DOUT buffer circuit. The Operation current and layout area of the designed ROM of 64 bits with an array of 8 rows and 8 columns using $0.8{\mu}m$ ROM process is $9.86{\mu}A$ and $379.6{\times}418.7{\mu}m^2$.

• KIPS Transactions on Computer and Communication Systems
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• v.4 no.12
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• pp.391-398
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• 2015

This paper devises a performance improvement and evaluation process of circuit minimization algorithms for mentorship education of distinguished informatics gifted secondary students. In the process, students learn that there are several alternative equivalent circuits for a target function and recognize the necessity for formalized circuit minimization methods. Firstly, they come at the concept of circuit minimization principle from Karnaugh Map which is a manual methodology. Secondly, they explore Quine-McCluskey algorithm which is a computational methodology. Quine-McCluskey algorithm's time complexity is high because it uses set operations. To improve the performance of Quine-McCluskey algorithm, we encourage them to adopt a bit-wise data structure instead of integer array for sets. They will eventually see that the performance achievement is about 36%. The ultimate goal of the process is to enlarge gifted students' interest and integrated knowledge about computer science encompassing electronic switches, logic gates, logic circuits, programming languages, data structures and algorithms.

• Journal of the Institute of Electronics and Information Engineers
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• v.53 no.11
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• pp.48-55
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• 2016

Ambient-light sensor system, which changes the brightness of a display as ambient light change, was studied to reduce the power consumption of the mobile applications such as note PC, tablet PC and smart phone. The ambient-light sensor system should be integrated on a display panel to improve the complexity and cost of mobile applications, so the ambient-light sensor and readout circuit was integrated on a display panel using low-temperature poly-silicon thin film transistors (LTPS-TFT). We proposed the new compensation method to correct the panel-to-panel variation of the ambient-light sensors, without additional equipment. We designed and investigated the new readout circuit with the proposed compensation method and the analog-to-digital converter for the final digital output of ambient light. The readout circuit has very simple structure and control timing to be integrated with LTPS-TFT, and the input luminance ranges from 10 to 10,000 lux. The readout rate is 100 Hz, and maximum differential non-uniformity with 20 levels of the final output below 0.5 LSB.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.19 no.3
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• pp.401-417
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• 1994

In this paper, a new testable design technique for domino CMOS circuits is proposed to detect stuck-at(s-at), stuck-open(s-op) and stuck-on(s-on) faults in the circuits by observing logic test reponses. The proposed technique adds one pMOS transistor per domino CMOS gate for s-op and s-on faults testing of nMOS transistors and one nMOS transistors and one nMOS transistor per domino gate or multilevel circuit to detect s-on faults in pMOS transistors of inverters in the circuit. The extra transistors enable the proposed testable circuit to operate like a pseudo static nMOS circuit while testing nMOS transistors in domino CMOS circuits. Therefore, the two=phase operation of a precharge phase and a evaluation phase is not needed to keep the domino CMOS circuit from malfunctionong due to circuit delays in the test mode, which reduces the testing time and the complexity of test generation. Most faults of th transistors in the proposed testable domino CMOS circuit can be detected by single test patterns. The use of single test patterns makes the testing of the proposed testable domino CMOS circuit free from path delays, timing skews, chage sharing and glitches. In the proposed design, the testing of the faults which, require test sequences also becomes free from test invalidation. The conventional automatic test pattern generators(ATPG) can be used for generating test patterns to detect faults in the circuits.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.2
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• pp.91-103
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• 2002

For massive FPGA based emulator, the interconnection architecture and the transmission method of signals between FPGA's are important elements which decide speed of emulation and extendability of emulator. Existing FPGA-based emulation system is faced the problems of which the emulation speed getting slow drastically as the complexity of circuit increases. In this paper, we proposed a new innovative emulation architecture that has high resource usage rate and makes the fast emulation Possible. The emulator with very unique hierarchical ring topology Presented here has merits to overcome FPGA pin limitation by connecting each FPGA into a set of pipelined rings, and it also makes emulation speed at the tens of MHz at least even at system level where the verification complexity can easily exceed the verification capability of designers.

• Journal of KIISE:Computer Systems and Theory
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• v.30 no.3_4
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• pp.186-193
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• 2003

In recent years the complexity of digital systems has increased dramatically. Although semiconductor manufacturers try to ensure that their products are reliable, it is almost impossible not to have faults somewhere in a system at any given time. As complexity of circuits increases, the necessity of more efficient organized and automated methods for test generation is growing. But, up to now, most of popular and extensive methods for test generation nay be those which sequentially produce an output for an input pattern. They inevitably require a lot of time to search each fault in a system. In this paper, corresponding test patterns are generated through the partitioning method among those based on the exhaustive method. In addition, the method, which can discovers faults faster than other ones that have been proposed ever by inserting a pattern in parallel, is designed and implemented.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.32 no.4C
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• pp.447-453
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• 2007

In the multipath fading channel, OFDM(Orthogonal Frequency Division Multiplexing)system possess the characteristics of ISI/ICIwith prefix, but a weak point of circuit complexity and PAPR problem. SC-FDE(Single Carrier with Frequency Domain Equalization) performance is similar to OFDM system, but equalizer is complex in frequency domain. In this paper, simple proportional equalizer offer for SC-FDE system, it useful method in the $2GHz{\sim}\;10GHz$ channel model such as indoor, outdoor, SUI. It prove using MATLAB simulation, speed faster then OFDM system, reduce terminal complexity in same test condition.