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An Efficient Parallel Testing using The Exhaustive Test Method  

김우완 (경상대학교 정보통신공학부)
Publication Information
Journal of KIISE:Computer Systems and Theory / v.30, no.3_4, 2003 , pp. 186-193 More about this Journal
Abstract
In recent years the complexity of digital systems has increased dramatically. Although semiconductor manufacturers try to ensure that their products are reliable, it is almost impossible not to have faults somewhere in a system at any given time. As complexity of circuits increases, the necessity of more efficient organized and automated methods for test generation is growing. But, up to now, most of popular and extensive methods for test generation nay be those which sequentially produce an output for an input pattern. They inevitably require a lot of time to search each fault in a system. In this paper, corresponding test patterns are generated through the partitioning method among those based on the exhaustive method. In addition, the method, which can discovers faults faster than other ones that have been proposed ever by inserting a pattern in parallel, is designed and implemented.
Keywords
Exhaustive Test; Parallel Testing; Circuit Partitioning;
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